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Sub-wavelength patterning of the optical near-field

Romain Quidant, Gonçal Badenes, Stéphanie Cheylan, Ramon Alcubilla, Jean-Claude Weeber, and Christian Girard

Open Access Open Access

Abstract

We report the sub-wavelength patterning of the optical near-field by total internal reflection illumination of a regular array of resonant gold nano-particles. Under appropriate conditions, the in-plane coupling between Localized Surface Plasmon (LSP) fields gives rise to sub-wavelength light spots between the structures. Measurements performed with an Apertureless Scanning Near-Field Optical Microscope (ASNOM) show a good agreement with theoretical predictions based on the Green dyadic method. This concept might offer a convenient way to elaborate extended optical trap landscapes for manipulation of sub-micrometer systems.

©2004 Optical Society of America

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Figures (4)
Fig. 1.
Fig. 1. Theoretical map of the near-field electric intensity calculated 100nm above a 5×6 array (640nm period) of gold pads (100×100×40)nm3 (location represented by the black squares). The illumination is performed by a plane wave (633nm, TM polarization) under total internal reflection (45° incidence angle). The normalization at each point is done with respect to the electric intensity in the observation plane in the absence of any nanostructure.

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Fig. 2.
Fig. 2. Schematic description of our ASNOM set-up

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Fig. 3.
Fig. 3. (a–b) 2.4µm×2.4µm images recorded simultaneously above the fabricated sample. (a) AFM topography, (b) ASNOM image (λ=632.8nm, TM polarization and 45° incidence angle). (c–d) Comparison over a unit cell of the theoretical near-field electric intensity (c) and the experimental measurements (d) (zoom in on the square area drawn on Fig. 3(b)).

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Fig. 4.
Fig. 4. Dependence of the ASNOM signal on the tip-sample distance when precisely located above one of the inter-particle maxima (experimental data in black, fitting in red).

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Equations (1)

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Δ x Δ k x ≥ 2 π
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