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[PubMed]
J. Jin, Y.-J. Kim, Y. Kim, S.-W. Kim, and C.-S. Kang, “Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser,” Opt. Express 14(13), 5968–5974 (2006).
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R. J. Jones, W.-Y. Cheng, K. W. Holman, L. Chen, J. L. Hall, and J. Ye, “Absolute-frequency measurement of the iodine-based length standard at 514.67 nm,” Appl. Phys. B 74(6), 597–601 (2002).
[Crossref]
Y.-J. Kim, B. J. Chun, Y. Kim, S. Hyun, and S.-W. Kim, “Generation of optical frequencies out of the frequency comb of a femtosecond laser for DWDM telecommunication,” Laser Phys. Lett. 7(7), 522–527 (2010).
[Crossref]
Y.-J. Kim, Y. Kim, B. J. Chun, S. Hyun, and S.-W. Kim, “All-fiber-based optical frequency generation from an Er-doped fiber femtosecond laser,” Opt. Express 17(13), 10939–10945 (2009).
[Crossref]
[PubMed]
I. Coddington, W. C. Swann, L. Nenadovic, and N. R. Newbury, “Rapid and precise absolute distance measurements at long range,” Nat. Photonics 3(6), 351–356 (2009).
[Crossref]
N. Schuhler, Y. Salvadé, S. Lévêque, R. Dändliker, and R. Holzwarth, “Frequency-comb-referenced two-wavelength source for absolute distance measurement,” Opt. Lett. 31(21), 3101–3103 (2006).
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[Crossref]
[PubMed]
J. E. Decker, J. R. Miles, A. A. Madej, R. F. Siemsen, K. J. Siemsen, S. de Bonth, K. Bustraan, S. Temple, and J. R. Pekelsky, “Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry-application to absolute long gauge block measurement,” Appl. Opt. 42(28), 5670–5678 (2003).
[Crossref]
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[Crossref]
[PubMed]
R. J. Jones and J.-C. Diels, “Stabilization of femtosecond lasers for optical frequency metrology and direct optical to radio frequency synthesis,” Phys. Rev. Lett. 86(15), 3288–3291 (2001).
[Crossref]
[PubMed]
R. J. Jones, W.-Y. Cheng, K. W. Holman, L. Chen, J. L. Hall, and J. Ye, “Absolute-frequency measurement of the iodine-based length standard at 514.67 nm,” Appl. Phys. B 74(6), 597–601 (2002).
[Crossref]
J. D. Jost, J. L. Hall, and J. Ye, “Continuously tunable, precise, single frequency optical signal generator,” Opt. Express 10(12), 515–520 (2002).
[Crossref]
[PubMed]
T. Udem, J. Reichert, R. Holzwarth, and T. W. Hänsch, “Absolute optical frequency measurement of the Cesium D1 line with a mode-locked laser,” Phys. Rev. Lett. 82(18), 3568–3571 (1999).
[Crossref]
J. Thiel, T. Pfeifer, and M. Hartmann, “Interferometric measurement of absolute distances of up to 40 m,” Measurement 16(1), 1–6 (1995).
[Crossref]
R. J. Jones, W.-Y. Cheng, K. W. Holman, L. Chen, J. L. Hall, and J. Ye, “Absolute-frequency measurement of the iodine-based length standard at 514.67 nm,” Appl. Phys. B 74(6), 597–601 (2002).
[Crossref]
N. Schuhler, Y. Salvadé, S. Lévêque, R. Dändliker, and R. Holzwarth, “Frequency-comb-referenced two-wavelength source for absolute distance measurement,” Opt. Lett. 31(21), 3101–3103 (2006).
[Crossref]
[PubMed]
T. Udem, J. Reichert, R. Holzwarth, and T. W. Hänsch, “Absolute optical frequency measurement of the Cesium D1 line with a mode-locked laser,” Phys. Rev. Lett. 82(18), 3568–3571 (1999).
