Abstract

A demodulation algorithm based on absolute phase recovery of a selected monochromatic frequency is proposed for optical fiber Fabry-Perot pressure sensing system. The algorithm uses Fourier transform to get the relative phase and intercept of the unwrapped phase-frequency linear fit curve to identify its interference-order, which are then used to recover the absolute phase. A simplified mathematical model of the polarized low-coherence interference fringes was established to illustrate the principle of the proposed algorithm. Phase unwrapping and the selection of monochromatic frequency were discussed in detail. Pressure measurement experiment was carried out to verify the effectiveness of the proposed algorithm. Results showed that the demodulation precision by our algorithm could reach up to 0.15kPa, which has been improved by 13 times comparing with phase slope based algorithm.

© 2012 OSA

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2010 (1)

2006 (1)

2002 (3)

2001 (1)

2000 (2)

A. Harasaki, J. Schmit, and J. C. Wyant, “Improved vertical-scanning interferometry,” Appl. Opt.39(13), 2107–2115 (2000).
[CrossRef] [PubMed]

J. G. Kim, “Absolute temperature measurement using white light interferometry,” J. Opt. Soc. Kor.4(2), 89–93 (2000).
[CrossRef]

1997 (3)

1996 (2)

K. G. Larkin, “Efficient nonlinear algorithm for envelope detection in white-light interferometry,” J. Opt. Soc. Am.13(4), 832–843 (1996).
[CrossRef]

P. Sandoz, “An algorithm for profilometry by white-light phase-shifting interferometry,” J. Mod. Opt.43, 1545–1554 (1996).

1995 (1)

P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt.42(2), 389–401 (1995).
[CrossRef]

1992 (4)

1990 (1)

1989 (1)

Boccara, A. C.

Chen, S.

Chim, S. S. C.

Colonna de Lega, X.

Dändliker, R.

de Groot, P.

P. de Groot, X. Colonna de Lega, J. Kramer, and M. Turzhitsky, “Determination of fringe order in white-light interference microscopy,” Appl. Opt.41(22), 4571–4578 (2002).
[CrossRef] [PubMed]

P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt.42(2), 389–401 (1995).
[CrossRef]

Debnath, S. K.

Deck, L.

P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt.42(2), 389–401 (1995).
[CrossRef]

Devillers, R.

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt.44(3), 519–534 (1997).
[CrossRef]

Dobson, C. C.

Dresel, T.

Dubois, A.

Farrant, D. I.

Frosio, G.

Grattan, K. T. V.

Harasaki, A.

Häusler, G.

Hibino, K.

Hirabayashi, A.

Kim, J. G.

J. G. Kim, “Absolute temperature measurement using white light interferometry,” J. Opt. Soc. Kor.4(2), 89–93 (2000).
[CrossRef]

Kim, K. H.

Kim, S. H.

Kino, G. S.

Kitagawa, K.

Kothiyal, M. P.

Kramer, J.

Larkin, K. G.

K. Hibino, B. F. Oreb, D. I. Farrant, and K. G. Larkin, “Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts,” J. Opt. Soc. Am. A14(4), 918–930 (1997).
[CrossRef]

K. G. Larkin, “Efficient nonlinear algorithm for envelope detection in white-light interferometry,” J. Opt. Soc. Am.13(4), 832–843 (1996).
[CrossRef]

Lee, S. H.

Lim, J. I.

Meggitt, B. T.

Ogawa, H.

Oreb, B. F.

Palmer, A. W.

Pf rtner, A.

Plata, A.

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt.44(3), 519–534 (1997).
[CrossRef]

Sandoz, P.

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt.44(3), 519–534 (1997).
[CrossRef]

P. Sandoz, “Wavelet transform as a processing tool in white-light interferometry,” Opt. Lett.22(14), 1065–1067 (1997).
[CrossRef] [PubMed]

P. Sandoz, “An algorithm for profilometry by white-light phase-shifting interferometry,” J. Mod. Opt.43, 1545–1554 (1996).

Schmit, J.

Schwider, J.

Smith, L. M.

Turzhitsky, M.

Vabre, L.

Venzke, H.

Wyant, J. C.

Zimmermann, E.

Appl. Opt. (11)

L. M. Smith and C. C. Dobson, “Absolute displacement measurements using modulation of the spectrum of white light in a Michelson interferometer,” Appl. Opt.28(16), 3339–3342 (1989).
[CrossRef] [PubMed]

G. S. Kino and S. S. C. Chim, “Miraucorrelation microscope,” Appl. Opt.29(26), 3775–3783 (1990).
[CrossRef] [PubMed]

S. S. C. Chim and G. S. Kino, “Three-dimensional image realization in interference microscopy,” Appl. Opt.31(14), 2550–2553 (1992).
[CrossRef] [PubMed]

A. Harasaki, J. Schmit, and J. C. Wyant, “Improved vertical-scanning interferometry,” Appl. Opt.39(13), 2107–2115 (2000).
[CrossRef] [PubMed]

P. de Groot, X. Colonna de Lega, J. Kramer, and M. Turzhitsky, “Determination of fringe order in white-light interference microscopy,” Appl. Opt.41(22), 4571–4578 (2002).
[CrossRef] [PubMed]

A. Hirabayashi, H. Ogawa, and K. Kitagawa, “Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory,” Appl. Opt.41(23), 4876–4883 (2002).
[CrossRef] [PubMed]

S. Chen, A. W. Palmer, K. T. V. Grattan, and B. T. Meggitt, “Digital signal-processing techniques for electronically scanned optical-fiber white-light interferometry,” Appl. Opt.31(28), 6003–6010 (1992).
[CrossRef] [PubMed]

S. K. Debnath and M. P. Kothiyal, “Improved optical profiling using the spectral phase in spectrally resolved white-light interferometry,” Appl. Opt.45(27), 6965–6972 (2006).
[CrossRef] [PubMed]

S. H. Kim, S. H. Lee, J. I. Lim, and K. H. Kim, “Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry,” Appl. Opt.49(5), 910–914 (2010).
[CrossRef] [PubMed]

T. Dresel, G. Häusler, and H. Venzke, “Three-dimensional sensing of rough surfaces by coherence radar,” Appl. Opt.31(7), 919–925 (1992).
[CrossRef] [PubMed]

A. Pf rtner and J. Schwider, “Dispersion error in white-light linnik interferometers and its implications for evaluation procedures,” Appl. Opt.40(34), 6223–6228 (2001).
[CrossRef] [PubMed]

J. Mod. Opt. (3)

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt.44(3), 519–534 (1997).
[CrossRef]

P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt.42(2), 389–401 (1995).
[CrossRef]

P. Sandoz, “An algorithm for profilometry by white-light phase-shifting interferometry,” J. Mod. Opt.43, 1545–1554 (1996).

J. Opt. Soc. Am. (1)

K. G. Larkin, “Efficient nonlinear algorithm for envelope detection in white-light interferometry,” J. Opt. Soc. Am.13(4), 832–843 (1996).
[CrossRef]

J. Opt. Soc. Am. A (1)

J. Opt. Soc. Kor. (1)

J. G. Kim, “Absolute temperature measurement using white light interferometry,” J. Opt. Soc. Kor.4(2), 89–93 (2000).
[CrossRef]

Opt. Lett. (3)

Other (1)

S. Timoshenko and S. Woinowsky-Krieger, Theory of Plates and Shells (McGraw-Hill, 1989).

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