Abstract

Conductive-atomic force microscopy has been successfully used for characterizing recorded marks on commercial digital versatile disk and Blu-ray disk. Nano recorded marks beyond diffraction limit are imaged with high spatial resolution and excellent contrast of conductivity. The smallest mark size resolved is around 23.5 nm which is limited by background spots around 18.5 nm. The results of different optical power and writing strategy on the size, shape, and close packed writing process of recorded marks clearly show the opto-thermal response of phase-change recording layer.

© 2006 Optical Society of America

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  1. T. Ohta, K. Nishiuchi, K. Narumi, Y. Kitaoka, H. Ishibashi, N. Yamada, and T. Kozaki, "Overview and the future of phase-change optical disk technology," Jpn. J. Appl. Phys. 39,770-774 (2000).
    [CrossRef]
  2. R. Saito, F. Ito, Y. Yokochi, T. Saito, T. Ohira, H. Sato, and M. Itonaga, "Polarization-free Blu-ray disc/digital versatile disc compatible optical pick-up," Jpn. J. Appl. Phys. 43,4799-4800 (2004).
    [CrossRef]
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    [CrossRef]
  5. T. Fukaya, D. Buechel, S. Shinbori, J. Tominaga, N. Atoda, D. P. Tsai, and W. C. Lin, "Micro-optical nonlinearity of a silver oxide layer," J. Appl. Phys. 89,6139-6145 (2001).
    [CrossRef]
  6. D. P. Tsai and W. C. Lin, "Probing the near fields of the super-resolution near-field optical structure," Appl. Phys. Lett. 77,1413-1415 (2000).
    [CrossRef]
  7. W. C. Liu, C. Y. Wen, K. H. Chen, W. C. Lin, and D. P. Tsai, "Near-field images of the super-resolution near-field structure," Appl. Phys. Lett. 78,685-687 (2001).
    [CrossRef]
  8. W. C. Lin, T. S. Kao, H. H. Chang, Y. H. Lin, Y. H. Fu, C. Y. Wen, K. H. Chen, and D. P. Tsai, "Study of a super-resolution optical structure: polycarbonate /ZnS-SiO2 /ZnO /ZnS-SiO2 /Ge2Sb2Te5 /ZnS-SiO2", Jpn. J. Appl. Phys. 42, part 1, 1029-1030 (2003).
    [CrossRef]
  9. T. Tadokoro, T. Saiki, K. Yusu, and K. Ichihara, "High-resolution examination of recording marks in phase-change media using as scanning near-field optical microscope," Jpn. J. Appl. Phys. 39,3599-3602 (2000).
    [CrossRef]
  10. T. Kikukawa and H. Utsunomiya, "Scanning probe microscope observation of recorded marks in phase change disks," Microsc. Microanal. 7,363-367 (2001).
    [CrossRef]
  11. T. Luoh, J.-S. Bow, A. Peng, S.-Y. Tsai, and M.-R. Tseng, "Observation of recording marks in phase-change media using scanning electron microscopy channeling contrast image," Jpn. J. Appl. Phys. 38,1698-1700 (1999).
    [CrossRef]
  12. M. Miyamoto, A. Hirotsune, Y. Miyauchi, K. Ando, M. Terao, N. Tokusyuku, and R. Tamura, "Analysis of mark-formation process for phase-change media," IEEE J. Quantum Electron. 4,826-831 (1998).
    [CrossRef]
  13. B. J. Kooi, W. M. G. Groot and J. Th. M. De Hosson, "In situ transmission electron microscopy study of the crystallization of Ge2Sb2Te5," J. Appl. Phys. 95,924-932 (2004).
    [CrossRef]
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  15. C. Peng, L. Cheng, and M. Mansuripur, "Experimental and theoretical investigations of laser-induced crystallization and amorphization in phase-change optical recording media," J. Appl. Phys. 82,4183-4191 (1999).
    [CrossRef]
  16. E. R. Meinders, H. J. Borg, M. H. R. Lankhorst, J. Hellmig, and A. V. Mijiritskii, "Numerical simulation of mark formation in dual-stack phase-change recording," J. Appl. Phys. 91,9794-9802 (2002).
    [CrossRef]