[Crossref]
M. Tsai, H. Huang, M. Itoh, and T. Yatagai, “Fractional fringe order method using Fourier analysis for absolute measurement of block gauge thickness,” Opt. Rev. 6(5), 449–454 (1999).
[Crossref]
R. Dändliker, K. Hug, J. Politch, and E. Zimmermann, “High accuracy distance measurement with multiple-wavelength interferometry,” Opt. Eng. 34(8), 2407–2412 (1995).
[Crossref]
Y.-J. Kim, B. J. Chun, Y. Kim, S. Hyun, and S.-W. Kim, “Generation of optical frequencies out of the frequency comb of a femtosecond laser for DWDM telecommunication,” Laser Phys. Lett. 7(7), 522–527 (2010).
[Crossref]
S. Hyun, Y.-J. Kim, Y. Kim, and S.-W. Kim, “Absolute distance measurement using the frequency comb of a femtosecond laser,” Annals of CIRP 59(1), 555–558 (2010).
[Crossref]
S. Hyun, Y.-J. Kim, Y. Kim, J. Jin, and S.-W. Kim, “Absolute length measurement with the frequency comb of a femtosecond laser,” Meas. Sci. Technol. 20(9), 095302 (2009).
[Crossref]
Y.-J. Kim, Y. Kim, B. J. Chun, S. Hyun, and S.-W. Kim, “All-fiber-based optical frequency generation from an Er-doped fiber femtosecond laser,” Opt. Express 17(13), 10939–10945 (2009).
[Crossref]
[PubMed]
Y.-J. Kim, J. Jin, Y. Kim, S. Hyun, and S.-W. Kim, “A wide-range optical frequency generator based on the frequency comb of a femtosecond laser,” Opt. Express 16(1), 258–264 (2008).
[Crossref]
[PubMed]
M. Tsai, H. Huang, M. Itoh, and T. Yatagai, “Fractional fringe order method using Fourier analysis for absolute measurement of block gauge thickness,” Opt. Rev. 6(5), 449–454 (1999).
[Crossref]
J. Jin, J. W. Kim, C.-S. Kang, J.-A. Kim, and S. Lee, “Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process,” Opt. Express 20(5), 5011–5016 (2012).
[Crossref]
[PubMed]
S. Hyun, Y.-J. Kim, Y. Kim, J. Jin, and S.-W. Kim, “Absolute length measurement with the frequency comb of a femtosecond laser,” Meas. Sci. Technol. 20(9), 095302 (2009).
[Crossref]
Y.-J. Kim, J. Jin, Y. Kim, S. Hyun, and S.-W. Kim, “A wide-range optical frequency generator based on the frequency comb of a femtosecond laser,” Opt. Express 16(1), 258–264 (2008).
[Crossref]
[PubMed]
J. Jin, Y.-J. Kim, Y. Kim, S.-W. Kim, and C.-S. Kang, “Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser,” Opt. Express 14(13), 5968–5974 (2006).
[Crossref]
[PubMed]
R. J. Jones, W.-Y. Cheng, K. W. Holman, L. Chen, J. L. Hall, and J. Ye, “Absolute-frequency measurement of the iodine-based length standard at 514.67 nm,” Appl. Phys. B 74(6), 597–601 (2002).
[Crossref]
R. J. Jones and J.-C. Diels, “Stabilization of femtosecond lasers for optical frequency metrology and direct optical to radio frequency synthesis,” Phys. Rev. Lett. 86(15), 3288–3291 (2001).
[Crossref]
[PubMed]
J. Jin, J. W. Kim, C.-S. Kang, J.-A. Kim, and S. Lee, “Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process,” Opt. Express 20(5), 5011–5016 (2012).
[Crossref]
[PubMed]
J. Jin, Y.-J. Kim, Y. Kim, S.-W. Kim, and C.-S. Kang, “Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser,” Opt. Express 14(13), 5968–5974 (2006).
[Crossref]
[PubMed]
D. Xiaoli and S. Katuo, “High-accuracy absolute distance measurement by means of wavelength scanning heterodyne interferometry,” Meas. Sci. Technol. 9(7), 1031–1035 (1998).
