Abstract

A technique to produce phase steps in a fringe projection system for shape measurement is presented. Phase steps are produced by introducing relative rotation between the object and the fringe projection probe (comprising a projector and camera) about the camera’s perspective center. Relative motion of the object in the camera image can be compensated, because it is independent of the distance of the object from the camera, whilst the phase of the projected fringes is stepped due to the motion of the projector with respect to the object. The technique was validated with a static fringe projection system by moving an object on a coordinate measuring machine (CMM). The alternative approach, of rotating a lightweight and robust CMM-mounted fringe projection probe, is discussed. An experimental accuracy of approximately 1.5% of the projected fringe pitch was achieved, limited by the standard phase-stepping algorithms used rather than by the accuracy of the phase steps produced by the new technique.

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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef] [PubMed]
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2007 (1)

2003 (2)

J. Novak, “Five-step phase-shifting algorithms with unknown values of phase shift,” Optik (Stuttg.) 114(2), 63–68 (2003).
[CrossRef]

M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng. 42(10), 2923–2929 (2003).
[CrossRef]

2002 (1)

1999 (2)

1997 (1)

1986 (1)

K. Creath, “Comparison of phase-measurement algorithms,” Proc. SPIE 680, 19–28 (1986).

1974 (1)

1967 (1)

1966 (1)

P. Carré, “Installation et utilisation du comparateur photoelectrique et interferential du Bureau International des Poids et Mesures,” Metrologia 2(1), 13–23 (1966).
[CrossRef]

Barton, J. S.

Brangaccio, D. J.

Bruning, J. H.

Carocci, M.

Carré, P.

P. Carré, “Installation et utilisation du comparateur photoelectrique et interferential du Bureau International des Poids et Mesures,” Metrologia 2(1), 13–23 (1966).
[CrossRef]

Corini, S.

Creath, K.

K. Creath, “Comparison of phase-measurement algorithms,” Proc. SPIE 680, 19–28 (1986).

Docchio, F.

Gallagher, J. E.

Hand, D. P.

M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng. 42(10), 2923–2929 (2003).
[CrossRef]

Herriott, D. R.

Jones, J. D. C.

M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng. 42(10), 2923–2929 (2003).
[CrossRef]

A. J. Moore, R. McBride, J. S. Barton, and J. D. C. Jones, “Closed-loop phase stepping in a calibrated fiber-optic fringe projector for shape measurement,” Appl. Opt. 41(16), 3348–3354 (2002).
[CrossRef] [PubMed]

Lazzari, S.

Lu, G.

Lui, H.

McBride, R.

Moore, A. J.

M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng. 42(10), 2923–2929 (2003).
[CrossRef]

A. J. Moore, R. McBride, J. S. Barton, and J. D. C. Jones, “Closed-loop phase stepping in a calibrated fiber-optic fringe projector for shape measurement,” Appl. Opt. 41(16), 3348–3354 (2002).
[CrossRef] [PubMed]

Novak, J.

J. Novak, “Five-step phase-shifting algorithms with unknown values of phase shift,” Optik (Stuttg.) 114(2), 63–68 (2003).
[CrossRef]

Reeves, M.

M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng. 42(10), 2923–2929 (2003).
[CrossRef]

Rodella, R.

Rosenfeld, D. P.

Sansoni, G.

Sparrow, E. M.

Torrance, K. E.

White, A. D.

Wu, S.

Yau, S.-T.

Yin, S.

Yu, F.T. S.U.

Zhang, S.

Appl. Opt. (5)

J. Opt. Soc. Am. (1)

J. Opt. Soc. Am. A (1)

Metrologia (1)

P. Carré, “Installation et utilisation du comparateur photoelectrique et interferential du Bureau International des Poids et Mesures,” Metrologia 2(1), 13–23 (1966).
[CrossRef]

Opt. Eng. (1)

M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng. 42(10), 2923–2929 (2003).
[CrossRef]

Optik (Stuttg.) (1)

J. Novak, “Five-step phase-shifting algorithms with unknown values of phase shift,” Optik (Stuttg.) 114(2), 63–68 (2003).
[CrossRef]

Proc. SPIE (1)

K. Creath, “Comparison of phase-measurement algorithms,” Proc. SPIE 680, 19–28 (1986).

Other (9)

N. J. Weston, Y. R. Huddart, A. J. Moore, and T. C. Featherstone, “Phase analysis measurement apparatus and method”, International patent pending WO2009 / 024757(A1) (2008).

H. Ragheb and E. R. Hancock, “Surface radiance: empirical data against model predictions,” in Proceedings of the 2004 International Conference on Image Processing (ICIP), (Institute of Electrical and Electronics Engineers, 2005), pp. 2689–2692.

K. Creath, “Temporal phase measurement methods,” in Interferogram Analysis, D.W. Robinson and G.T. Reid, eds., 94–140 (Institute of Physics 1993).

3M, “3M MPro 110 Micro projector,” http://www.3mselect.co.uk/p-1783-3m-mpro-110-micro-projector-uk-model.aspx (accessed 5 February 2010).

D. M. Kranz, E. P. Rudd, D. Fishbaine, and C. E. Haugan, “Phase profilometry system with telecentric projector,” International Patent, Publication Number WO01/51887 (2001).

M. A. R. Cooper with S. Robson, “Theory of close-range photogrammetry,” in Close range photogrammetry and machine vision, K. B. Atkinson, ed., (Whittles Publishing, Caithness, UK, 2001).

J. G. Fryer, “Camera Calibration,” in Close range photogrammetry and machine vision, K. B. Atkinson, ed., (Whittles Publishing, Caithness, UK, 2001).

J. Heikkila and O. Silven, “A four-step camera calibration procedure with implicit image correction,” in Proceedings of the 1997 Conference in Computer Vision and Pattern Recognition (CVPR ’97) (IEEE Computer Society, Washington, DC, 1997), pp. 1106–1112.

J.-Y. Bouguet, “Camera calibration toolbox for Matlab”, http://www.vision.caltech.edu/bouguetj/calib_doc/index.html (accessed 5 February 2010).

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