2004 (2)

R. Saito, F. Ito, Y. Yokochi, T. Saito, T. Ohira, H. Sato, and M. Itonaga, "Polarization-free Blu-ray disc/digital versatile disc compatible optical pick-up," Jpn. J. Appl. Phys. 43,4799-4800 (2004).
[CrossRef]

B. J. Kooi, W. M. G. Groot and J. Th. M. De Hosson, "In situ transmission electron microscopy study of the crystallization of Ge2Sb2Te5," J. Appl. Phys. 95,924-932 (2004).
[CrossRef]

2003 (1)

W. C. Lin, T. S. Kao, H. H. Chang, Y. H. Lin, Y. H. Fu, C. Y. Wen, K. H. Chen, and D. P. Tsai, "Study of a super-resolution optical structure: polycarbonate /ZnS-SiO2 /ZnO /ZnS-SiO2 /Ge2Sb2Te5 /ZnS-SiO2", Jpn. J. Appl. Phys. 42, part 1, 1029-1030 (2003).
[CrossRef]

2002 (1)

E. R. Meinders, H. J. Borg, M. H. R. Lankhorst, J. Hellmig, and A. V. Mijiritskii, "Numerical simulation of mark formation in dual-stack phase-change recording," J. Appl. Phys. 91,9794-9802 (2002).
[CrossRef]

2001 (3)

T. Kikukawa and H. Utsunomiya, "Scanning probe microscope observation of recorded marks in phase change disks," Microsc. Microanal. 7,363-367 (2001).
[CrossRef]

W. C. Liu, C. Y. Wen, K. H. Chen, W. C. Lin, and D. P. Tsai, "Near-field images of the super-resolution near-field structure," Appl. Phys. Lett. 78,685-687 (2001).
[CrossRef]

T. Fukaya, D. Buechel, S. Shinbori, J. Tominaga, N. Atoda, D. P. Tsai, and W. C. Lin, "Micro-optical nonlinearity of a silver oxide layer," J. Appl. Phys. 89,6139-6145 (2001).
[CrossRef]

2000 (3)

D. P. Tsai and W. C. Lin, "Probing the near fields of the super-resolution near-field optical structure," Appl. Phys. Lett. 77,1413-1415 (2000).
[CrossRef]

T. Ohta, K. Nishiuchi, K. Narumi, Y. Kitaoka, H. Ishibashi, N. Yamada, and T. Kozaki, "Overview and the future of phase-change optical disk technology," Jpn. J. Appl. Phys. 39,770-774 (2000).
[CrossRef]

T. Tadokoro, T. Saiki, K. Yusu, and K. Ichihara, "High-resolution examination of recording marks in phase-change media using as scanning near-field optical microscope," Jpn. J. Appl. Phys. 39,3599-3602 (2000).
[CrossRef]

1999 (2)

T. Luoh, J.-S. Bow, A. Peng, S.-Y. Tsai, and M.-R. Tseng, "Observation of recording marks in phase-change media using scanning electron microscopy channeling contrast image," Jpn. J. Appl. Phys. 38,1698-1700 (1999).
[CrossRef]

C. Peng, L. Cheng, and M. Mansuripur, "Experimental and theoretical investigations of laser-induced crystallization and amorphization in phase-change optical recording media," J. Appl. Phys. 82,4183-4191 (1999).
[CrossRef]

1998 (2)

M. Miyamoto, A. Hirotsune, Y. Miyauchi, K. Ando, M. Terao, N. Tokusyuku, and R. Tamura, "Analysis of mark-formation process for phase-change media," IEEE J. Quantum Electron. 4,826-831 (1998).
[CrossRef]

J. Tominaga, T. Nakano, and N. Atoda, "An approach for recording and readout beyond the diffraction limit with an Sb thin film," Appl. Phys. Lett. 73,2078-2080 (1998).
[CrossRef]

Ando, K.

M. Miyamoto, A. Hirotsune, Y. Miyauchi, K. Ando, M. Terao, N. Tokusyuku, and R. Tamura, "Analysis of mark-formation process for phase-change media," IEEE J. Quantum Electron. 4,826-831 (1998).
[CrossRef]

Atoda, N.