[Crossref]
J. You, Y.-J. Kim, and S.-W. Kim, “GPU-accelerated white-light scanning interferometer for large-area, high-speed surface profile measurements,” Int. J. Nanomanufacturing 8(1/2), 31 (2012).
[Crossref]
Y.-J. Kim, B. J. Chun, Y. Kim, S. Hyun, and S.-W. Kim, “Generation of optical frequencies out of the frequency comb of a femtosecond laser for DWDM telecommunication,” Laser Phys. Lett. 7(7), 522–527 (2010).
[Crossref]
S. Hyun, Y.-J. Kim, Y. Kim, and S.-W. Kim, “Absolute distance measurement using the frequency comb of a femtosecond laser,” Annals of CIRP 59(1), 555–558 (2010).
[Crossref]
J. Lee, Y.-J. Kim, K. Lee, S. Lee, and S.-W. Kim, “Time-of-flight measurement with femtosecond light pulses,” Nat. Photonics 4(10), 716–720 (2010).
[Crossref]
S. Hyun, Y.-J. Kim, Y. Kim, J. Jin, and S.-W. Kim, “Absolute length measurement with the frequency comb of a femtosecond laser,” Meas. Sci. Technol. 20(9), 095302 (2009).
[Crossref]
Y.-J. Kim, Y. Kim, B. J. Chun, S. Hyun, and S.-W. Kim, “All-fiber-based optical frequency generation from an Er-doped fiber femtosecond laser,” Opt. Express 17(13), 10939–10945 (2009).
[Crossref]
[PubMed]
S.-W. Kim, “Metrology: Combs rule,” Nat. Photonics 3(6), 313–314 (2009).
[Crossref]
Y.-J. Kim, J. Jin, Y. Kim, S. Hyun, and S.-W. Kim, “A wide-range optical frequency generator based on the frequency comb of a femtosecond laser,” Opt. Express 16(1), 258–264 (2008).
[Crossref]
[PubMed]
K.-N. Joo and S.-W. Kim, “Absolute distance measurement by dispersive interferometry using a femtosecond pulse laser,” Opt. Express 14(13), 5954–5960 (2006).
[Crossref]
[PubMed]
J. Jin, Y.-J. Kim, Y. Kim, S.-W. Kim, and C.-S. Kang, “Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser,” Opt. Express 14(13), 5968–5974 (2006).
[Crossref]
[PubMed]
J. S. Oh and S.-W. Kim, “Femtosecond laser pulses for surface-profile metrology,” Opt. Lett. 30(19), 2650–2652 (2005).
[Crossref]
[PubMed]
I.-B. Kong and S.-W. Kim, “General algorithm of phase-shifting interferometry by iterative least-squares fitting,” Opt. Eng. 34(1), 183–188 (1995).
[Crossref]
S. Hyun, Y.-J. Kim, Y. Kim, and S.-W. Kim, “Absolute distance measurement using the frequency comb of a femtosecond laser,” Annals of CIRP 59(1), 555–558 (2010).
[Crossref]
Y.-J. Kim, B. J. Chun, Y. Kim, S. Hyun, and S.-W. Kim, “Generation of optical frequencies out of the frequency comb of a femtosecond laser for DWDM telecommunication,” Laser Phys. Lett. 7(7), 522–527 (2010).
[Crossref]
S. Hyun, Y.-J. Kim, Y. Kim, J. Jin, and S.-W. Kim, “Absolute length measurement with the frequency comb of a femtosecond laser,” Meas. Sci. Technol. 20(9), 095302 (2009).
[Crossref]
Y.-J. Kim, Y. Kim, B. J. Chun, S. Hyun, and S.-W. Kim, “All-fiber-based optical frequency generation from an Er-doped fiber femtosecond laser,” Opt. Express 17(13), 10939–10945 (2009).
