Abstract

A detailed characterization of the coherent x-ray wavefront produced by a partially illuminated Fresnel zone plate is presented. We show, by numerical and experimental approaches, how the beam size and the focal depth are strongly influenced by the illumination conditions, while the phase of the focal spot remains constant. These results confirm that the partial illumination can be used for coherent diffraction experiments. Finally, we demonstrate the possibility of reconstructing the complex-valued illumination function by simple measurement of the far field intensity in the specific case of partial illumination.

© 2011 OSA

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. K. A. Nugent, “Coherent methods in the x-ray sciences,” Adv. Phys. 59, 1–99 (2010).
    [CrossRef]
  2. V. L. R. Jacques, S. Ravy, D. L. Bolloc’h, E. Pinsolle, M. Sauvage-Simkin, and F. Livet, “Bulk dislocation core dissociation probed by coherent x rays in silicon,” Phys. Rev. Lett. 106, 065502 (2011).
    [CrossRef] [PubMed]
  3. V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
    [CrossRef]
  4. J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of x-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
    [CrossRef]
  5. M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
    [CrossRef] [PubMed]
  6. S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
    [CrossRef] [PubMed]
  7. F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, “Phase retrieval and differential phase-contrast imaging with low-brilliance x-ray sources,” Nat. Phys. 2, 258–261 (2006).
    [CrossRef]
  8. V. Favre-Nicolin, J. Eymery, R. Koester, and P. Gentile, “Coherent-diffraction imaging of single nanowires of diameter 95 nanometers,” Phys. Rev. B 79, 195401 (2009).
  9. M. C. Newton, S. J. Leake, R. Harder, and I. K. Robinson, “Three-dimensional imaging of strain in a single ZnO nanorod,” Nat. Mater. 9, 120–124 (2010).
    [CrossRef]
  10. P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.
    [PubMed]
  11. V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
    [CrossRef] [PubMed]
  12. R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of the phase from image and diffraction plane pictures,” Optik 35, 237–246 (1972).
  13. J. R. Fienup, “Phase retrieval algorithms: a comparison,” Appl. Opt. 21, 2758–2769 (1982).
    [CrossRef] [PubMed]
  14. S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
    [CrossRef]
  15. S. Takagi, “A dynamical theory of diffraction for a distorted crystal,” J. Phys. Soc. Jpn. 26, 1239–1253 (1969).
    [CrossRef]
  16. A. Snigirev, V. Kohn, I. Snigireva, A. Souvorov, and B. Lengeler, “Focusing high-energy x-rays by compound refractive lenses,” Appl. Opt. 37, 653–662 (1998).
    [CrossRef]
  17. K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.
  18. D. M. Paganin, Coherent X-ray Optics, Oxford series on synchrotron radiation (Oxford University Press, 2006), Vol. 6.
    [CrossRef]
  19. W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
    [CrossRef] [PubMed]
  20. E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
    [CrossRef]
  21. C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
    [CrossRef] [PubMed]
  22. I. A. Vartanyants and I. K. Robinson, “Partial coherence effects on the imaging of small crystals using coherent x-ray diffraction,” J. Phys. Condens. Matter 13, 10593–10611 (2001).
    [CrossRef]
  23. A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
    [CrossRef]
  24. Http://www.esrf.eu/UserAndScience/Experiments/StructMaterials/ID01 .
  25. G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
    [CrossRef] [PubMed]
  26. K. A. Nugent, A. G. Peele, H. M. Quiney, and H. N. Chapman, “Diffraction with wavefront curvature: a path to unique phase recovery,” Acta Cryst. A 61, 373–381 (2005).
    [CrossRef]
  27. V. Chamard, A. Diaz, J. Stangl, and S. Labat, “Structural investigation of InAs nanowires with coherent x-rays,” J. Strain Anal. Eng. Des. 44, 533–542 (2009).
    [CrossRef]
  28. P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
    [CrossRef] [PubMed]
  29. C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
    [CrossRef] [PubMed]
  30. H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, “Diffractive imaging of highly focused x-ray fields,” Nat. Phys. 2, 101–104 (2006).
    [CrossRef]
  31. A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
    [CrossRef] [PubMed]
  32. S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
    [CrossRef] [PubMed]
  33. C. David, B. Nöhammer, E. Ziegler, and O. Hignette, “Tunable diffractive optical elements for hard x-rays,” Proc. SPIE 4499, 96–104 (2001).
    [CrossRef]
  34. C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, “Maxipix, a fast readout photon-counting x-ray area detector for synchrotron applications,” J. Instrum. 6, C01069 (2011).
    [CrossRef]
  35. J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
    [CrossRef] [PubMed]
  36. O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
    [CrossRef]
  37. D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
    [CrossRef] [PubMed]