T. Fukaya, D. Buechel, S. Shinbori, J. Tominaga, N. Atoda, D. P. Tsai, and W. C. Lin, "Micro-optical nonlinearity of a silver oxide layer," J. Appl. Phys. 89,6139-6145 (2001).
[CrossRef]

J. Tominaga, T. Nakano, and N. Atoda, "An approach for recording and readout beyond the diffraction limit with an Sb thin film," Appl. Phys. Lett. 73,2078-2080 (1998).
[CrossRef]

Borg, H. J.

E. R. Meinders, H. J. Borg, M. H. R. Lankhorst, J. Hellmig, and A. V. Mijiritskii, "Numerical simulation of mark formation in dual-stack phase-change recording," J. Appl. Phys. 91,9794-9802 (2002).
[CrossRef]

Bow, J.-S.

T. Luoh, J.-S. Bow, A. Peng, S.-Y. Tsai, and M.-R. Tseng, "Observation of recording marks in phase-change media using scanning electron microscopy channeling contrast image," Jpn. J. Appl. Phys. 38,1698-1700 (1999).
[CrossRef]

Buechel, D.

T. Fukaya, D. Buechel, S. Shinbori, J. Tominaga, N. Atoda, D. P. Tsai, and W. C. Lin, "Micro-optical nonlinearity of a silver oxide layer," J. Appl. Phys. 89,6139-6145 (2001).
[CrossRef]

Chang, H. H.

W. C. Lin, T. S. Kao, H. H. Chang, Y. H. Lin, Y. H. Fu, C. Y. Wen, K. H. Chen, and D. P. Tsai, "Study of a super-resolution optical structure: polycarbonate /ZnS-SiO2 /ZnO /ZnS-SiO2 /Ge2Sb2Te5 /ZnS-SiO2", Jpn. J. Appl. Phys. 42, part 1, 1029-1030 (2003).
[CrossRef]

Chen, K. H.

W. C. Lin, T. S. Kao, H. H. Chang, Y. H. Lin, Y. H. Fu, C. Y. Wen, K. H. Chen, and D. P. Tsai, "Study of a super-resolution optical structure: polycarbonate /ZnS-SiO2 /ZnO /ZnS-SiO2 /Ge2Sb2Te5 /ZnS-SiO2", Jpn. J. Appl. Phys. 42, part 1, 1029-1030 (2003).
[CrossRef]

W. C. Liu, C. Y. Wen, K. H. Chen, W. C. Lin, and D. P. Tsai, "Near-field images of the super-resolution near-field structure," Appl. Phys. Lett. 78,685-687 (2001).
[CrossRef]

Cheng, L.

C. Peng, L. Cheng, and M. Mansuripur, "Experimental and theoretical investigations of laser-induced crystallization and amorphization in phase-change optical recording media," J. Appl. Phys. 82,4183-4191 (1999).
[CrossRef]

De Hosson, J. Th. M.

B. J. Kooi, W. M. G. Groot and J. Th. M. De Hosson, "In situ transmission electron microscopy study of the crystallization of Ge2Sb2Te5," J. Appl. Phys. 95,924-932 (2004).
[CrossRef]

Fu, Y. H.

W. C. Lin, T. S. Kao, H. H. Chang, Y. H. Lin, Y. H. Fu, C. Y. Wen, K. H. Chen, and D. P. Tsai, "Study of a super-resolution optical structure: polycarbonate /ZnS-SiO2 /ZnO /ZnS-SiO2 /Ge2Sb2Te5 /ZnS-SiO2", Jpn. J. Appl. Phys. 42, part 1, 1029-1030 (2003).
[CrossRef]

Fukaya, T.

T. Fukaya, D. Buechel, S. Shinbori, J. Tominaga, N. Atoda, D. P. Tsai, and W. C. Lin, "Micro-optical nonlinearity of a silver oxide layer," J. Appl. Phys. 89,6139-6145 (2001).
[CrossRef]

Groot, W. M. G.

