M. Servin, J. C. Estrada, J. A. Quiroga, J. F. Mosiño, and M. Cywiak, “Noise in phase shifting interferometry,” Opt. Express17(11), 8789–8794 (2009).

[CrossRef]
[PubMed]

P. Gao, B. Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, “Phase-shift extraction for generalized phase-shifting interferometry,” Opt. Lett.34(22), 3553–3555 (2009).

[CrossRef]
[PubMed]

H. Guo, Q. Yang, and M. Chen, “Local Frequency Estimation for the Fringe Pattern with a Spatial Carrier: Principle and Applications,” Appl. Opt.46(7), 1057–1065 (2007).

[CrossRef]
[PubMed]

H. Guo, Z. Zhao, and M. Chen, “Efficient iterative algorithm for phase-shifting interferometry,” Opt. Lasers Eng.45(2), 281–292 (2007).

[CrossRef]

W. H. Wang, Y. S. Wong, and G. S. Hong, “3D measurement of crater wear by phase shifting method,” Wear261(2), 164–171 (2006).

[CrossRef]

J.-R. Lee, “Spatial resolution and resolution in phase-shifting laser interferometry,” Meas. Sci. Technol.16(12), 2525–2533 (2005).

[CrossRef]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng.44(3), 033603 (2005).

[CrossRef]

O. Soloviev and G. Vdovin, “Phase extraction from three and more interferograms registered with different unknown wavefront tilts,” Opt. Express13(10), 3743–3753 (2005).

[CrossRef]
[PubMed]

J.-R. Lee, J. Molimard, A. Vautrin, and Y. Surrel, “Digital phase-shifting grating shearography for experimental analysis of fabric composites under tension,” Composites: Part A35(7-8), 849–859 (2004).

[CrossRef]

H. Guo and M. Chen, “Fourier analysis of the sampling characteristics of the phase-shifting algorithm,” Proc. SPIE5180, 437–444 (2003).

N. A. Booth, A. A. Chernov, and P. G. Vekilov, “Characteristic lengthscales of step bunching in KDP crystal growth: in situ differential phase-shifting interferometry study,” J. Cryst. Growth237–239, 1818–1824 (2002).

[CrossRef]

J. E. Greivenkamp, “Generalized data reduction for heterodyne interferometry,” Opt. Eng.23, 350–352 (1984).

N. A. Booth, A. A. Chernov, and P. G. Vekilov, “Characteristic lengthscales of step bunching in KDP crystal growth: in situ differential phase-shifting interferometry study,” J. Cryst. Growth237–239, 1818–1824 (2002).

[CrossRef]

H. Guo, Z. Zhao, and M. Chen, “Efficient iterative algorithm for phase-shifting interferometry,” Opt. Lasers Eng.45(2), 281–292 (2007).

[CrossRef]

H. Guo, Q. Yang, and M. Chen, “Local Frequency Estimation for the Fringe Pattern with a Spatial Carrier: Principle and Applications,” Appl. Opt.46(7), 1057–1065 (2007).

[CrossRef]
[PubMed]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng.44(3), 033603 (2005).

[CrossRef]

H. Guo and M. Chen, “Fourier analysis of the sampling characteristics of the phase-shifting algorithm,” Proc. SPIE5180, 437–444 (2003).

N. A. Booth, A. A. Chernov, and P. G. Vekilov, “Characteristic lengthscales of step bunching in KDP crystal growth: in situ differential phase-shifting interferometry study,” J. Cryst. Growth237–239, 1818–1824 (2002).

[CrossRef]

P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao, “Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy,” Opt. Lett.35(5), 712–714 (2010).

[CrossRef]
[PubMed]

P. Gao, B. Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, “Phase-shift extraction for generalized phase-shifting interferometry,” Opt. Lett.34(22), 3553–3555 (2009).

[CrossRef]
[PubMed]

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H. Guo, “Blind self-calibrating algorithm for phase-shifting interferometry by use of cross-bispectrum,” Opt. Express19(8), 7807–7815 (2011).

[CrossRef]
[PubMed]

H. Guo, Q. Yang, and M. Chen, “Local Frequency Estimation for the Fringe Pattern with a Spatial Carrier: Principle and Applications,” Appl. Opt.46(7), 1057–1065 (2007).

[CrossRef]
[PubMed]

H. Guo, Z. Zhao, and M. Chen, “Efficient iterative algorithm for phase-shifting interferometry,” Opt. Lasers Eng.45(2), 281–292 (2007).

[CrossRef]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng.44(3), 033603 (2005).

[CrossRef]

H. Guo and M. Chen, “Fourier analysis of the sampling characteristics of the phase-shifting algorithm,” Proc. SPIE5180, 437–444 (2003).

P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao, “Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy,” Opt. Lett.35(5), 712–714 (2010).

[CrossRef]
[PubMed]

P. Gao, B. Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, “Phase-shift extraction for generalized phase-shifting interferometry,” Opt. Lett.34(22), 3553–3555 (2009).

[CrossRef]
[PubMed]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng.44(3), 033603 (2005).

[CrossRef]

W. H. Wang, Y. S. Wong, and G. S. Hong, “3D measurement of crater wear by phase shifting method,” Wear261(2), 164–171 (2006).