2011 (4)

V. L. R. Jacques, S. Ravy, D. L. Bolloc’h, E. Pinsolle, M. Sauvage-Simkin, and F. Livet, “Bulk dislocation core dissociation probed by coherent x rays in silicon,” Phys. Rev. Lett. 106, 065502 (2011).
[CrossRef] [PubMed]

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, “Maxipix, a fast readout photon-counting x-ray area detector for synchrotron applications,” J. Instrum. 6, C01069 (2011).
[CrossRef]

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

2010 (6)

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

K. A. Nugent, “Coherent methods in the x-ray sciences,” Adv. Phys. 59, 1–99 (2010).
[CrossRef]

M. C. Newton, S. J. Leake, R. Harder, and I. K. Robinson, “Three-dimensional imaging of strain in a single ZnO nanorod,” Nat. Mater. 9, 120–124 (2010).
[CrossRef]

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

2009 (2)

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

V. Chamard, A. Diaz, J. Stangl, and S. Labat, “Structural investigation of InAs nanowires with coherent x-rays,” J. Strain Anal. Eng. Des. 44, 533–542 (2009).
[CrossRef]

2008 (3)

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[CrossRef] [PubMed]

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

2007 (1)

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
[CrossRef]

2006 (3)

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
[CrossRef] [PubMed]

H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, “Diffractive imaging of highly focused x-ray fields,” Nat. Phys. 2, 101–104 (2006).
[CrossRef]

F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, “Phase retrieval and differential phase-contrast imaging with low-brilliance x-ray sources,” Nat. Phys. 2, 258–261 (2006).
[CrossRef]

2005 (2)

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
[CrossRef] [PubMed]

K. A. Nugent, A. G. Peele, H. M. Quiney, and H. N. Chapman, “Diffraction with wavefront curvature: a path to unique phase recovery,” Acta Cryst. A 61, 373–381 (2005).
[CrossRef]

2004 (1)

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

2003 (1)

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

2002 (1)

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

2001 (2)

C. David, B. Nöhammer, E. Ziegler, and O. Hignette, “Tunable diffractive optical elements for hard x-rays,” Proc. SPIE 4499, 96–104 (2001).
[CrossRef]

I. A. Vartanyants and I. K. Robinson, “Partial coherence effects on the imaging of small crystals using coherent x-ray diffraction,” J. Phys. Condens. Matter 13, 10593–10611 (2001).
[CrossRef]

1999 (2)

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of x-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

1998 (1)

1982 (1)

1972 (1)

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of the phase from image and diffraction plane pictures,” Optik 35, 237–246 (1972).

1969 (1)

S. Takagi, “A dynamical theory of diffraction for a distorted crystal,” J. Phys. Soc. Jpn. 26, 1239–1253 (1969).
[CrossRef]

Alfonso, C.

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

Allain, M.

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.
[PubMed]

Anderson, E. H.

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
[CrossRef] [PubMed]

Attwood, D. T.

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
[CrossRef] [PubMed]

Barrett, R.

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

Bauer, G.

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

Bley, F.

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

Bolloc’h, D. L.

V. L. R. Jacques, S. Ravy, D. L. Bolloc’h, E. Pinsolle, M. Sauvage-Simkin, and F. Livet, “Bulk dislocation core dissociation probed by coherent x rays in silicon,” Phys. Rev. Lett. 106, 065502 (2011).
[CrossRef] [PubMed]

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

Boye, P.