B. J. Kooi, W. M. G. Groot and J. Th. M. De Hosson, "In situ transmission electron microscopy study of the crystallization of Ge2Sb2Te5," J. Appl. Phys. 95,924-932 (2004).
[CrossRef]

Hellmig, J.

E. R. Meinders, H. J. Borg, M. H. R. Lankhorst, J. Hellmig, and A. V. Mijiritskii, "Numerical simulation of mark formation in dual-stack phase-change recording," J. Appl. Phys. 91,9794-9802 (2002).
[CrossRef]

Hirotsune, A.

M. Miyamoto, A. Hirotsune, Y. Miyauchi, K. Ando, M. Terao, N. Tokusyuku, and R. Tamura, "Analysis of mark-formation process for phase-change media," IEEE J. Quantum Electron. 4,826-831 (1998).
[CrossRef]

Ichihara, K.

T. Tadokoro, T. Saiki, K. Yusu, and K. Ichihara, "High-resolution examination of recording marks in phase-change media using as scanning near-field optical microscope," Jpn. J. Appl. Phys. 39,3599-3602 (2000).
[CrossRef]

Ishibashi, H.

T. Ohta, K. Nishiuchi, K. Narumi, Y. Kitaoka, H. Ishibashi, N. Yamada, and T. Kozaki, "Overview and the future of phase-change optical disk technology," Jpn. J. Appl. Phys. 39,770-774 (2000).
[CrossRef]

Ito, F.

R. Saito, F. Ito, Y. Yokochi, T. Saito, T. Ohira, H. Sato, and M. Itonaga, "Polarization-free Blu-ray disc/digital versatile disc compatible optical pick-up," Jpn. J. Appl. Phys. 43,4799-4800 (2004).
[CrossRef]

Itonaga, M.

R. Saito, F. Ito, Y. Yokochi, T. Saito, T. Ohira, H. Sato, and M. Itonaga, "Polarization-free Blu-ray disc/digital versatile disc compatible optical pick-up," Jpn. J. Appl. Phys. 43,4799-4800 (2004).
[CrossRef]

Kao, T. S.

W. C. Lin, T. S. Kao, H. H. Chang, Y. H. Lin, Y. H. Fu, C. Y. Wen, K. H. Chen, and D. P. Tsai, "Study of a super-resolution optical structure: polycarbonate /ZnS-SiO2 /ZnO /ZnS-SiO2 /Ge2Sb2Te5 /ZnS-SiO2", Jpn. J. Appl. Phys. 42, part 1, 1029-1030 (2003).
[CrossRef]

Kikukawa, T.

T. Kikukawa and H. Utsunomiya, "Scanning probe microscope observation of recorded marks in phase change disks," Microsc. Microanal. 7,363-367 (2001).
[CrossRef]

Kitaoka, Y.

T. Ohta, K. Nishiuchi, K. Narumi, Y. Kitaoka, H. Ishibashi, N. Yamada, and T. Kozaki, "Overview and the future of phase-change optical disk technology," Jpn. J. Appl. Phys. 39,770-774 (2000).
[CrossRef]

Kooi, B. J.

B. J. Kooi, W. M. G. Groot and J. Th. M. De Hosson, "In situ transmission electron microscopy study of the crystallization of Ge2Sb2Te5," J. Appl. Phys. 95,924-932 (2004).
[CrossRef]

Kozaki, T.

T. Ohta, K. Nishiuchi, K. Narumi, Y. Kitaoka, H. Ishibashi, N. Yamada, and T. Kozaki, "Overview and the future of phase-change optical disk technology," Jpn. J. Appl. Phys. 39,770-774 (2000).
[CrossRef]

Lankhorst, M. H. R.

E. R. Meinders, H. J. Borg, M. H. R. Lankhorst, J. Hellmig, and A. V. Mijiritskii, "Numerical simulation of mark formation in dual-stack phase-change recording," J. Appl. Phys. 91,9794-9802 (2002).
[CrossRef]

Lin, W. C.

