Abstract

An approach using a liquid-crystal spatial light modulator (LC-SLM) to enlarge the depth measuring range of the projected fringe profilometry is presented. This approach is especially applicable to detect dynamic objects with micro-scale sizes. Compared with a typical 2D image system, the LC-SLM provides a better performance for a 3D shape sensing system. The main advantages include (1) a much higher allowance to increase in the depth measuring range, (2) easiness to compensate perspective distortion and geometric distortion, (3) very high accuracy (in the micron-range) and (4) only one phase measurement needed for operation.

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    [CrossRef]
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    [CrossRef]
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2008 (2)

E. Zappa and G. Busca, “Comparison of eight unwrapping algorithms applied to Fourier-transform profilometry,” Opt. Lasers Eng. 46(2), 106–116 (2008).
[CrossRef]

W. H. Su, C. Y. Kuo, C. C. Wang, and C. F. Tu, “Projected fringe profilometry with multiple measurements to form an entire shape,” Opt. Express 16(6), 4069–4077 (2008).
[CrossRef] [PubMed]

2007 (1)

2005 (1)

2003 (2)

K. Kubala, E. Dowski, and W. T. Cathey, “Reducing complexity in computational imaging systems,” Opt. Express 11(18), 2102–2108 (2003).
[CrossRef] [PubMed]

H. Liu, W. H. Su, K. Reichard, and S. Yin, “Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement,” Opt. Commun. 216(1-3), 65–80 (2003).
[CrossRef]

2001 (2)

K. Körner, R. Windecker, M. Fleischer, and H. J. Tiziani, “One-grating projection for absolute three-dimensional profiling,” Opt. Eng. 40(8), 1653–1660 (2001).
[CrossRef]

R. Windecker, M. Fleischer, K. Körner, and H. J. Tiziani, “Testing micro devices with fringe projection and white-light interfeometry,” Opt. Lasers Eng. 36(2), 141–154 (2001).
[CrossRef]

1999 (1)

1997 (1)

1995 (1)

1990 (2)

J. Ojeda-Castaneda and L. R. Berriel-Valdos, “Zone plate for arbitrarily high focal depth,” Appl. Opt. 29(7), 994–997 (1990).
[CrossRef] [PubMed]

B. E. A. Saleh and K. Lu, “Theory and design of the liquid crystal TV as an optical spatial phase modulator,” Opt. Eng. 29(3), 240–245 (1990).
[CrossRef]

1983 (1)

1972 (1)

G. Ha¨usler, “A method to increase the depth of focus by two step image processing,” Opt. Commun. 6(1), 38–42 (1972).
[CrossRef]

1971 (1)

Berriel-Valdos, L. R.

Bradburn, S.

Busca, G.

E. Zappa and G. Busca, “Comparison of eight unwrapping algorithms applied to Fourier-transform profilometry,” Opt. Lasers Eng. 46(2), 106–116 (2008).
[CrossRef]

Cathey, W. T.

Cho, H.

Dowski, E.

Dowski, E. R.

Fleischer, M.

K. Körner, R. Windecker, M. Fleischer, and H. J. Tiziani, “One-grating projection for absolute three-dimensional profiling,” Opt. Eng. 40(8), 1653–1660 (2001).
[CrossRef]

R. Windecker, M. Fleischer, K. Körner, and H. J. Tiziani, “Testing micro devices with fringe projection and white-light interfeometry,” Opt. Lasers Eng. 36(2), 141–154 (2001).
[CrossRef]

Ha¨usler, G.

G. Ha¨usler, “A method to increase the depth of focus by two step image processing,” Opt. Commun. 6(1), 38–42 (1972).
[CrossRef]

Hong, D.

Kim, M.

Körner, K.

K. Körner, R. Windecker, M. Fleischer, and H. J. Tiziani, “One-grating projection for absolute three-dimensional profiling,” Opt. Eng. 40(8), 1653–1660 (2001).
[CrossRef]

R. Windecker, M. Fleischer, K. Körner, and H. J. Tiziani, “Testing micro devices with fringe projection and white-light interfeometry,” Opt. Lasers Eng. 36(2), 141–154 (2001).
[CrossRef]

Kubala, K.

Kuo, C. Y.

Liu, H.

H. Liu, W. H. Su, K. Reichard, and S. Yin, “Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement,” Opt. Commun. 216(1-3), 65–80 (2003).
[CrossRef]

Liu, Z.

