Abstract

An experiment for high efficiency laser-induced damage probability measurement has been implemented using a periodic binary phase grating. With such a grating, a laser beam is transformed into an ensemble array of Gaussian-like spots, which is known as the Fresnel image of the grating. A scientific CCD camera is used to image the laser spot array as well as the damage of the coating sample. The image data is then processed to obtain the peak fluence distribution of the laser spot array based on the calibrated CCD grayscale. By comparing the image of the damaged coating sample with that of the laser spot array, the damage probability of the coating sample can be precisely determined by the use of single-shot of laser pulse.

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References

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C. J. Stolz, “Status of NIF mirror technologies for completion of the NIF facility,” Proc. SPIE 7101, 710115 (2008).
[CrossRef]

2007 (1)

2005 (1)

2000 (1)

1999 (2)

L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, “Automated damage test facilities for materials development and production optics quality assurance at Lawrence Livermore laboratory,” Proc. SPIE 3578, 302–313 (1999).
[CrossRef]

J. W. Arenberg and W. Riede, “National Round-Robin Test on laser induced damage at 1.064μm: revised data reduction and correlation analysis,” Proc. SPIE 3578, 645–656 (1999).
[CrossRef]

1998 (1)

F. Loewenthal, R. Tommasini, and J. E. Balmer, “Single-shot measurement of laser-induced damage thresholds of thin film coatings,” Opt. Commun. 152(1-3), 168–174 (1998).
[CrossRef]

1996 (1)

1994 (1)

1983 (1)

1978 (1)

Arenberg, J. W.

J. W. Arenberg and W. Riede, “National Round-Robin Test on laser induced damage at 1.064μm: revised data reduction and correlation analysis,” Proc. SPIE 3578, 645–656 (1999).
[CrossRef]

Arrizón, V.

Auerbach, J. M.

Balmer, J. E.

C. Siegel, F. Loewenthal, J. E. Balmer, and H. P. Weber, “Talbot array illuminator for single-shot measurements of laser-induced-damage thresholds of thin-film coatings,” Appl. Opt. 39(10), 1493–1499 (2000).
[CrossRef]

F. Loewenthal, R. Tommasini, and J. E. Balmer, “Single-shot measurement of laser-induced damage thresholds of thin film coatings,” Opt. Commun. 152(1-3), 168–174 (1998).
[CrossRef]

Battersby, C.

L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, “Automated damage test facilities for materials development and production optics quality assurance at Lawrence Livermore laboratory,” Proc. SPIE 3578, 302–313 (1999).
[CrossRef]

Bowers, M. W.

Chow, R.

Degroot, A. J.

Dickson, R.

L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, “Automated damage test facilities for materials development and production optics quality assurance at Lawrence Livermore laboratory,” Proc. SPIE 3578, 302–313 (1999).
[CrossRef]

Dixit, S. N.

Erbert, G. V.

Haynam, C. A.

Heestand, G. M.

Henesian, M. A.

Herman, R. M.

Hermann, M. R.

Jancaitis, K. S.

Jennings, R.

L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, “Automated damage test facilities for materials development and production optics quality assurance at Lawrence Livermore laboratory,” Proc. SPIE 3578, 302–313 (1999).
[CrossRef]

Kimmons, J.

L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, “Automated damage test facilities for materials development and production optics quality assurance at Lawrence Livermore laboratory,” Proc. SPIE 3578, 302–313 (1999).
[CrossRef]

Kozlowski, M.

L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, “Automated damage test facilities for materials development and production optics quality assurance at Lawrence Livermore laboratory,” Proc. SPIE 3578, 302–313 (1999).
[CrossRef]

Loewenthal, F.

C. Siegel, F. Loewenthal, J. E. Balmer, and H. P. Weber, “Talbot array illuminator for single-shot measurements of laser-induced-damage thresholds of thin-film coatings,” Appl. Opt. 39(10), 1493–1499 (2000).
[CrossRef]

F. Loewenthal, R. Tommasini, and J. E. Balmer, “Single-shot measurement of laser-induced damage thresholds of thin film coatings,” Opt. Commun. 152(1-3), 168–174 (1998).
[CrossRef]

López-Olazagasti, E.

Manes, K. R.

Maricle, S.

L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, “Automated damage test facilities for materials development and production optics quality assurance at Lawrence Livermore laboratory,” Proc. SPIE 3578, 302–313 (1999).
[CrossRef]

Marshall, C. D.

Mehta, N. C.

Menapace, J.

Moses, E.

Mouser, R.

L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, “Automated damage test facilities for materials development and production optics quality assurance at Lawrence Livermore laboratory,” Proc. SPIE 3578, 302–313 (1999).
[CrossRef]

Murray, J. R.