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

Bunk, O.

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[CrossRef] [PubMed]

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
[CrossRef]

F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, “Phase retrieval and differential phase-contrast imaging with low-brilliance x-ray sources,” Nat. Phys. 2, 258–261 (2006).
[CrossRef]

Burghammer, M.

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

Cabrini, S.

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

Cai, Z.

H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, “Diffractive imaging of highly focused x-ray fields,” Nat. Phys. 2, 101–104 (2006).
[CrossRef]

Carbone, D.

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.
[PubMed]

Carbone, G.

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

Chamard, V.

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

V. Chamard, A. Diaz, J. Stangl, and S. Labat, “Structural investigation of InAs nanowires with coherent x-rays,” J. Strain Anal. Eng. Des. 44, 533–542 (2009).
[CrossRef]

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.
[PubMed]

Chao, W.

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
[CrossRef] [PubMed]

Chapman, H. N.

K. A. Nugent, A. G. Peele, H. M. Quiney, and H. N. Chapman, “Diffraction with wavefront curvature: a path to unique phase recovery,” Acta Cryst. A 61, 373–381 (2005).
[CrossRef]

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

Charalambous, P.

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of x-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

Chen, G.

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.
[PubMed]

Clément, J.

C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, “Maxipix, a fast readout photon-counting x-ray area detector for synchrotron applications,” J. Instrum. 6, C01069 (2011).
[CrossRef]

David, C.

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[CrossRef] [PubMed]

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
[CrossRef]

F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, “Phase retrieval and differential phase-contrast imaging with low-brilliance x-ray sources,” Nat. Phys. 2, 258–261 (2006).
[CrossRef]

C. David, B. Nöhammer, E. Ziegler, and O. Hignette, “Tunable diffractive optical elements for hard x-rays,” Proc. SPIE 4499, 96–104 (2001).
[CrossRef]

de Jonge, M. D.

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
[CrossRef] [PubMed]

Dhal, B. B.

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
[CrossRef] [PubMed]

Diaz, A.

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

V. Chamard, A. Diaz, J. Stangl, and S. Labat, “Structural investigation of InAs nanowires with coherent x-rays,” J. Strain Anal. Eng. Des. 44, 533–542 (2009).
[CrossRef]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
[CrossRef]

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.
[PubMed]

Dierolf, M.

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[CrossRef] [PubMed]

Eberhardt, W.

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

Eisebitt, S.

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

Endo, K.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Eymery, J.

V. Favre-Nicolin, J. Eymery, R. Koester, and P. Gentile, “Coherent-diffraction imaging of single nanowires of diameter 95 nanometers,” Phys. Rev. B 79, 195401 (2009).

Fabrizio, E. D.

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

Färm, E.

Favre-Nicolin, V.

V. Favre-Nicolin, J. Eymery, R. Koester, and P. Gentile, “Coherent-diffraction imaging of single nanowires of diameter 95 nanometers,” Phys. Rev. B 79, 195401 (2009).

Feldkamp, J. M.

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

Fienup, J. R.

Gentile, P.

V. Favre-Nicolin, J. Eymery, R. Koester, and P. Gentile, “Coherent-diffraction imaging of single nanowires of diameter 95 nanometers,” Phys. Rev. B 79, 195401 (2009).

Gentili, M.

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

Gerchberg, R. W.

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of the phase from image and diffraction plane pictures,” Optik 35, 237–246 (1972).

Godard, P.

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.
[PubMed]

Gorelick, S.

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

Guzenko, V. A.

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

Harder, R.

M. C. Newton, S. J. Leake, R. Harder, and I. K. Robinson, “Three-dimensional imaging of strain in a single ZnO nanorod,” Nat. Mater. 9, 120–124 (2010).
[CrossRef]

Harteneck, B. D.

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
[CrossRef] [PubMed]

Hau-Riege, S. P.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

He, H.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

Hellwig, O.

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

Hignette, O.

