S. P. Ma, J. Z. Pang, and Q. W. Ma, “The systematic error in digital image correlation induced by self-heating of a digital camera,” Meas. Sci. Technol. 23(2), 025403 (2012).

[CrossRef]

K. Ramesh, T. Kasimayan, and B. N. Simon, “Digital photoelasticity - A comprehensive review,” J. Strain Anal. Eng. Des. 46(4), 245–266 (2011).

[CrossRef]

H. Handel, “Analyzing the influences of camera warm-up effects on image acquisition,” IPSJ Trans. Comput. Vis. Appl. 1, 12–20 (2009).

[CrossRef]

B. Pan, K. M. Qian, H. M. Xie, and A. Asundi, “Two-dimensional digital image correlation for in-plane displacement and strain measurement: a review,” Meas. Sci. Technol. 20(6), 062001–062017 (2009).

[CrossRef]

Q. Kemao, “Two-dimensional windowed Fourier transform for fringe pattern analysis: Principles, applications and implementations,” Opt. Lasers Eng. 45(2), 304–317 (2007).

[CrossRef]

J. N. Petzing and J. R. Tyrer, “Recent developments and applications in electronic speckle pattern interferometry,” J. Strain Anal. Eng. Des. 33(2), 153–169 (1998).

[CrossRef]

K. Nishimura, H. Miyauchi, K. Fuzise, T. Otani, S. Okada, and H. Yokogawa, “Measurement of polished curved surfaces with tele-microscope,” Trans. Soc. Instrum. Control Eng. 30(10), 1260–1262 (1994).

K. W. Wong, M. Lew, and Y. Ke, “Experience with two vision systems,” Proc. SPIE 1395, 3–7 (1990).

H. A. Bruck, S. R. McNeill, M. A. Sutton, and W. H. Peters, “Digital image correlation using newton-raphson method of partial differential correction,” Exp. Mech. 29(3), 261–267 (1989).

[CrossRef]

B. Pan, K. M. Qian, H. M. Xie, and A. Asundi, “Two-dimensional digital image correlation for in-plane displacement and strain measurement: a review,” Meas. Sci. Technol. 20(6), 062001–062017 (2009).

[CrossRef]

H. A. Bruck, S. R. McNeill, M. A. Sutton, and W. H. Peters, “Digital image correlation using newton-raphson method of partial differential correction,” Exp. Mech. 29(3), 261–267 (1989).

[CrossRef]

K. Nishimura, H. Miyauchi, K. Fuzise, T. Otani, S. Okada, and H. Yokogawa, “Measurement of polished curved surfaces with tele-microscope,” Trans. Soc. Instrum. Control Eng. 30(10), 1260–1262 (1994).

H. Handel, “Analyzing the influences of camera warm-up effects on image acquisition,” IPSJ Trans. Comput. Vis. Appl. 1, 12–20 (2009).

[CrossRef]

K. Ramesh, T. Kasimayan, and B. N. Simon, “Digital photoelasticity - A comprehensive review,” J. Strain Anal. Eng. Des. 46(4), 245–266 (2011).

[CrossRef]

K. W. Wong, M. Lew, and Y. Ke, “Experience with two vision systems,” Proc. SPIE 1395, 3–7 (1990).

Q. Kemao, “Two-dimensional windowed Fourier transform for fringe pattern analysis: Principles, applications and implementations,” Opt. Lasers Eng. 45(2), 304–317 (2007).

[CrossRef]

K. W. Wong, M. Lew, and Y. Ke, “Experience with two vision systems,” Proc. SPIE 1395, 3–7 (1990).

S. P. Ma, J. Z. Pang, and Q. W. Ma, “The systematic error in digital image correlation induced by self-heating of a digital camera,” Meas. Sci. Technol. 23(2), 025403 (2012).

[CrossRef]

S. P. Ma, J. Z. Pang, and Q. W. Ma, “The systematic error in digital image correlation induced by self-heating of a digital camera,” Meas. Sci. Technol. 23(2), 025403 (2012).

[CrossRef]

H. A. Bruck, S. R. McNeill, M. A. Sutton, and W. H. Peters, “Digital image correlation using newton-raphson method of partial differential correction,” Exp. Mech. 29(3), 261–267 (1989).

[CrossRef]

K. Nishimura, H. Miyauchi, K. Fuzise, T. Otani, S. Okada, and H. Yokogawa, “Measurement of polished curved surfaces with tele-microscope,” Trans. Soc. Instrum. Control Eng. 30(10), 1260–1262 (1994).

K. Nishimura, H. Miyauchi, K. Fuzise, T. Otani, S. Okada, and H. Yokogawa, “Measurement of polished curved surfaces with tele-microscope,” Trans. Soc. Instrum. Control Eng. 30(10), 1260–1262 (1994).

K. Nishimura, H. Miyauchi, K. Fuzise, T. Otani, S. Okada, and H. Yokogawa, “Measurement of polished curved surfaces with tele-microscope,” Trans. Soc. Instrum. Control Eng. 30(10), 1260–1262 (1994).