Nostrand, M. C.

Ojeda-Castañeda, J.

Orth, C. D.

Patterson, R.

Riede, W.

J. W. Arenberg and W. Riede, “National Round-Robin Test on laser induced damage at 1.064μm: revised data reduction and correlation analysis,” Proc. SPIE 3578, 645–656 (1999).
[CrossRef]

Runkel, M.

R. Chow, M. Runkel, and J. R. Taylor, “Laser damage testing of small optics for the national ignition facility,” Appl. Opt. 44(17), 3527–3531 (2005).
[CrossRef] [PubMed]

L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, “Automated damage test facilities for materials development and production optics quality assurance at Lawrence Livermore laboratory,” Proc. SPIE 3578, 302–313 (1999).
[CrossRef]

Sacks, R. A.

Saito, T. T.

Schwartz, S.

L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, “Automated damage test facilities for materials development and production optics quality assurance at Lawrence Livermore laboratory,” Proc. SPIE 3578, 302–313 (1999).
[CrossRef]

Serrano-Heredia, A.

Shaw, M. J.

Sheehan, L.

L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, “Automated damage test facilities for materials development and production optics quality assurance at Lawrence Livermore laboratory,” Proc. SPIE 3578, 302–313 (1999).
[CrossRef]

Siegel, C.

Smith, W. L.

Spaeth, M.

Stolz, C. J.

C. J. Stolz, “Status of NIF mirror technologies for completion of the NIF facility,” Proc. SPIE 7101, 710115 (2008).
[CrossRef]

Sutton, S. B.

Taylor, J. R.

Tommasini, R.

F. Loewenthal, R. Tommasini, and J. E. Balmer, “Single-shot measurement of laser-induced damage thresholds of thin film coatings,” Opt. Commun. 152(1-3), 168–174 (1998).
[CrossRef]

Van Wonterghem, B. M.

Weber, H. P.

Weber, M. J.

Wegner, P. J.

Weinzapfel, C.

L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, “Automated damage test facilities for materials development and production optics quality assurance at Lawrence Livermore laboratory,” Proc. SPIE 3578, 302–313 (1999).
[CrossRef]

White, R. K.

Widmayer, C. C.

Wiggins, T. A.

Williams, W. H.

Yang, S. T.

Appl. Opt. (6)

Opt. Commun. (1)

F. Loewenthal, R. Tommasini, and J. E. Balmer, “Single-shot measurement of laser-induced damage thresholds of thin film coatings,” Opt. Commun. 152(1-3), 168–174 (1998).
[CrossRef]

Opt. Lett. (1)

Proc. SPIE (3)

J. W. Arenberg and W. Riede, “National Round-Robin Test on laser induced damage at 1.064μm: revised data reduction and correlation analysis,” Proc. SPIE 3578, 645–656 (1999).
[CrossRef]

C. J. Stolz, “Status of NIF mirror technologies for completion of the NIF facility,” Proc. SPIE 7101, 710115 (2008).
[CrossRef]

L. Sheehan, S. Schwartz, C. Battersby, R. Dickson, R. Jennings, J. Kimmons, M. Kozlowski, S. Maricle, R. Mouser, M. Runkel, and C. Weinzapfel, “Automated damage test facilities for materials development and production optics quality assurance at Lawrence Livermore laboratory,” Proc. SPIE 3578, 302–313 (1999).
[CrossRef]

Other (1)

Draft International Standard ISO/DIS 11254: Optics and Optical Instruments-Laser and Laser related equipment: Test methods for laser induced damage threshold of optical surface.

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Figures (7)

Fig. 1
Fig. 1

Experimental setup of the laser damage test.

Fig. 2
Fig. 2

Structure of the binary phase grating, where ω = 500μm, d = 2ω.

Fig. 3
Fig. 3

Image patterns of a laser beam transmitted through the binary phase grating at different distance L from the lens. The patterns at (a) L = 35cm, (b) L = 40cm, (c) L = 65cm are imaged by CCD, and at (d) L = 35cm, (e) L = 40cm, (f) L = 65cm are simulated by use of ASAP.

Fig. 4
Fig. 4

Curve of the peak fluency vs. CCD characteristics grayscale.

Fig. 5
Fig. 5

Peak fluence distribution of a laser spot array.

Fig. 6
Fig. 6

The damage induced by laser shot arrays.

Fig. 7
Fig. 7

Laser damage probabilities of 1-ON-1 and single-shot methods.

Tables (1)

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Table 1 Comparison Between the Measured and Calculated Peak Fluence

Equations (2)

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D p e a k = c × G p e a k + d
D p e a k = 0.0421 × G p e a k - 0.0907

Metrics