C. David, B. Nöhammer, E. Ziegler, and O. Hignette, “Tunable diffractive optical elements for hard x-rays,” Proc. SPIE 4499, 96–104 (2001).
[CrossRef]

Homs, A.

C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, “Maxipix, a fast readout photon-counting x-ray area detector for synchrotron applications,” J. Instrum. 6, C01069 (2011).
[CrossRef]

Howells, M. R.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

Ishikawa, T.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Jacques, V. L. R.

V. L. R. Jacques, S. Ravy, D. L. Bolloc’h, E. Pinsolle, M. Sauvage-Simkin, and F. Livet, “Bulk dislocation core dissociation probed by coherent x rays in silicon,” Phys. Rev. Lett. 106, 065502 (2011).
[CrossRef] [PubMed]

Jefimovs, K.

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

Kaulich, B.

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

Keplinger, M.

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

Kewish, C. M.

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

Kirz, J.

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of x-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

Koester, R.

V. Favre-Nicolin, J. Eymery, R. Koester, and P. Gentile, “Coherent-diffraction imaging of single nanowires of diameter 95 nanometers,” Phys. Rev. B 79, 195401 (2009).

Kohn, V.

Labat, S.

V. Chamard, A. Diaz, J. Stangl, and S. Labat, “Structural investigation of InAs nanowires with coherent x-rays,” J. Strain Anal. Eng. Des. 44, 533–542 (2009).
[CrossRef]

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

Leake, S. J.

M. C. Newton, S. J. Leake, R. Harder, and I. K. Robinson, “Three-dimensional imaging of strain in a single ZnO nanorod,” Nat. Mater. 9, 120–124 (2010).
[CrossRef]

Lechner, R. T.

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

Lengeler, B.

Liddle, J. A.

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
[CrossRef] [PubMed]

Livet, F.

V. L. R. Jacques, S. Ravy, D. L. Bolloc’h, E. Pinsolle, M. Sauvage-Simkin, and F. Livet, “Bulk dislocation core dissociation probed by coherent x rays in silicon,” Phys. Rev. Lett. 106, 065502 (2011).
[CrossRef] [PubMed]

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

Lorgen, M.

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

Lüning, J.

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

Mandl, B.

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

Marchesini, S.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

Mastropietro, F.

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.
[PubMed]

Matsuyama, S.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Menzel, A.

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[CrossRef] [PubMed]

Metzger, T. H.

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.
[PubMed]

Miao, J.

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of x-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

Mimura, H. M.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Mocuta, C.

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

Mori, Y.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Newton, M. C.

M. C. Newton, S. J. Leake, R. Harder, and I. K. Robinson, “Three-dimensional imaging of strain in a single ZnO nanorod,” Nat. Mater. 9, 120–124 (2010).
[CrossRef]

Nishino, Y.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Nöhammer, B.

C. David, B. Nöhammer, E. Ziegler, and O. Hignette, “Tunable diffractive optical elements for hard x-rays,” Proc. SPIE 4499, 96–104 (2001).
[CrossRef]

Noy, A.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

Nugent, K. A.

K. A. Nugent, “Coherent methods in the x-ray sciences,” Adv. Phys. 59, 1–99 (2010).
[CrossRef]

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
[CrossRef] [PubMed]

H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, “Diffractive imaging of highly focused x-ray fields,” Nat. Phys. 2, 101–104 (2006).
[CrossRef]

K. A. Nugent, A. G. Peele, H. M. Quiney, and H. N. Chapman, “Diffraction with wavefront curvature: a path to unique phase recovery,” Acta Cryst. A 61, 373–381 (2005).
[CrossRef]

Paganin, D. M.

D. M. Paganin, Coherent X-ray Optics, Oxford series on synchrotron radiation (Oxford University Press, 2006), Vol. 6.
[CrossRef]

Papillon, E.

C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, “Maxipix, a fast readout photon-counting x-ray area detector for synchrotron applications,” J. Instrum. 6, C01069 (2011).
[CrossRef]

Paterson, D.

