Abstract

A technique for absolute phase measurement in fringe projection for shape measurement is presented. A standard fringe projection system is used, comprising a camera and a projector fixed relative to each other. The test object is moved to different orientations relative to the fringe projection system. Using the system calibration parameters, the technique identifies homologous surface areas imaged from different perspectives and resolves the 2π phase ambiguity between them simultaneously. The technique is also used to identify regions of the phase maps corresponding to discrete surfaces on the object. The methods described are suitable for automatic shape measurement with a lightweight fringe projection probe mounted to a coordinate measuring machine.

© 2013 OSA

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References

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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef]
  8. D. Scharstein and R. Szeliski, “High-accuracy stereo depth maps using structured light,” in Proceedings of the 2003 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR’03), (IEEE Computer Society, 2003), pp. I195–I202.
    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef]
  14. N. J. Weston, Y. R. Huddart, A. J. Moore, and T. C. Featherstone, “Phase analysis measurement apparatus and method,” International patent pending WO2009 / 024757(A1) (2008).
  15. N. J. Weston, Y. R. Huddart, and A. J. Moore, “Non-contact measurement apparatus and method,” International patent pending WO2009 / 024756(A1) (2008).
  16. N. J. Weston and Y. R. Huddart, “Non-contact probe,” International patent pending WO2009 / 024758(A1) (2008).
  17. N. J. Weston and Y. R. Huddart, “Non-contact object inspection,” International patent pending WO2011 / 030090(A1) (2011).

2011 (1)

2007 (2)

2003 (1)

M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng.42(10), 2923–2929 (2003).
[CrossRef]

2002 (1)

2001 (1)

R. J. Campbell and P. J. Flynn, “A survey of free-form object representation and recognition techniques,” Comput. Vis. Image Underst.81(2), 166–210 (2001).
[CrossRef]

2000 (1)

C. Reich, R. Ritter, and J. Thesing, “3-D shape measurement of complex objects by combining photogrammetry and fringe projection,” Opt. Eng.39(1), 224–231 (2000).
[CrossRef]

1999 (1)

1997 (2)

Barton, J. S.

Campbell, R. J.

R. J. Campbell and P. J. Flynn, “A survey of free-form object representation and recognition techniques,” Comput. Vis. Image Underst.81(2), 166–210 (2001).
[CrossRef]

Carocci, M.

Corini, S.

Deguchi, K.

Docchio, F.

Featherstone, T. C.

Flynn, P. J.

R. J. Campbell and P. J. Flynn, “A survey of free-form object representation and recognition techniques,” Comput. Vis. Image Underst.81(2), 166–210 (2001).
[CrossRef]

Hand, D. P.

M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng.42(10), 2923–2929 (2003).
[CrossRef]

Huddart, Y. R.

Huntley, J. M.

J. M. Huntley and H. O. Saldner, “Shape measurement by temporal phase unwrapping: comparison of unwrapping algorithms,” Meas. Sci. Technol.8(9), 986–992 (1997).
[CrossRef]

Ishiyama, R.

Jones, J. D. C.

M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng.42(10), 2923–2929 (2003).
[CrossRef]

A. J. Moore, R. McBride, J. S. Barton, and J. D. C. Jones, “Closed-loop phase stepping in a calibrated fiber-optic fringe projector for shape measurement,” Appl. Opt.41(16), 3348–3354 (2002).
[CrossRef] [PubMed]

Lazzari, S.

McBride, R.

Moore, A. J.

Okatani, T.

Reeves, M.

M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng.42(10), 2923–2929 (2003).
[CrossRef]

Reich, C.

C. Reich, R. Ritter, and J. Thesing, “3-D shape measurement of complex objects by combining photogrammetry and fringe projection,” Opt. Eng.39(1), 224–231 (2000).
[CrossRef]

Ritter, R.

C. Reich, R. Ritter, and J. Thesing, “3-D shape measurement of complex objects by combining photogrammetry and fringe projection,” Opt. Eng.39(1), 224–231 (2000).
[CrossRef]

Rodella, R.

Sakamoto, S.

Saldner, H. O.

