M. A. Karim and A. A. S. Awwal, Optical computing: An introduction (Wiley, New York, 1992).
R. M. A. Azzam, “Simultaneous reflection and refraction of light without change of polarization by a single-layer-coated dielectric surface,” Opt. Lett. 10, 107–109 (1985).
[Crossref]
[PubMed]
A. R. M. Zaghloul, R. M. A. Azzam, and N. M. Bashara, “An angle-of-incidence tunable, SiO2-Si (film-substrate) reflection retarder for the UV mercury line λ=2537 Å,” Opt. Commun. 14, 260–262 (1975).
[Crossref]
A. R. M. Zaghloul, R. M. A. Azzam, and N. M. Bashara, “Design of film-substrate single-reflection retarders,” J. Opt. Soc. Am. 65, 1043–1049 (1975).
[Crossref]
R. M. A. Azzam, A. R. M. Zaghloul, and N. M. Bashara, “Ellipsometric function of a film-substrate system: Applications to the design of reflection-type optical devices and to ellipsometry,” J. Opt. Soc. Am.65, 252–260 (1975). Also in A. R. M. Zaghloul, “Ellipsometric function of a film-substrate system: Applications to the design of reflection-type optical devices and to ellipsometry,” Ph. D. dissertation, University of Nebraska-Lincoln, 1975.
[Crossref]
A. R. M. Zaghloul, R. M. A. Azzam, and N. M. Bashara, “An angle-of-incidence tunable, SiO2-Si (film-substrate) reflection retarder for the UV mercury line λ=2537 Å,” Opt. Commun. 14, 260–262 (1975).
[Crossref]
A. R. M. Zaghloul, R. M. A. Azzam, and N. M. Bashara, “Design of film-substrate single-reflection retarders,” J. Opt. Soc. Am. 65, 1043–1049 (1975).
[Crossref]
R. M. A. Azzam, A. R. M. Zaghloul, and N. M. Bashara, “Ellipsometric function of a film-substrate system: Applications to the design of reflection-type optical devices and to ellipsometry,” J. Opt. Soc. Am.65, 252–260 (1975). Also in A. R. M. Zaghloul, “Ellipsometric function of a film-substrate system: Applications to the design of reflection-type optical devices and to ellipsometry,” Ph. D. dissertation, University of Nebraska-Lincoln, 1975.
[Crossref]
A. R. M. Zaghloul, D. A. Keeling, W. A. Berzett, and J. S. Mason, “Design of reflection retarders by use of nonnegative film-substrate systems,” J. Opt. Soc. Am. A 22, 1637–1645 (2005).
[Crossref]
A. R. M. Zaghloul, M. Elshazly-Zaghloul, W. A. Berzett, and D. A. Keeling, “Thin film coatings: A transmission ellipsometric function (TEF) approach I. Non-negative transmission systems, polarization devices, coatings, and closed-form design formulae,” Appl. Opt., In Press.
[PubMed]
D. P. Vasudevan, P. K. Lala, J. Di, and J. P. Parkerson, “Reversible-logic design with online testability,” IEEE Trans. Instrum. Meas. 55, 406–414 (2006).
[Crossref]
A. R. M. Zaghloul and M. Elshazly-Zaghloul, “Transmission polarization devices using an unsupported film/pellicle: Closed-form design formulae,” SPIE Proceedings of the 2006 Defense and Security Symposium, Orlando, Florida, 17–21 April, 2006.
A. R. M. Zaghloul, M. Elshazly-Zaghloul, W. A. Berzett, and D. A. Keeling, “Thin film coatings: A transmission ellipsometric function (TEF) approach I. Non-negative transmission systems, polarization devices, coatings, and closed-form design formulae,” Appl. Opt., In Press.
[PubMed]
E. Fredkin and T. Toffoli, “Conservative logic,” Int. J. Theor. Phys. 21, 219–22 (1982).
[Crossref]
M. A. Karim and A. A. S. Awwal, Optical computing: An introduction (Wiley, New York, 1992).
A. R. M. Zaghloul, D. A. Keeling, W. A. Berzett, and J. S. Mason, “Design of reflection retarders by use of nonnegative film-substrate systems,” J. Opt. Soc. Am. A 22, 1637–1645 (2005).
[Crossref]
A. R. M. Zaghloul, M. Elshazly-Zaghloul, W. A. Berzett, and D. A. Keeling, “Thin film coatings: A transmission ellipsometric function (TEF) approach I. Non-negative transmission systems, polarization devices, coatings, and closed-form design formulae,” Appl. Opt., In Press.
[PubMed]
M. M. Mano and C. R. Kime, Logic and computer design fundamentals, 2nd ed. (Prentice Hall, New Jersey, 2001).
D. S. Kliger, J. W. Lewis, and C. E. Randall, Polarized light in optics and spectroscopy (Academic, Boston, 1990).
D. P. Vasudevan, P. K. Lala, J. Di, and J. P. Parkerson, “Reversible-logic design with online testability,” IEEE Trans. Instrum. Meas. 55, 406–414 (2006).
[Crossref]
D. S. Kliger, J. W. Lewis, and C. E. Randall, Polarized light in optics and spectroscopy (Academic, Boston, 1990).
M. M. Mano and C. R. Kime, Logic and computer design fundamentals, 2nd ed. (Prentice Hall, New Jersey, 2001).
D. P. Vasudevan, P. K. Lala, J. Di, and J. P. Parkerson, “Reversible-logic design with online testability,” IEEE Trans. Instrum. Meas. 55, 406–414 (2006).
