Abstract

Epitaxial films of chromium doped alumina, 0.3 microns in thickness, were grown on single crystal sapphire substrates for use as surface thermometers. Curve fitting was performed on the R1 and R2 fluorescence peaks, and the line widths and peak shifts were used to determine the temperature of the surface during sliding contact with a variety of plastic bearings. Temperatures could be determined with a repeatability of 2 degrees C, and adequate signal for temperature determination could be obtained in 30-100 msec. in dots that were 200 microns in diameter, using a 0.25 watt argon laser. Both average (nominal) and local temperature increases were measured. Pressure-induced shifts could be treated as an error to the temperature determination.

© Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |

  1. K. T. V. Grattan and Z. Y. Zhang, Fiber Optic Thermometry (Chapman and Hall, London, 1995).
  2. J. D. Barnett, S. Block, G. J. Piermarini, "An optical fluorescence system for quantitative pressure measurement in the diamond-anvil cell," Rev. Sci. Instrum. 44, 1 (1973).
    [CrossRef]
  3. A. Kiel, "Temperature dependent linewidth of excited states in crystals. I. Line broadening due to adiabatic variation of the local fields," Phys. Rev. 126, 1292 (1962).
    [CrossRef]
  4. D. E. McCumber and M. D. Sturge, "Linewidth and temperature shift of the R lines in ruby," J. Appl. Phys. 34, 1682 (1963).
    [CrossRef]
  5. D. D. Ragan, R. Gustavsen, D. Schiferl "Calibration of the ruby R1 and R2 fluorescence shifts as a function of temperature from 0 to 600 K," J. Appl. Phys. 72, 5539 (1992).
    [CrossRef]
  6. S. Yamaoka, O. Shimomura, O. Fukunaga "Simultaneous measurements of temperature and pressure by the ruby fluorescence line," Proc. Japan. Acad. Ser. B 56, 103 (1980).
  7. Q. Wen, D. R. Clarke, Ning Yu, M. Nastasi "Epitaxial regrowth of ruby on sapphire for an integrated thin film stress sensor," Appl. Phys. Lett. 66, 293 (1995).
    [CrossRef]

Other (7)

K. T. V. Grattan and Z. Y. Zhang, Fiber Optic Thermometry (Chapman and Hall, London, 1995).

J. D. Barnett, S. Block, G. J. Piermarini, "An optical fluorescence system for quantitative pressure measurement in the diamond-anvil cell," Rev. Sci. Instrum. 44, 1 (1973).
[CrossRef]

A. Kiel, "Temperature dependent linewidth of excited states in crystals. I. Line broadening due to adiabatic variation of the local fields," Phys. Rev. 126, 1292 (1962).
[CrossRef]

D. E. McCumber and M. D. Sturge, "Linewidth and temperature shift of the R lines in ruby," J. Appl. Phys. 34, 1682 (1963).
[CrossRef]

D. D. Ragan, R. Gustavsen, D. Schiferl "Calibration of the ruby R1 and R2 fluorescence shifts as a function of temperature from 0 to 600 K," J. Appl. Phys. 72, 5539 (1992).
[CrossRef]

S. Yamaoka, O. Shimomura, O. Fukunaga "Simultaneous measurements of temperature and pressure by the ruby fluorescence line," Proc. Japan. Acad. Ser. B 56, 103 (1980).

Q. Wen, D. R. Clarke, Ning Yu, M. Nastasi "Epitaxial regrowth of ruby on sapphire for an integrated thin film stress sensor," Appl. Phys. Lett. 66, 293 (1995).
[CrossRef]

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (9)

Fig. 1
Fig. 1

Ruby R-line dependences

Fig. 2
Fig. 2

Sample preparation process

Fig. 3
Fig. 3

Optical layout of the measurement system

Fig. 4
Fig. 4

R1 and R2 line shifts as a function of temperature

Fig. 5
Fig. 5

Mechanical design of tribological tester

Fig. 6
Fig. 6

Schematic showing the relationship between the laser excitation, the ball-bearing contact time and the CCD camera shutter opening. The contact time of the ball is exaggerated.

Fig. 7
Fig. 7

Nominal temperature rise for teflon sliding against sapphire

Fig. 8
Fig. 8

Nominal temperature rise for Delrin against sapphire

Figure 9
Figure 9

Local temperature rise during the contact event as a function of delay time of the excitation pulse

Metrics