[Crossref]
[PubMed]
Y.-J. Kim, J. Jin, Y. Kim, S. Hyun, and S.-W. Kim, “A wide-range optical frequency generator based on the frequency comb of a femtosecond laser,” Opt. Express 16(1), 258–264 (2008).
[Crossref]
[PubMed]
J. Jin, Y.-J. Kim, Y. Kim, S.-W. Kim, and C.-S. Kang, “Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser,” Opt. Express 14(13), 5968–5974 (2006).
[Crossref]
[PubMed]
J. You, Y.-J. Kim, and S.-W. Kim, “GPU-accelerated white-light scanning interferometer for large-area, high-speed surface profile measurements,” Int. J. Nanomanufacturing 8(1/2), 31 (2012).
[Crossref]
Y.-J. Kim, B. J. Chun, Y. Kim, S. Hyun, and S.-W. Kim, “Generation of optical frequencies out of the frequency comb of a femtosecond laser for DWDM telecommunication,” Laser Phys. Lett. 7(7), 522–527 (2010).
[Crossref]
J. Lee, Y.-J. Kim, K. Lee, S. Lee, and S.-W. Kim, “Time-of-flight measurement with femtosecond light pulses,” Nat. Photonics 4(10), 716–720 (2010).
[Crossref]
S. Hyun, Y.-J. Kim, Y. Kim, and S.-W. Kim, “Absolute distance measurement using the frequency comb of a femtosecond laser,” Annals of CIRP 59(1), 555–558 (2010).
[Crossref]
S. Hyun, Y.-J. Kim, Y. Kim, J. Jin, and S.-W. Kim, “Absolute length measurement with the frequency comb of a femtosecond laser,” Meas. Sci. Technol. 20(9), 095302 (2009).
[Crossref]
Y.-J. Kim, Y. Kim, B. J. Chun, S. Hyun, and S.-W. Kim, “All-fiber-based optical frequency generation from an Er-doped fiber femtosecond laser,” Opt. Express 17(13), 10939–10945 (2009).
[Crossref]
[PubMed]
Y.-J. Kim, J. Jin, Y. Kim, S. Hyun, and S.-W. Kim, “A wide-range optical frequency generator based on the frequency comb of a femtosecond laser,” Opt. Express 16(1), 258–264 (2008).
[Crossref]
[PubMed]
J. Jin, Y.-J. Kim, Y. Kim, S.-W. Kim, and C.-S. Kang, “Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser,” Opt. Express 14(13), 5968–5974 (2006).
[Crossref]
[PubMed]
I.-B. Kong and S.-W. Kim, “General algorithm of phase-shifting interferometry by iterative least-squares fitting,” Opt. Eng. 34(1), 183–188 (1995).
[Crossref]
J. Lee, Y.-J. Kim, K. Lee, S. Lee, and S.-W. Kim, “Time-of-flight measurement with femtosecond light pulses,” Nat. Photonics 4(10), 716–720 (2010).
[Crossref]
J. Lee, Y.-J. Kim, K. Lee, S. Lee, and S.-W. Kim, “Time-of-flight measurement with femtosecond light pulses,” Nat. Photonics 4(10), 716–720 (2010).
[Crossref]
J. Jin, J. W. Kim, C.-S. Kang, J.-A. Kim, and S. Lee, “Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process,” Opt. Express 20(5), 5011–5016 (2012).
[Crossref]
[PubMed]
J. Lee, Y.-J. Kim, K. Lee, S. Lee, and S.-W. Kim, “Time-of-flight measurement with femtosecond light pulses,” Nat. Photonics 4(10), 716–720 (2010).
[Crossref]
J. E. Decker, J. R. Miles, A. A. Madej, R. F. Siemsen, K. J. Siemsen, S. de Bonth, K. Bustraan, S. Temple, and J. R. Pekelsky, “Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry-application to absolute long gauge block measurement,” Appl. Opt. 42(28), 5670–5678 (2003).