W. C. Lin, T. S. Kao, H. H. Chang, Y. H. Lin, Y. H. Fu, C. Y. Wen, K. H. Chen, and D. P. Tsai, "Study of a super-resolution optical structure: polycarbonate /ZnS-SiO2 /ZnO /ZnS-SiO2 /Ge2Sb2Te5 /ZnS-SiO2", Jpn. J. Appl. Phys. 42, part 1, 1029-1030 (2003).
[CrossRef]

W. C. Liu, C. Y. Wen, K. H. Chen, W. C. Lin, and D. P. Tsai, "Near-field images of the super-resolution near-field structure," Appl. Phys. Lett. 78,685-687 (2001).
[CrossRef]

T. Fukaya, D. Buechel, S. Shinbori, J. Tominaga, N. Atoda, D. P. Tsai, and W. C. Lin, "Micro-optical nonlinearity of a silver oxide layer," J. Appl. Phys. 89,6139-6145 (2001).
[CrossRef]

D. P. Tsai and W. C. Lin, "Probing the near fields of the super-resolution near-field optical structure," Appl. Phys. Lett. 77,1413-1415 (2000).
[CrossRef]

Lin, Y. H.

W. C. Lin, T. S. Kao, H. H. Chang, Y. H. Lin, Y. H. Fu, C. Y. Wen, K. H. Chen, and D. P. Tsai, "Study of a super-resolution optical structure: polycarbonate /ZnS-SiO2 /ZnO /ZnS-SiO2 /Ge2Sb2Te5 /ZnS-SiO2", Jpn. J. Appl. Phys. 42, part 1, 1029-1030 (2003).
[CrossRef]

Liu, W. C.

W. C. Liu, C. Y. Wen, K. H. Chen, W. C. Lin, and D. P. Tsai, "Near-field images of the super-resolution near-field structure," Appl. Phys. Lett. 78,685-687 (2001).
[CrossRef]

Luoh, T.

T. Luoh, J.-S. Bow, A. Peng, S.-Y. Tsai, and M.-R. Tseng, "Observation of recording marks in phase-change media using scanning electron microscopy channeling contrast image," Jpn. J. Appl. Phys. 38,1698-1700 (1999).
[CrossRef]

Mansuripur, M.

C. Peng, L. Cheng, and M. Mansuripur, "Experimental and theoretical investigations of laser-induced crystallization and amorphization in phase-change optical recording media," J. Appl. Phys. 82,4183-4191 (1999).
[CrossRef]

Meinders, E. R.

E. R. Meinders, H. J. Borg, M. H. R. Lankhorst, J. Hellmig, and A. V. Mijiritskii, "Numerical simulation of mark formation in dual-stack phase-change recording," J. Appl. Phys. 91,9794-9802 (2002).
[CrossRef]

Mijiritskii, A. V.

E. R. Meinders, H. J. Borg, M. H. R. Lankhorst, J. Hellmig, and A. V. Mijiritskii, "Numerical simulation of mark formation in dual-stack phase-change recording," J. Appl. Phys. 91,9794-9802 (2002).
[CrossRef]

Miyamoto, M.

M. Miyamoto, A. Hirotsune, Y. Miyauchi, K. Ando, M. Terao, N. Tokusyuku, and R. Tamura, "Analysis of mark-formation process for phase-change media," IEEE J. Quantum Electron. 4,826-831 (1998).
[CrossRef]

Miyauchi, Y.

M. Miyamoto, A. Hirotsune, Y. Miyauchi, K. Ando, M. Terao, N. Tokusyuku, and R. Tamura, "Analysis of mark-formation process for phase-change media," IEEE J. Quantum Electron. 4,826-831 (1998).
[CrossRef]

Nakano, T.

J. Tominaga, T. Nakano, and N. Atoda, "An approach for recording and readout beyond the diffraction limit with an Sb thin film," Appl. Phys. Lett. 73,2078-2080 (1998).
[CrossRef]

Narumi, K.

T. Ohta, K. Nishiuchi, K. Narumi, Y. Kitaoka, H. Ishibashi, N. Yamada, and T. Kozaki, "Overview and the future of phase-change optical disk technology," Jpn. J. Appl. Phys. 39,770-774 (2000).
[CrossRef]

Nishiuchi, K.

