C. Xu and W. Denk, “Two photon optical beam induced current imaging through the backside of integrated circuits,” Appl. Phys. Lett. 71(18), 2578–2580 (1997).
[Crossref]
M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).
[Crossref]
W. Denk, J. H. Strickler, and W. W. Webb, “Two-photon laser scanning fluorescence microscopy,” Science 248(4951), 73–76 (1990).
[Crossref]
[PubMed]
R. Soref and B. Bennett, “Electrooptical effects in silicon,” IEEE J. Quantum Electron. 23(1), 123–129 (1987).
[Crossref]
T. Boggess, K. Bohnert, K. Mansour, S. Moss, I. Boyd, and A. Smirl, “Simultaneous measurement of the two-photon coefficient and free-carrier cross section above the bandgap of crystalline silicon,” IEEE J. Quantum Electron. 22(2), 360–368 (1986).
[Crossref]
R. Soref and B. Bennett, “Electrooptical effects in silicon,” IEEE J. Quantum Electron. 23(1), 123–129 (1987).
[Crossref]
T. Boggess, K. Bohnert, K. Mansour, S. Moss, I. Boyd, and A. Smirl, “Simultaneous measurement of the two-photon coefficient and free-carrier cross section above the bandgap of crystalline silicon,” IEEE J. Quantum Electron. 22(2), 360–368 (1986).
[Crossref]
T. Boggess, K. Bohnert, K. Mansour, S. Moss, I. Boyd, and A. Smirl, “Simultaneous measurement of the two-photon coefficient and free-carrier cross section above the bandgap of crystalline silicon,” IEEE J. Quantum Electron. 22(2), 360–368 (1986).
[Crossref]
T. Boggess, K. Bohnert, K. Mansour, S. Moss, I. Boyd, and A. Smirl, “Simultaneous measurement of the two-photon coefficient and free-carrier cross section above the bandgap of crystalline silicon,” IEEE J. Quantum Electron. 22(2), 360–368 (1986).
[Crossref]
C. Xu and W. Denk, “Two photon optical beam induced current imaging through the backside of integrated circuits,” Appl. Phys. Lett. 71(18), 2578–2580 (1997).
[Crossref]
W. Denk, J. H. Strickler, and W. W. Webb, “Two-photon laser scanning fluorescence microscopy,” Science 248(4951), 73–76 (1990).
[Crossref]
[PubMed]
M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).
[Crossref]
T. Boggess, K. Bohnert, K. Mansour, S. Moss, I. Boyd, and A. Smirl, “Simultaneous measurement of the two-photon coefficient and free-carrier cross section above the bandgap of crystalline silicon,” IEEE J. Quantum Electron. 22(2), 360–368 (1986).
[Crossref]
T. Boggess, K. Bohnert, K. Mansour, S. Moss, I. Boyd, and A. Smirl, “Simultaneous measurement of the two-photon coefficient and free-carrier cross section above the bandgap of crystalline silicon,” IEEE J. Quantum Electron. 22(2), 360–368 (1986).
[Crossref]
M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).
[Crossref]
M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).
[Crossref]
T. Boggess, K. Bohnert, K. Mansour, S. Moss, I. Boyd, and A. Smirl, “Simultaneous measurement of the two-photon coefficient and free-carrier cross section above the bandgap of crystalline silicon,” IEEE J. Quantum Electron. 22(2), 360–368 (1986).
[Crossref]
R. Soref and B. Bennett, “Electrooptical effects in silicon,” IEEE J. Quantum Electron. 23(1), 123–129 (1987).
[Crossref]
W. Denk, J. H. Strickler, and W. W. Webb, “Two-photon laser scanning fluorescence microscopy,” Science 248(4951), 73–76 (1990).
[Crossref]
[PubMed]
M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).
[Crossref]
W. Denk, J. H. Strickler, and W. W. Webb, “Two-photon laser scanning fluorescence microscopy,” Science 248(4951), 73–76 (1990).
[Crossref]
[PubMed]
M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).
[Crossref]
C. Xu and W. Denk, “Two photon optical beam induced current imaging through the backside of integrated circuits,” Appl. Phys. Lett. 71(18), 2578–2580 (1997).
[Crossref]
C. Xu and W. Denk, “Two photon optical beam induced current imaging through the backside of integrated circuits,” Appl. Phys. Lett. 71(18), 2578–2580 (1997).
[Crossref]
M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).
[Crossref]
T. Boggess, K. Bohnert, K. Mansour, S. Moss, I. Boyd, and A. Smirl, “Simultaneous measurement of the two-photon coefficient and free-carrier cross section above the bandgap of crystalline silicon,” IEEE J. Quantum Electron. 22(2), 360–368 (1986).
[Crossref]
R. Soref and B. Bennett, “Electrooptical effects in silicon,” IEEE J. Quantum Electron. 23(1), 123–129 (1987).
[Crossref]
W. Denk, J. H. Strickler, and W. W. Webb, “Two-photon laser scanning fluorescence microscopy,” Science 248(4951), 73–76 (1990).
[Crossref]
[PubMed]
R. W. Boyd, Nonlinear Optics (Academic Press, 2008).
W. T. Lotshaw, D. McMorrow, and J. S. Melinger, “Measurement of nonlinear absorption and refraction in doped Si below the band edge,” in Nonlinear Optics: Materials, Fundamentals and Applications (Optical Society of America, 2007), paper WE10.
E. Faraud, V. Pouget, K. Shao, C. Larue, F. Darracq, D. Lewis, A. Samaras, F. Bezerra, E. Lorfevre, and R. Ecoffet, “Investigation on the SEL sensitive depth of an SRAM using linear and two-photon absorption laser testing,” accepted for presentation at IEEE Nuclear and Space Radiation Effects Conference (NSREC), Las Vegas, July 25–29, 2011.
A. Douin, V. Pouget, D. Lewis, P. Fouillat, and P. Perdu, “Picosecond timing analysis in integrated circuits with pulsed laser stimulation,” in Proceedings of the 45th Annual IEEE International Reliability Physics Symposium (IEEE, 2007), pp. 520–525.
K. A. Serrels and D. T. Reid, “Two-photon X-Variation mapping based on a diode-pumped femtosecond laser,” in 36th International Symposium for Testing and Failure Analysis (2010), pp. 14–19.
D. McMorrow, W. Lotshaw, J. Melinger, and J. Pellish, “Single-event effects in microelectronics induced by through-wafer sub-bandgap two-photon absorption,” in Non Linear Optics Conference (2009).