H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, “Diffractive imaging of highly focused x-ray fields,” Nat. Phys. 2, 101–104 (2006).
[CrossRef]

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
[CrossRef] [PubMed]

Patommel, J.

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

Peele, A. G.

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
[CrossRef] [PubMed]

H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, “Diffractive imaging of highly focused x-ray fields,” Nat. Phys. 2, 101–104 (2006).
[CrossRef]

K. A. Nugent, A. G. Peele, H. M. Quiney, and H. N. Chapman, “Diffraction with wavefront curvature: a path to unique phase recovery,” Acta Cryst. A 61, 373–381 (2005).
[CrossRef]

Petitdemange, S.

C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, “Maxipix, a fast readout photon-counting x-ray area detector for synchrotron applications,” J. Instrum. 6, C01069 (2011).
[CrossRef]

Pfeiffer, F.

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[CrossRef] [PubMed]

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
[CrossRef]

F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, “Phase retrieval and differential phase-contrast imaging with low-brilliance x-ray sources,” Nat. Phys. 2, 258–261 (2006).
[CrossRef]

Pinsolle, E.

V. L. R. Jacques, S. Ravy, D. L. Bolloc’h, E. Pinsolle, M. Sauvage-Simkin, and F. Livet, “Bulk dislocation core dissociation probed by coherent x rays in silicon,” Phys. Rev. Lett. 106, 065502 (2011).
[CrossRef] [PubMed]

Ponchut, C.

C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, “Maxipix, a fast readout photon-counting x-ray area detector for synchrotron applications,” J. Instrum. 6, C01069 (2011).
[CrossRef]

Quiney, H. M.

H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, “Diffractive imaging of highly focused x-ray fields,” Nat. Phys. 2, 101–104 (2006).
[CrossRef]

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
[CrossRef] [PubMed]

K. A. Nugent, A. G. Peele, H. M. Quiney, and H. N. Chapman, “Diffraction with wavefront curvature: a path to unique phase recovery,” Acta Cryst. A 61, 373–381 (2005).
[CrossRef]

Ravy, S.

V. L. R. Jacques, S. Ravy, D. L. Bolloc’h, E. Pinsolle, M. Sauvage-Simkin, and F. Livet, “Bulk dislocation core dissociation probed by coherent x rays in silicon,” Phys. Rev. Lett. 106, 065502 (2011).
[CrossRef] [PubMed]

Riekel, C.

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

Rigal, J. M.

C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, “Maxipix, a fast readout photon-counting x-ray area detector for synchrotron applications,” J. Instrum. 6, C01069 (2011).
[CrossRef]

Ritala, M.

Robinson, I. K.

M. C. Newton, S. J. Leake, R. Harder, and I. K. Robinson, “Three-dimensional imaging of strain in a single ZnO nanorod,” Nat. Mater. 9, 120–124 (2010).
[CrossRef]

I. A. Vartanyants and I. K. Robinson, “Partial coherence effects on the imaging of small crystals using coherent x-ray diffraction,” J. Phys. Condens. Matter 13, 10593–10611 (2001).
[CrossRef]

Romanato, F.

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

Salomé, M.

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

Sano, Y.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Satapathy, D. K.

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
[CrossRef]

Sauvage-Simkin, M.

V. L. R. Jacques, S. Ravy, D. L. Bolloc’h, E. Pinsolle, M. Sauvage-Simkin, and F. Livet, “Bulk dislocation core dissociation probed by coherent x rays in silicon,” Phys. Rev. Lett. 106, 065502 (2011).
[CrossRef] [PubMed]

Saxton, W. O.

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of the phase from image and diffraction plane pictures,” Optik 35, 237–246 (1972).

Sayre, D.

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of x-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

Schlotter, W. F.

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

Schmitt, B.

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
[CrossRef]

Schneider, P.

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

Schöder, S.

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

Schroer, C. G.

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

Schropp, A.

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

Schülli, T.

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

Schwab, A.

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

Snigirev, A.

Snigireva, I.

Souvorov, A.

Spence, J. C. H.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

Stangl, J.