T. Ohta, K. Nishiuchi, K. Narumi, Y. Kitaoka, H. Ishibashi, N. Yamada, and T. Kozaki, "Overview and the future of phase-change optical disk technology," Jpn. J. Appl. Phys. 39,770-774 (2000).
[CrossRef]

Ohira, T.

R. Saito, F. Ito, Y. Yokochi, T. Saito, T. Ohira, H. Sato, and M. Itonaga, "Polarization-free Blu-ray disc/digital versatile disc compatible optical pick-up," Jpn. J. Appl. Phys. 43,4799-4800 (2004).
[CrossRef]

Ohta, T.

T. Ohta, K. Nishiuchi, K. Narumi, Y. Kitaoka, H. Ishibashi, N. Yamada, and T. Kozaki, "Overview and the future of phase-change optical disk technology," Jpn. J. Appl. Phys. 39,770-774 (2000).
[CrossRef]

Peng, A.

T. Luoh, J.-S. Bow, A. Peng, S.-Y. Tsai, and M.-R. Tseng, "Observation of recording marks in phase-change media using scanning electron microscopy channeling contrast image," Jpn. J. Appl. Phys. 38,1698-1700 (1999).
[CrossRef]

Peng, C.

C. Peng, L. Cheng, and M. Mansuripur, "Experimental and theoretical investigations of laser-induced crystallization and amorphization in phase-change optical recording media," J. Appl. Phys. 82,4183-4191 (1999).
[CrossRef]

Saiki, T.

T. Tadokoro, T. Saiki, K. Yusu, and K. Ichihara, "High-resolution examination of recording marks in phase-change media using as scanning near-field optical microscope," Jpn. J. Appl. Phys. 39,3599-3602 (2000).
[CrossRef]

Saito, R.

R. Saito, F. Ito, Y. Yokochi, T. Saito, T. Ohira, H. Sato, and M. Itonaga, "Polarization-free Blu-ray disc/digital versatile disc compatible optical pick-up," Jpn. J. Appl. Phys. 43,4799-4800 (2004).
[CrossRef]

Saito, T.

R. Saito, F. Ito, Y. Yokochi, T. Saito, T. Ohira, H. Sato, and M. Itonaga, "Polarization-free Blu-ray disc/digital versatile disc compatible optical pick-up," Jpn. J. Appl. Phys. 43,4799-4800 (2004).
[CrossRef]

Sato, H.

R. Saito, F. Ito, Y. Yokochi, T. Saito, T. Ohira, H. Sato, and M. Itonaga, "Polarization-free Blu-ray disc/digital versatile disc compatible optical pick-up," Jpn. J. Appl. Phys. 43,4799-4800 (2004).
[CrossRef]

Shinbori, S.

T. Fukaya, D. Buechel, S. Shinbori, J. Tominaga, N. Atoda, D. P. Tsai, and W. C. Lin, "Micro-optical nonlinearity of a silver oxide layer," J. Appl. Phys. 89,6139-6145 (2001).
[CrossRef]

Tadokoro, T.

T. Tadokoro, T. Saiki, K. Yusu, and K. Ichihara, "High-resolution examination of recording marks in phase-change media using as scanning near-field optical microscope," Jpn. J. Appl. Phys. 39,3599-3602 (2000).
[CrossRef]

Tamura, R.

M. Miyamoto, A. Hirotsune, Y. Miyauchi, K. Ando, M. Terao, N. Tokusyuku, and R. Tamura, "Analysis of mark-formation process for phase-change media," IEEE J. Quantum Electron. 4,826-831 (1998).
[CrossRef]

Terao, M.

M. Miyamoto, A. Hirotsune, Y. Miyauchi, K. Ando, M. Terao, N. Tokusyuku, and R. Tamura, "Analysis of mark-formation process for phase-change media," IEEE J. Quantum Electron. 4,826-831 (1998).
[CrossRef]

Tokusyuku, N.

M. Miyamoto, A. Hirotsune, Y. Miyauchi, K. Ando, M. Terao, N. Tokusyuku, and R. Tamura, "Analysis of mark-formation process for phase-change media," IEEE J. Quantum Electron. 4,826-831 (1998).
[CrossRef]

Tominaga, J.

