Q. C. Zhang and Z. Y. Wu, “A carrier removal method in Fourier transform profilometry with Zernike polynomials,” Opt. Lasers Eng.51(3), 253–260 (2013).

[CrossRef]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser23(11), 2154-2162 (2012).

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express20(22), 24505–24515 (2012).

[CrossRef]
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C. Quan, C. J. Tay, and L. J. Chen, “A study on carrier-removal techniques in fringe projection profilometry,” Opt. Laser Technol.39(6), 1155–1161 (2007).

[CrossRef]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE5457, 366–376 (2004).

[CrossRef]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE5457, 366–376 (2004).

[CrossRef]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE5457, 366–376 (2004).

[CrossRef]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE5457, 366–376 (2004).

[CrossRef]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser23(11), 2154-2162 (2012).

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express20(22), 24505–24515 (2012).

[CrossRef]
[PubMed]

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express20(22), 24505–24515 (2012).

[CrossRef]
[PubMed]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser23(11), 2154-2162 (2012).

C. Quan, C. J. Tay, and L. J. Chen, “A study on carrier-removal techniques in fringe projection profilometry,” Opt. Laser Technol.39(6), 1155–1161 (2007).

[CrossRef]

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express20(22), 24505–24515 (2012).

[CrossRef]
[PubMed]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser23(11), 2154-2162 (2012).

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser23(11), 2154-2162 (2012).

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express20(22), 24505–24515 (2012).

[CrossRef]
[PubMed]

Q. C. Zhang and Z. Y. Wu, “A carrier removal method in Fourier transform profilometry with Zernike polynomials,” Opt. Lasers Eng.51(3), 253–260 (2013).

[CrossRef]

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express20(22), 24505–24515 (2012).

[CrossRef]
[PubMed]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser23(11), 2154-2162 (2012).

Q. C. Zhang and Z. Y. Wu, “A carrier removal method in Fourier transform profilometry with Zernike polynomials,” Opt. Lasers Eng.51(3), 253–260 (2013).

[CrossRef]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser23(11), 2154-2162 (2012).

S. Zhang, D. Van Der Weide, and J. Oliver, “Superfast phase-shifting method for 3-D shape measurement,” Opt. Express18(9), 9684–9689 (2010).

[CrossRef]
[PubMed]

L. Huang, C. S. Ng, and A. K. Asundi, “Dynamic three-dimensional sensing for specular surface with monoscopic fringe reflectometry,” Opt. Express19(13), 12809–12814 (2011).

[CrossRef]
[PubMed]

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express20(22), 24505–24515 (2012).

[CrossRef]
[PubMed]

C. Quan, C. J. Tay, and L. J. Chen, “A study on carrier-removal techniques in fringe projection profilometry,” Opt. Laser Technol.39(6), 1155–1161 (2007).

[CrossRef]

Q. C. Zhang and Z. Y. Wu, “A carrier removal method in Fourier transform profilometry with Zernike polynomials,” Opt. Lasers Eng.51(3), 253–260 (2013).

[CrossRef]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE5457, 366–376 (2004).

[CrossRef]