[Crossref]
D. S. Kliger, J. W. Lewis, and C. E. Randall, Polarized light in optics and spectroscopy (Academic, Boston, 1990).
E. Fredkin and T. Toffoli, “Conservative logic,” Int. J. Theor. Phys. 21, 219–22 (1982).
[Crossref]
D. P. Vasudevan, P. K. Lala, J. Di, and J. P. Parkerson, “Reversible-logic design with online testability,” IEEE Trans. Instrum. Meas. 55, 406–414 (2006).
[Crossref]
Y. A. Zaghloul and A. R. M. Zaghloul, “Unforced polarization-based optical implementation of binary logic,” Opt. Express 14, 7253–7269 (2006). Patent Pending.
[Crossref]
A. R. M. Zaghloul, D. A. Keeling, W. A. Berzett, and J. S. Mason, “Design of reflection retarders by use of nonnegative film-substrate systems,” J. Opt. Soc. Am. A 22, 1637–1645 (2005).
[Crossref]
A. R. M. Zaghloul, R. M. A. Azzam, and N. M. Bashara, “An angle-of-incidence tunable, SiO2-Si (film-substrate) reflection retarder for the UV mercury line λ=2537 Å,” Opt. Commun. 14, 260–262 (1975).
[Crossref]
A. R. M. Zaghloul, R. M. A. Azzam, and N. M. Bashara, “Design of film-substrate single-reflection retarders,” J. Opt. Soc. Am. 65, 1043–1049 (1975).
[Crossref]
A. R. M. Zaghloul, M. Elshazly-Zaghloul, W. A. Berzett, and D. A. Keeling, “Thin film coatings: A transmission ellipsometric function (TEF) approach I. Non-negative transmission systems, polarization devices, coatings, and closed-form design formulae,” Appl. Opt., In Press.
[PubMed]
R. M. A. Azzam, A. R. M. Zaghloul, and N. M. Bashara, “Ellipsometric function of a film-substrate system: Applications to the design of reflection-type optical devices and to ellipsometry,” J. Opt. Soc. Am.65, 252–260 (1975). Also in A. R. M. Zaghloul, “Ellipsometric function of a film-substrate system: Applications to the design of reflection-type optical devices and to ellipsometry,” Ph. D. dissertation, University of Nebraska-Lincoln, 1975.
[Crossref]
R. M. A. Azzam, A. R. M. Zaghloul, and N. M. Bashara, “Ellipsometric function of a film-substrate system: Applications to the design of reflection-type optical devices and to ellipsometry,” J. Opt. Soc. Am.65, 252–260 (1975). Also in A. R. M. Zaghloul, “Ellipsometric function of a film-substrate system: Applications to the design of reflection-type optical devices and to ellipsometry,” Ph. D. dissertation, University of Nebraska-Lincoln, 1975.
[Crossref]
A. R. M. Zaghloul and M. Elshazly-Zaghloul, “Transmission polarization devices using an unsupported film/pellicle: Closed-form design formulae,” SPIE Proceedings of the 2006 Defense and Security Symposium, Orlando, Florida, 17–21 April, 2006.
Y. A. Zaghloul and A. R. M. Zaghloul, “Unforced polarization-based optical implementation of binary logic,” Opt. Express 14, 7253–7269 (2006). Patent Pending.
[Crossref]
D. P. Vasudevan, P. K. Lala, J. Di, and J. P. Parkerson, “Reversible-logic design with online testability,” IEEE Trans. Instrum. Meas. 55, 406–414 (2006).
[Crossref]
E. Fredkin and T. Toffoli, “Conservative logic,” Int. J. Theor. Phys. 21, 219–22 (1982).
[Crossref]
A. R. M. Zaghloul, R. M. A. Azzam, and N. M. Bashara, “An angle-of-incidence tunable, SiO2-Si (film-substrate) reflection retarder for the UV mercury line λ=2537 Å,” Opt. Commun. 14, 260–262 (1975).
[Crossref]
Y. A. Zaghloul and A. R. M. Zaghloul, “Unforced polarization-based optical implementation of binary logic,” Opt. Express 14, 7253–7269 (2006). Patent Pending.
[Crossref]
M. M. Mano and C. R. Kime, Logic and computer design fundamentals, 2nd ed. (Prentice Hall, New Jersey, 2001).
D. S. Kliger, J. W. Lewis, and C. E. Randall, Polarized light in optics and spectroscopy (Academic, Boston, 1990).
R. M. A. Azzam, A. R. M. Zaghloul, and N. M. Bashara, “Ellipsometric function of a film-substrate system: Applications to the design of reflection-type optical devices and to ellipsometry,” J. Opt. Soc. Am.65, 252–260 (1975). Also in A. R. M. Zaghloul, “Ellipsometric function of a film-substrate system: Applications to the design of reflection-type optical devices and to ellipsometry,” Ph. D. dissertation, University of Nebraska-Lincoln, 1975.
[Crossref]
A. R. M. Zaghloul, M. Elshazly-Zaghloul, W. A. Berzett, and D. A. Keeling, “Thin film coatings: A transmission ellipsometric function (TEF) approach I. Non-negative transmission systems, polarization devices, coatings, and closed-form design formulae,” Appl. Opt., In Press.
[PubMed]
A. R. M. Zaghloul and M. Elshazly-Zaghloul, “Transmission polarization devices using an unsupported film/pellicle: Closed-form design formulae,” SPIE Proceedings of the 2006 Defense and Security Symposium, Orlando, Florida, 17–21 April, 2006.
M. A. Karim and A. A. S. Awwal, Optical computing: An introduction (Wiley, New York, 1992).