Q. C. Zhang and Z. Y. Wu, “A carrier removal method in Fourier transform profilometry with Zernike polynomials,” Opt. Lasers Eng. 51(3), 253–260 (2013).

[Crossref]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

C. Quan, C. J. Tay, and L. J. Chen, “A study on carrier-removal techniques in fringe projection profilometry,” Opt. Laser Technol. 39(6), 1155–1161 (2007).

[Crossref]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE 5457, 366–376 (2004).

[Crossref]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE 5457, 366–376 (2004).

[Crossref]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE 5457, 366–376 (2004).

[Crossref]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE 5457, 366–376 (2004).

[Crossref]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

C. Quan, C. J. Tay, and L. J. Chen, “A study on carrier-removal techniques in fringe projection profilometry,” Opt. Laser Technol. 39(6), 1155–1161 (2007).

[Crossref]

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

Q. C. Zhang and Z. Y. Wu, “A carrier removal method in Fourier transform profilometry with Zernike polynomials,” Opt. Lasers Eng. 51(3), 253–260 (2013).

[Crossref]

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

Q. C. Zhang and Z. Y. Wu, “A carrier removal method in Fourier transform profilometry with Zernike polynomials,” Opt. Lasers Eng. 51(3), 253–260 (2013).

[Crossref]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

S. Zhang, D. Van Der Weide, and J. Oliver, “Superfast phase-shifting method for 3-D shape measurement,” Opt. Express 18(9), 9684–9689 (2010).

[Crossref]
[PubMed]

L. Huang, C. S. Ng, and A. K. Asundi, “Dynamic three-dimensional sensing for specular surface with monoscopic fringe reflectometry,” Opt. Express 19(13), 12809–12814 (2011).

[Crossref]
[PubMed]

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

C. Quan, C. J. Tay, and L. J. Chen, “A study on carrier-removal techniques in fringe projection profilometry,” Opt. Laser Technol. 39(6), 1155–1161 (2007).

[Crossref]

Q. C. Zhang and Z. Y. Wu, “A carrier removal method in Fourier transform profilometry with Zernike polynomials,” Opt. Lasers Eng. 51(3), 253–260 (2013).

[Crossref]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE 5457, 366–376 (2004).

[Crossref]