K. Nishimura, H. Miyauchi, K. Fuzise, T. Otani, S. Okada, and H. Yokogawa, “Measurement of polished curved surfaces with tele-microscope,” Trans. Soc. Instrum. Control Eng. 30(10), 1260–1262 (1994).

B. Pan, K. M. Qian, H. M. Xie, and A. Asundi, “Two-dimensional digital image correlation for in-plane displacement and strain measurement: a review,” Meas. Sci. Technol. 20(6), 062001–062017 (2009).

[CrossRef]

S. P. Ma, J. Z. Pang, and Q. W. Ma, “The systematic error in digital image correlation induced by self-heating of a digital camera,” Meas. Sci. Technol. 23(2), 025403 (2012).

[CrossRef]

H. A. Bruck, S. R. McNeill, M. A. Sutton, and W. H. Peters, “Digital image correlation using newton-raphson method of partial differential correction,” Exp. Mech. 29(3), 261–267 (1989).

[CrossRef]

J. N. Petzing and J. R. Tyrer, “Recent developments and applications in electronic speckle pattern interferometry,” J. Strain Anal. Eng. Des. 33(2), 153–169 (1998).

[CrossRef]

B. Pan, K. M. Qian, H. M. Xie, and A. Asundi, “Two-dimensional digital image correlation for in-plane displacement and strain measurement: a review,” Meas. Sci. Technol. 20(6), 062001–062017 (2009).

[CrossRef]

K. Ramesh, T. Kasimayan, and B. N. Simon, “Digital photoelasticity - A comprehensive review,” J. Strain Anal. Eng. Des. 46(4), 245–266 (2011).

[CrossRef]

K. Ramesh, T. Kasimayan, and B. N. Simon, “Digital photoelasticity - A comprehensive review,” J. Strain Anal. Eng. Des. 46(4), 245–266 (2011).

[CrossRef]

H. A. Bruck, S. R. McNeill, M. A. Sutton, and W. H. Peters, “Digital image correlation using newton-raphson method of partial differential correction,” Exp. Mech. 29(3), 261–267 (1989).

[CrossRef]

J. N. Petzing and J. R. Tyrer, “Recent developments and applications in electronic speckle pattern interferometry,” J. Strain Anal. Eng. Des. 33(2), 153–169 (1998).

[CrossRef]

K. W. Wong, M. Lew, and Y. Ke, “Experience with two vision systems,” Proc. SPIE 1395, 3–7 (1990).

B. Pan, K. M. Qian, H. M. Xie, and A. Asundi, “Two-dimensional digital image correlation for in-plane displacement and strain measurement: a review,” Meas. Sci. Technol. 20(6), 062001–062017 (2009).

[CrossRef]

K. Nishimura, H. Miyauchi, K. Fuzise, T. Otani, S. Okada, and H. Yokogawa, “Measurement of polished curved surfaces with tele-microscope,” Trans. Soc. Instrum. Control Eng. 30(10), 1260–1262 (1994).

H. A. Bruck, S. R. McNeill, M. A. Sutton, and W. H. Peters, “Digital image correlation using newton-raphson method of partial differential correction,” Exp. Mech. 29(3), 261–267 (1989).

[CrossRef]

H. Handel, “Analyzing the influences of camera warm-up effects on image acquisition,” IPSJ Trans. Comput. Vis. Appl. 1, 12–20 (2009).

[CrossRef]

J. N. Petzing and J. R. Tyrer, “Recent developments and applications in electronic speckle pattern interferometry,” J. Strain Anal. Eng. Des. 33(2), 153–169 (1998).

[CrossRef]

K. Ramesh, T. Kasimayan, and B. N. Simon, “Digital photoelasticity - A comprehensive review,” J. Strain Anal. Eng. Des. 46(4), 245–266 (2011).

[CrossRef]

S. P. Ma, J. Z. Pang, and Q. W. Ma, “The systematic error in digital image correlation induced by self-heating of a digital camera,” Meas. Sci. Technol. 23(2), 025403 (2012).

[CrossRef]

B. Pan, K. M. Qian, H. M. Xie, and A. Asundi, “Two-dimensional digital image correlation for in-plane displacement and strain measurement: a review,” Meas. Sci. Technol. 20(6), 062001–062017 (2009).

[CrossRef]

Q. Kemao, “Two-dimensional windowed Fourier transform for fringe pattern analysis: Principles, applications and implementations,” Opt. Lasers Eng. 45(2), 304–317 (2007).

[CrossRef]

K. W. Wong, M. Lew, and Y. Ke, “Experience with two vision systems,” Proc. SPIE 1395, 3–7 (1990).

K. Nishimura, H. Miyauchi, K. Fuzise, T. Otani, S. Okada, and H. Yokogawa, “Measurement of polished curved surfaces with tele-microscope,” Trans. Soc. Instrum. Control Eng. 30(10), 1260–1262 (1994).

X. Wang, Q. W. Ma, S. P. Ma, and H. T. Wang, “A marker locating method based on gray centroid algorithm and its application to displacement and strain measurement,” in Proceedings of IEEE Conference on Intelligent Computation Technology and Automation (Institute of Electrical and Electronics Engineers, 2011), pp. 932–937.

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