[Crossref]
[PubMed]
J. E. Decker, J. R. Miles, A. A. Madej, R. F. Siemsen, K. J. Siemsen, S. de Bonth, K. Bustraan, S. Temple, and J. R. Pekelsky, “Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry-application to absolute long gauge block measurement,” Appl. Opt. 42(28), 5670–5678 (2003).
[Crossref]
[PubMed]
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[Crossref]
N. R. Newbury, “Searching for applications with a fine-tooth comb,” Nat. Photonics 5(4), 186–188 (2011).
[Crossref]
I. Coddington, W. C. Swann, L. Nenadovic, and N. R. Newbury, “Rapid and precise absolute distance measurements at long range,” Nat. Photonics 3(6), 351–356 (2009).
[Crossref]
J. E. Decker, J. R. Miles, A. A. Madej, R. F. Siemsen, K. J. Siemsen, S. de Bonth, K. Bustraan, S. Temple, and J. R. Pekelsky, “Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry-application to absolute long gauge block measurement,” Appl. Opt. 42(28), 5670–5678 (2003).
[Crossref]
[PubMed]
J. Thiel, T. Pfeifer, and M. Hartmann, “Interferometric measurement of absolute distances of up to 40 m,” Measurement 16(1), 1–6 (1995).
[Crossref]
R. Dändliker, K. Hug, J. Politch, and E. Zimmermann, “High accuracy distance measurement with multiple-wavelength interferometry,” Opt. Eng. 34(8), 2407–2412 (1995).
[Crossref]
T. Udem, J. Reichert, R. Holzwarth, and T. W. Hänsch, “Absolute optical frequency measurement of the Cesium D1 line with a mode-locked laser,” Phys. Rev. Lett. 82(18), 3568–3571 (1999).
[Crossref]
J. E. Decker, J. R. Miles, A. A. Madej, R. F. Siemsen, K. J. Siemsen, S. de Bonth, K. Bustraan, S. Temple, and J. R. Pekelsky, “Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry-application to absolute long gauge block measurement,” Appl. Opt. 42(28), 5670–5678 (2003).
[Crossref]
[PubMed]
J. E. Decker, J. R. Miles, A. A. Madej, R. F. Siemsen, K. J. Siemsen, S. de Bonth, K. Bustraan, S. Temple, and J. R. Pekelsky, “Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry-application to absolute long gauge block measurement,” Appl. Opt. 42(28), 5670–5678 (2003).
[Crossref]
[PubMed]
A. E. Desjardins, B. J. Vakoc, M. J. Suter, S.-H. Yun, G. J. Tearney, and B. E. Bouma, “Real-time FPGA processing for high-speed optical frequency domain imaging.,” IEEE Trans. Med. Imaging 28(9), 1468–1472 (2009).
[Crossref]
[PubMed]
I. Coddington, W. C. Swann, L. Nenadovic, and N. R. Newbury, “Rapid and precise absolute distance measurements at long range,” Nat. Photonics 3(6), 351–356 (2009).
[Crossref]
A. E. Desjardins, B. J. Vakoc, M. J. Suter, S.-H. Yun, G. J. Tearney, and B. E. Bouma, “Real-time FPGA processing for high-speed optical frequency domain imaging.,” IEEE Trans. Med. Imaging 28(9), 1468–1472 (2009).
[Crossref]
[PubMed]
J. E. Decker, J. R. Miles, A. A. Madej, R. F. Siemsen, K. J. Siemsen, S. de Bonth, K. Bustraan, S. Temple, and J. R. Pekelsky, “Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry-application to absolute long gauge block measurement,” Appl. Opt. 42(28), 5670–5678 (2003).
[Crossref]
[PubMed]
J. Thiel, T. Pfeifer, and M. Hartmann, “Interferometric measurement of absolute distances of up to 40 m,” Measurement 16(1), 1–6 (1995).
[Crossref]
M. Tsai, H. Huang, M. Itoh, and T. Yatagai, “Fractional fringe order method using Fourier analysis for absolute measurement of block gauge thickness,” Opt. Rev. 6(5), 449–454 (1999).
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