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

V. Chamard, A. Diaz, J. Stangl, and S. Labat, “Structural investigation of InAs nanowires with coherent x-rays,” J. Strain Anal. Eng. Des. 44, 533–542 (2009).
[CrossRef]

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.
[PubMed]

Stephan, S.

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

Stohr, J.

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

Susini, J.

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

Takagi, S.

S. Takagi, “A dynamical theory of diffraction for a distorted crystal,” J. Phys. Soc. Jpn. 26, 1239–1253 (1969).
[CrossRef]

Tamasaku, K.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Thibault, P.

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[CrossRef] [PubMed]

Tran, C. Q.

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
[CrossRef] [PubMed]

van der Veen, J. F.

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
[CrossRef]

Vartanyants, I. A.

I. A. Vartanyants and I. K. Robinson, “Partial coherence effects on the imaging of small crystals using coherent x-ray diffraction,” J. Phys. Condens. Matter 13, 10593–10611 (2001).
[CrossRef]

Veron, M.

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

Vila-Comamala, J.

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

Weierstall, U.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

Weitkamp, T.

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, “Phase retrieval and differential phase-contrast imaging with low-brilliance x-ray sources,” Nat. Phys. 2, 258–261 (2006).
[CrossRef]

Wepf, R.

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

Williams, G. J.

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
[CrossRef] [PubMed]

Yabashi, M.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Yamamura, K.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Yamauchi, K.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Yumoto, H.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Ziegler, E.

C. David, B. Nöhammer, E. Ziegler, and O. Hignette, “Tunable diffractive optical elements for hard x-rays,” Proc. SPIE 4499, 96–104 (2001).
[CrossRef]

Acta Cryst. A (2)

K. A. Nugent, A. G. Peele, H. M. Quiney, and H. N. Chapman, “Diffraction with wavefront curvature: a path to unique phase recovery,” Acta Cryst. A 61, 373–381 (2005).
[CrossRef]

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
[CrossRef]

Adv. Phys. (1)

K. A. Nugent, “Coherent methods in the x-ray sciences,” Adv. Phys. 59, 1–99 (2010).
[CrossRef]

Appl. Opt. (2)

J. Appl. Cryst. (1)

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

J. Instrum. (1)

C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, “Maxipix, a fast readout photon-counting x-ray area detector for synchrotron applications,” J. Instrum. 6, C01069 (2011).
[CrossRef]

J. Phys. Condens. Matter (1)

I. A. Vartanyants and I. K. Robinson, “Partial coherence effects on the imaging of small crystals using coherent x-ray diffraction,” J. Phys. Condens. Matter 13, 10593–10611 (2001).
[CrossRef]

J. Phys. Soc. Jpn. (1)

S. Takagi, “A dynamical theory of diffraction for a distorted crystal,” J. Phys. Soc. Jpn. 26, 1239–1253 (1969).
[CrossRef]

J. Strain Anal. Eng. Des. (1)

V. Chamard, A. Diaz, J. Stangl, and S. Labat, “Structural investigation of InAs nanowires with coherent x-rays,” J. Strain Anal. Eng. Des. 44, 533–542 (2009).
[CrossRef]

J. Synchrotron Radiat. (3)

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

Nat. Mater. (1)

M. C. Newton, S. J. Leake, R. Harder, and I. K. Robinson, “Three-dimensional imaging of strain in a single ZnO nanorod,” Nat. Mater. 9, 120–124 (2010).
[CrossRef]

Nat. Phys. (2)

F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, “Phase retrieval and differential phase-contrast imaging with low-brilliance x-ray sources,” Nat. Phys. 2, 258–261 (2006).
[CrossRef]

H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, “Diffractive imaging of highly focused x-ray fields,” Nat. Phys. 2, 101–104 (2006).
[CrossRef]

Nature (5)

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of x-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
[CrossRef] [PubMed]

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

Opt. Express (1)

Optik (1)

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of the phase from image and diffraction plane pictures,” Optik 35, 237–246 (1972).

