We present a novel approach for modeling the reflectance, transmittance and absorption depth profile of thin-film multilayer structures such as solar cells. Our model is based on the net-radiation method adapted for coherent calculations and is highly flexible while using a simple algorithm. We demonstrate that as a result arbitrary multilayer structures with coherent, partly coherent and incoherent layers can be simulated more accurately at much lower computational cost.
©2013 Optical Society of America
OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.
Alert me when this article is cited.
Equations on this page are rendered with MathJax. Learn more.