Lu, K.

B. E. A. Saleh and K. Lu, “Theory and design of the liquid crystal TV as an optical spatial phase modulator,” Opt. Eng. 29(3), 240–245 (1990).
[CrossRef]

Mino, M.

Mutoh, K.

Ojeda-Castaneda, J.

Okano, Y.

Park, K.

Reichard, K.

W. H. Su, K. Shi, Z. Liu, B. Wang, K. Reichard, and S. Yin, “A large-depth-of-field projected fringe profilometry using supercontinuum light illumination,” Opt. Express 13(3), 1025–1032 (2005).
[CrossRef] [PubMed]

H. Liu, W. H. Su, K. Reichard, and S. Yin, “Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement,” Opt. Commun. 216(1-3), 65–80 (2003).
[CrossRef]

Saleh, B. E. A.

B. E. A. Saleh and K. Lu, “Theory and design of the liquid crystal TV as an optical spatial phase modulator,” Opt. Eng. 29(3), 240–245 (1990).
[CrossRef]

Shi, K.

Su, W. H.

Takeda, M.

Tiziani, H. J.

R. Windecker, M. Fleischer, K. Körner, and H. J. Tiziani, “Testing micro devices with fringe projection and white-light interfeometry,” Opt. Lasers Eng. 36(2), 141–154 (2001).
[CrossRef]

K. Körner, R. Windecker, M. Fleischer, and H. J. Tiziani, “One-grating projection for absolute three-dimensional profiling,” Opt. Eng. 40(8), 1653–1660 (2001).
[CrossRef]

Tu, C. F.

Tucker, S. C.

Wang, B.

Wang, C. C.

Windecker, R.

R. Windecker, M. Fleischer, K. Körner, and H. J. Tiziani, “Testing micro devices with fringe projection and white-light interfeometry,” Opt. Lasers Eng. 36(2), 141–154 (2001).
[CrossRef]

K. Körner, R. Windecker, M. Fleischer, and H. J. Tiziani, “One-grating projection for absolute three-dimensional profiling,” Opt. Eng. 40(8), 1653–1660 (2001).
[CrossRef]

Yin, S.

W. H. Su, K. Shi, Z. Liu, B. Wang, K. Reichard, and S. Yin, “A large-depth-of-field projected fringe profilometry using supercontinuum light illumination,” Opt. Express 13(3), 1025–1032 (2005).
[CrossRef] [PubMed]

H. Liu, W. H. Su, K. Reichard, and S. Yin, “Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement,” Opt. Commun. 216(1-3), 65–80 (2003).
[CrossRef]

Zappa, E.

E. Zappa and G. Busca, “Comparison of eight unwrapping algorithms applied to Fourier-transform profilometry,” Opt. Lasers Eng. 46(2), 106–116 (2008).
[CrossRef]

Appl. Opt. (6)

Opt. Commun. (2)

H. Liu, W. H. Su, K. Reichard, and S. Yin, “Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement,” Opt. Commun. 216(1-3), 65–80 (2003).
[CrossRef]

G. Ha¨usler, “A method to increase the depth of focus by two step image processing,” Opt. Commun. 6(1), 38–42 (1972).
[CrossRef]

Opt. Eng. (2)

K. Körner, R. Windecker, M. Fleischer, and H. J. Tiziani, “One-grating projection for absolute three-dimensional profiling,” Opt. Eng. 40(8), 1653–1660 (2001).
[CrossRef]

B. E. A. Saleh and K. Lu, “Theory and design of the liquid crystal TV as an optical spatial phase modulator,” Opt. Eng. 29(3), 240–245 (1990).
[CrossRef]

Opt. Express (4)

Opt. Lasers Eng. (2)

R. Windecker, M. Fleischer, K. Körner, and H. J. Tiziani, “Testing micro devices with fringe projection and white-light interfeometry,” Opt. Lasers Eng. 36(2), 141–154 (2001).
[CrossRef]

E. Zappa and G. Busca, “Comparison of eight unwrapping algorithms applied to Fourier-transform profilometry,” Opt. Lasers Eng. 46(2), 106–116 (2008).
[CrossRef]

Other (2)

L. B. Jackson, Digital Filters and Signal Processing (Toppan, 1996), Chap. 6.

J. W. Goodman, Introduction to Fourier Optics (Roberts & Company, Englewood, Colorado, USA, 2005), Chap. 5.

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