T. Fukaya, D. Buechel, S. Shinbori, J. Tominaga, N. Atoda, D. P. Tsai, and W. C. Lin, "Micro-optical nonlinearity of a silver oxide layer," J. Appl. Phys. 89,6139-6145 (2001).
[CrossRef]

J. Tominaga, T. Nakano, and N. Atoda, "An approach for recording and readout beyond the diffraction limit with an Sb thin film," Appl. Phys. Lett. 73,2078-2080 (1998).
[CrossRef]

Tsai, D. P.

W. C. Lin, T. S. Kao, H. H. Chang, Y. H. Lin, Y. H. Fu, C. Y. Wen, K. H. Chen, and D. P. Tsai, "Study of a super-resolution optical structure: polycarbonate /ZnS-SiO2 /ZnO /ZnS-SiO2 /Ge2Sb2Te5 /ZnS-SiO2", Jpn. J. Appl. Phys. 42, part 1, 1029-1030 (2003).
[CrossRef]

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W. C. Liu, C. Y. Wen, K. H. Chen, W. C. Lin, and D. P. Tsai, "Near-field images of the super-resolution near-field structure," Appl. Phys. Lett. 78,685-687 (2001).
[CrossRef]

D. P. Tsai and W. C. Lin, "Probing the near fields of the super-resolution near-field optical structure," Appl. Phys. Lett. 77,1413-1415 (2000).
[CrossRef]

Tsai, S.-Y.

T. Luoh, J.-S. Bow, A. Peng, S.-Y. Tsai, and M.-R. Tseng, "Observation of recording marks in phase-change media using scanning electron microscopy channeling contrast image," Jpn. J. Appl. Phys. 38,1698-1700 (1999).
[CrossRef]

Tseng, M.-R.

T. Luoh, J.-S. Bow, A. Peng, S.-Y. Tsai, and M.-R. Tseng, "Observation of recording marks in phase-change media using scanning electron microscopy channeling contrast image," Jpn. J. Appl. Phys. 38,1698-1700 (1999).
[CrossRef]

Utsunomiya, H.

T. Kikukawa and H. Utsunomiya, "Scanning probe microscope observation of recorded marks in phase change disks," Microsc. Microanal. 7,363-367 (2001).
[CrossRef]

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W. C. Lin, T. S. Kao, H. H. Chang, Y. H. Lin, Y. H. Fu, C. Y. Wen, K. H. Chen, and D. P. Tsai, "Study of a super-resolution optical structure: polycarbonate /ZnS-SiO2 /ZnO /ZnS-SiO2 /Ge2Sb2Te5 /ZnS-SiO2", Jpn. J. Appl. Phys. 42, part 1, 1029-1030 (2003).
[CrossRef]

W. C. Liu, C. Y. Wen, K. H. Chen, W. C. Lin, and D. P. Tsai, "Near-field images of the super-resolution near-field structure," Appl. Phys. Lett. 78,685-687 (2001).
[CrossRef]

Yamada, N.

T. Ohta, K. Nishiuchi, K. Narumi, Y. Kitaoka, H. Ishibashi, N. Yamada, and T. Kozaki, "Overview and the future of phase-change optical disk technology," Jpn. J. Appl. Phys. 39,770-774 (2000).
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R. Saito, F. Ito, Y. Yokochi, T. Saito, T. Ohira, H. Sato, and M. Itonaga, "Polarization-free Blu-ray disc/digital versatile disc compatible optical pick-up," Jpn. J. Appl. Phys. 43,4799-4800 (2004).
[CrossRef]

Yusu, K.