Phys. Rev. B (3)

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

V. Favre-Nicolin, J. Eymery, R. Koester, and P. Gentile, “Coherent-diffraction imaging of single nanowires of diameter 95 nanometers,” Phys. Rev. B 79, 195401 (2009).

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

Phys. Rev. Lett. (4)

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
[CrossRef] [PubMed]

V. L. R. Jacques, S. Ravy, D. L. Bolloc’h, E. Pinsolle, M. Sauvage-Simkin, and F. Livet, “Bulk dislocation core dissociation probed by coherent x rays in silicon,” Phys. Rev. Lett. 106, 065502 (2011).
[CrossRef] [PubMed]

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

Proc. SPIE (1)

C. David, B. Nöhammer, E. Ziegler, and O. Hignette, “Tunable diffractive optical elements for hard x-rays,” Proc. SPIE 4499, 96–104 (2001).
[CrossRef]

Science (1)

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[CrossRef] [PubMed]

Ultramicroscopy (1)

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

Other (4)

Http://www.esrf.eu/UserAndScience/Experiments/StructMaterials/ID01 .

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.
[PubMed]

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

D. M. Paganin, Coherent X-ray Optics, Oxford series on synchrotron radiation (Oxford University Press, 2006), Vol. 6.
[CrossRef]

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (6)

Fig. 1
Fig. 1

(a) Sketch of a partially illuminated Fresnel Zone Plate. A pair of slits defines a rectangular aperture matching the transverse coherence lengths of the x-ray beam. (b) 2D schematic of the propagation of the wavefield produced by a partially illuminated FZP. The slits, placed 1.15 m upstream the lens, used to define the illuminated area, the FZP, the CS and the OSA are represented. The effective direction of propagation is tilted with respect to the FZP axis due to the lateral displacement of the slits.

Fig. 2
Fig. 2

Simulated complex field at the focal plane of a Fresnel Zone Plate for different conditions of partial illumination. Color rendition of the complex-valued probe for (a) 120 v × 40 h , (b) 60 v × 20 h and (c) 40 v × 20 h μm2 slits aperture. The phase is represented by colors and the amplitude (in logarithmic scale) by colors intensities.

Fig. 3
Fig. 3

Section of the simulated complex field in the direction of propagation for different conditions of partial illumination. Amplitude (expressed in logarithmic scale) for an opening of (a) 120 v × 40 h , (b) 60 v × 20 h and (c) 40 v × 20 h μm2.

Fig. 4
Fig. 4

(a) Measured intensities in logarithmic scale of the illumination probe at the detector. It is compared to (b) simulated intensities with the slits distant 1.15 m from the lens plane and (c) close (neglecting the propagation from the slits) to the FZP. The best agreement is obtained with a slit opening of 72 v × 28 h μ m 2. The non-zero intensity pixels in the center of the detector are due to direct beam photons transmitted by the central stop.

Fig. 5
Fig. 5

(a) Color rendition of the reconstructed complex-valued field at the focal plane compared to (b) the calculated propagation of Fig. 4b back to the focal plane. The phase is represented by colors and the amplitude (in logarithmic scale) by colors intensities.

Fig. 6
Fig. 6

Section of the reconstructed wavefield in the direction of propagation. The amplitude is expressed in logarithmic scale.

Tables (1)

Tables Icon

Table 1 Values of Beam Size and Focal Depth Calculated for Different Illumination Conditions *

Equations (3)

Equations on this page are rendered with MathJax. Learn more.

Ψ ( x , y , z FZP ) exp ( i ϕ FZP f FZP ( r n ) ) × M 1 ( x , y )
Ψ ( x , y , z ) = FT 1 ( P z ( q , z ) FT ( Ψ ( x , y , z FZP ) ) ) ,
Ψ ( x f , y f , z f ) = i λ z if exp ( 2 π i z if λ ) exp ( π i ρ i 2 λ z if ) × Ψ ( x i , y i , z i ) exp ( π i ρ i 2 λ z ij ) exp ( 2 π i ρ i ρ f λ z if ) d x i d y i ,

Metrics