[CrossRef]

J.-R. Lee, “Spatial resolution and resolution in phase-shifting laser interferometry,” Meas. Sci. Technol.16(12), 2525–2533 (2005).

[CrossRef]

J.-R. Lee, J. Molimard, A. Vautrin, and Y. Surrel, “Digital phase-shifting grating shearography for experimental analysis of fabric composites under tension,” Composites: Part A35(7-8), 849–859 (2004).

[CrossRef]

P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao, “Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy,” Opt. Lett.35(5), 712–714 (2010).

[CrossRef]
[PubMed]

P. Gao, B. Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, “Phase-shift extraction for generalized phase-shifting interferometry,” Opt. Lett.34(22), 3553–3555 (2009).

[CrossRef]
[PubMed]

J.-R. Lee, J. Molimard, A. Vautrin, and Y. Surrel, “Digital phase-shifting grating shearography for experimental analysis of fabric composites under tension,” Composites: Part A35(7-8), 849–859 (2004).

[CrossRef]

S. Singh, S. Rana, S. Prakash, and O. Sasaki, “Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles,” Optik (Stuttg.)122(18), 1666–1671 (2011).

[CrossRef]

S. Singh, S. Rana, S. Prakash, and O. Sasaki, “Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles,” Optik (Stuttg.)122(18), 1666–1671 (2011).

[CrossRef]

S. Singh, S. Rana, S. Prakash, and O. Sasaki, “Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles,” Optik (Stuttg.)122(18), 1666–1671 (2011).

[CrossRef]

S. Singh, S. Rana, S. Prakash, and O. Sasaki, “Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles,” Optik (Stuttg.)122(18), 1666–1671 (2011).

[CrossRef]

J.-R. Lee, J. Molimard, A. Vautrin, and Y. Surrel, “Digital phase-shifting grating shearography for experimental analysis of fabric composites under tension,” Composites: Part A35(7-8), 849–859 (2004).

[CrossRef]

N. A. Booth, A. A. Chernov, and P. G. Vekilov, “Characteristic lengthscales of step bunching in KDP crystal growth: in situ differential phase-shifting interferometry study,” J. Cryst. Growth237–239, 1818–1824 (2002).

[CrossRef]

W. H. Wang, Y. S. Wong, and G. S. Hong, “3D measurement of crater wear by phase shifting method,” Wear261(2), 164–171 (2006).

[CrossRef]

W. H. Wang, Y. S. Wong, and G. S. Hong, “3D measurement of crater wear by phase shifting method,” Wear261(2), 164–171 (2006).

[CrossRef]

P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao, “Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy,” Opt. Lett.35(5), 712–714 (2010).

[CrossRef]
[PubMed]

P. Gao, B. Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, “Phase-shift extraction for generalized phase-shifting interferometry,” Opt. Lett.34(22), 3553–3555 (2009).

[CrossRef]
[PubMed]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng.44(3), 033603 (2005).

[CrossRef]

H. Guo, Z. Zhao, and M. Chen, “Efficient iterative algorithm for phase-shifting interferometry,” Opt. Lasers Eng.45(2), 281–292 (2007).

[CrossRef]

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[CrossRef]
[PubMed]

J.-R. Lee, J. Molimard, A. Vautrin, and Y. Surrel, “Digital phase-shifting grating shearography for experimental analysis of fabric composites under tension,” Composites: Part A35(7-8), 849–859 (2004).

[CrossRef]

N. A. Booth, A. A. Chernov, and P. G. Vekilov, “Characteristic lengthscales of step bunching in KDP crystal growth: in situ differential phase-shifting interferometry study,” J. Cryst. Growth237–239, 1818–1824 (2002).

[CrossRef]

J.-R. Lee, “Spatial resolution and resolution in phase-shifting laser interferometry,” Meas. Sci. Technol.16(12), 2525–2533 (2005).

[CrossRef]

J. E. Greivenkamp, “Generalized data reduction for heterodyne interferometry,” Opt. Eng.23, 350–352 (1984).

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng.44(3), 033603 (2005).

[CrossRef]

M. Servin, J. C. Estrada, J. A. Quiroga, J. F. Mosiño, and M. Cywiak, “Noise in phase shifting interferometry,” Opt. Express17(11), 8789–8794 (2009).

[CrossRef]
[PubMed]

O. Soloviev and G. Vdovin, “Phase extraction from three and more interferograms registered with different unknown wavefront tilts,” Opt. Express13(10), 3743–3753 (2005).

[CrossRef]
[PubMed]

H. Guo, “Blind self-calibrating algorithm for phase-shifting interferometry by use of cross-bispectrum,” Opt. Express19(8), 7807–7815 (2011).

[CrossRef]
[PubMed]

H. Guo, Z. Zhao, and M. Chen, “Efficient iterative algorithm for phase-shifting interferometry,” Opt. Lasers Eng.45(2), 281–292 (2007).

[CrossRef]

P. Gao, B. Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, “Phase-shift extraction for generalized phase-shifting interferometry,” Opt. Lett.34(22), 3553–3555 (2009).

[CrossRef]
[PubMed]

P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao, “Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy,” Opt. Lett.35(5), 712–714 (2010).

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[CrossRef]

H. Guo and M. Chen, “Fourier analysis of the sampling characteristics of the phase-shifting algorithm,” Proc. SPIE5180, 437–444 (2003).

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