T. Tadokoro, T. Saiki, K. Yusu, and K. Ichihara, "High-resolution examination of recording marks in phase-change media using as scanning near-field optical microscope," Jpn. J. Appl. Phys. 39,3599-3602 (2000).
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[CrossRef]

W. C. Liu, C. Y. Wen, K. H. Chen, W. C. Lin, and D. P. Tsai, "Near-field images of the super-resolution near-field structure," Appl. Phys. Lett. 78,685-687 (2001).
[CrossRef]

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M. Miyamoto, A. Hirotsune, Y. Miyauchi, K. Ando, M. Terao, N. Tokusyuku, and R. Tamura, "Analysis of mark-formation process for phase-change media," IEEE J. Quantum Electron. 4,826-831 (1998).
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[CrossRef]

T. Fukaya, D. Buechel, S. Shinbori, J. Tominaga, N. Atoda, D. P. Tsai, and W. C. Lin, "Micro-optical nonlinearity of a silver oxide layer," J. Appl. Phys. 89,6139-6145 (2001).
[CrossRef]

Jpn. J. Appl. Phys. (5)

T. Ohta, K. Nishiuchi, K. Narumi, Y. Kitaoka, H. Ishibashi, N. Yamada, and T. Kozaki, "Overview and the future of phase-change optical disk technology," Jpn. J. Appl. Phys. 39,770-774 (2000).
[CrossRef]

R. Saito, F. Ito, Y. Yokochi, T. Saito, T. Ohira, H. Sato, and M. Itonaga, "Polarization-free Blu-ray disc/digital versatile disc compatible optical pick-up," Jpn. J. Appl. Phys. 43,4799-4800 (2004).
[CrossRef]

W. C. Lin, T. S. Kao, H. H. Chang, Y. H. Lin, Y. H. Fu, C. Y. Wen, K. H. Chen, and D. P. Tsai, "Study of a super-resolution optical structure: polycarbonate /ZnS-SiO2 /ZnO /ZnS-SiO2 /Ge2Sb2Te5 /ZnS-SiO2", Jpn. J. Appl. Phys. 42, part 1, 1029-1030 (2003).
[CrossRef]

T. Tadokoro, T. Saiki, K. Yusu, and K. Ichihara, "High-resolution examination of recording marks in phase-change media using as scanning near-field optical microscope," Jpn. J. Appl. Phys. 39,3599-3602 (2000).
[CrossRef]

T. Luoh, J.-S. Bow, A. Peng, S.-Y. Tsai, and M.-R. Tseng, "Observation of recording marks in phase-change media using scanning electron microscopy channeling contrast image," Jpn. J. Appl. Phys. 38,1698-1700 (1999).
[CrossRef]

Microsc. Microanal. (1)

T. Kikukawa and H. Utsunomiya, "Scanning probe microscope observation of recorded marks in phase change disks," Microsc. Microanal. 7,363-367 (2001).
[CrossRef]

Other (2)

Blu-ray disk 23GB, SONY, 6-7-35 Kitashinagawa, Shinagawa-ku, Tokyo 141-0001, Japan.

4X DVD+RW for data and video 4.7GB 120min, RITEK, 42, Kuan-Fu N. Road, Hsin-Chu Industrial Park, 30316, Taiwan.

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Figures (5)

Fig. 1.
Fig. 1.

A schematic diagram of the scanning probe and recorded marks on phase-change layer of optical disk.

Fig. 2.
Fig. 2.

5µm×5µm three-dimensional AFM and conductive-AFM images acquired simultaneously on AgInSbTe phase-change recording layer of a commercial DVD+RW (4X) optical disk.

Fig. 3.
Fig. 3.

2.5 µm×2.5 µm AFM and conductive-AFM images acquired simultaneously on the recorded phase-change layer of a SONY Blu-ray optical disk.

Fig. 4.
Fig. 4.

(a)–(c) 2.5 µm×2.5 µm C-AFM images on AgInSbTe phase-change recording layer of a commercial DVD+RW (4X) optical disk with different laser writing power, 11 mW, 10 mW and 9 mW, respectively. (d) schematic of optical writing threshold for recorded marks.

Fig. 5.
Fig. 5.

(a) A 3µm×3µm AFM image on phase-change recording layer of a 4X DVD+RW optical disk. (b) C-AFM current intensity image acquired simultaneously with (a). Different spacing and shape of recorded marks can be observed. (c) Pulse train of writing strategy and the consequence of recorded marks are shown along with three-dimensional schematic of the areas above opto-thermal threshold plane. The size and shape of recorded marks can be affected by thermal interactions with adjacent marks.

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