J. M. Huntley and H. O. Saldner, “Shape measurement by temporal phase unwrapping: comparison of unwrapping algorithms,” Meas. Sci. Technol.8(9), 986–992 (1997).
[CrossRef]

Sansoni, G.

Tajima, J.

Thesing, J.

C. Reich, R. Ritter, and J. Thesing, “3-D shape measurement of complex objects by combining photogrammetry and fringe projection,” Opt. Eng.39(1), 224–231 (2000).
[CrossRef]

Valera, J. D. R.

Weston, N. J.

Yau, S.-T.

Zhang, S.

Appl. Opt. (5)

Comput. Vis. Image Underst. (1)

R. J. Campbell and P. J. Flynn, “A survey of free-form object representation and recognition techniques,” Comput. Vis. Image Underst.81(2), 166–210 (2001).
[CrossRef]

Meas. Sci. Technol. (1)

J. M. Huntley and H. O. Saldner, “Shape measurement by temporal phase unwrapping: comparison of unwrapping algorithms,” Meas. Sci. Technol.8(9), 986–992 (1997).
[CrossRef]

Opt. Eng. (2)

C. Reich, R. Ritter, and J. Thesing, “3-D shape measurement of complex objects by combining photogrammetry and fringe projection,” Opt. Eng.39(1), 224–231 (2000).
[CrossRef]

M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng.42(10), 2923–2929 (2003).
[CrossRef]

Opt. Express (1)

Other (7)

N. J. Weston, Y. R. Huddart, A. J. Moore, and T. C. Featherstone, “Phase analysis measurement apparatus and method,” International patent pending WO2009 / 024757(A1) (2008).

N. J. Weston, Y. R. Huddart, and A. J. Moore, “Non-contact measurement apparatus and method,” International patent pending WO2009 / 024756(A1) (2008).

N. J. Weston and Y. R. Huddart, “Non-contact probe,” International patent pending WO2009 / 024758(A1) (2008).

N. J. Weston and Y. R. Huddart, “Non-contact object inspection,” International patent pending WO2011 / 030090(A1) (2011).

J. M. Fitts, “Hidden change distribution grating and use in 3D moire measurement sensors and CMM applications,” US Patent 5319445 (1994).

D. Scharstein and R. Szeliski, “High-accuracy stereo depth maps using structured light,” in Proceedings of the 2003 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR’03), (IEEE Computer Society, 2003), pp. I195–I202.
[CrossRef]

C. Brauer-Burchardt, C. Munkelt, M. Heinze, P. Kunmstedt, and G. Notni, “Phase unwrapping in fringe projection systems using epipolar geometry,” in Advanced Concepts for Intelligent Vision Systems, LNCS 5259, 422–432 (2008).

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Figures (6)

Fig. 1
Fig. 1

(a) Test object. (b) Wrapped phase map from perspective 1 with initially identified object edges marked blue. (c) and (d) Phase maps calculated from phase-stepped images in different cyclic orders, showing object edges (fixed position) and phase wrap discontinuities (moved position) between images.

Fig. 2
Fig. 2

(a) Unwrapped phase map for perspective 1. Area 1 and regions 2, 3 and 4 show different features of the unwrapped phase (described in the text) before it is re-projected into the unwrapped phase maps from other perspectives. (b) to (d) Unwrapped phase maps from perspectives 2 3 and 4, respectively.

Fig. 3
Fig. 3

Perspective 2 with re-projected candidate point clouds originating from area 1 of perspective 1. Point clouds have been calculated with (a) m = −15, (b) m = −10, (c) m = −5 and (d) m = 0.

Fig. 4
Fig. 4

Standard deviation in difference between expected and measured phase, for area 1 from perspective 1 re-projected into (a) perspective 3 and (b) perspective 4. Error bars indicate estimated measurement uncertainty, ± 3ε/√N.

Fig. 5
Fig. 5

(a) to (c) Standard deviation in the difference between expected and measured phase for regions of interest 2 to 4 in perspective 1, Fig. 2(a), respectively. Error bars indicate the estimated measurement uncertainty, ± 3ε/√N.

Fig. 6
Fig. 6

Height map (absolute phase) obtained automatically using the techniques described herein.

Equations (1)

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ϕ a ( x,y )= ϕ u ( x,y )+2mπ

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