Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

A birefringent etalon as single-mode selector in a laser cavity

Open Access Open Access

Abstract

A novel technique is demonstrated for stabilizing an intra-cavity etalon used for single-mode selection in a laser cavity. By appropriate polarization analysis of the reflection from an etalon designed as a quarterwave plate an electronic signal can be derived, that enables the implementation of an electronic stabilization scheme. This scheme obviates the need for any modulation of the etalon in order to ensure stable single mode operation of a cw tunable laser.

©2004 Optical Society of America

Full Article  |  PDF Article
More Like This
Tilted birefringent Fabry-Perot etalon for tuning dye lasers

Masakatsu Okada, Kuniharu Takizawa, and Shogo leiri
Appl. Opt. 15(2) 472-476 (1976)

Tuning of a Dye Laser by a Birefringent Fabry-Perot Etalon

Masakatsu Okada, Satoshi Shimizu, and Shogo leiri
Appl. Opt. 14(4) 917-922 (1975)

Cited By

Optica participates in Crossref's Cited-By Linking service. Citing articles from Optica Publishing Group journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1.
Fig. 1. The principle of operation of the birefringent etalon demonstrated in an extra-cavity set-up. The input light is polarized at a slight angle to one of the optic axes of the quarter-wave etalon. An intensity component α2 is directed along axis 1 and a component β 2 along axis 2. The frequency of the laser or the tilt angle of the etalon are chosen such that the α 2 component is close to a reflection minimum for the etalon. At exact resonance the reflection of the component along axis 1 vanishes and the reflected light is linearly polarized along axis 2 (indicated by green arrow). Away from exact resonance the reflection is elliptically polarized with opposite helicity for frequencies above and below resonance (indicated by red and blue ellipses). A quarter-wave plate is inserted with its axes aligned with those of the etalon. The transmitted light is now linearly polarized. The polarization is along axis 2 at exact resonance and changes clockwise and counter-clockwise respectively above and below resonance. This linear polarization is analyzed with a polarizing beamsplitter, which is rotated by 45° with respect to the axes of the analyzing waveplate. On resonance an equal amount of light is transmitted to both detectors while the split is asymmetric for frequencies above and below resonance.
Fig. 2.
Fig. 2. The calculated signal S for an etalon with (a) quarter-wave retardation and varying reflectivities R and (b) a 20% reflectivity and a retardation varying from λ/8 to 3 λ/8. The inset in (a) shows the dependence on the reflectivity of the gradient through the zero-crossing.
Fig. 3.
Fig. 3. Experimental results obtained with an uncoated waveplate in an extra-cavity configuration as shown in Fig. 1. The sum and difference signals from the two detectors as well as the ratio of the difference and sum are shown as a function of the laser wavelength. The solid curves shown with the sum and difference signals are sinusoidal fits to the data, which are expected to provide good fits to the experimental data for a low reflectivity etalon. The solid curve shown with the ratio data is the theoretical prediction for an etalon with a 4% reflectivity.
Fig. 4.
Fig. 4. Experimental results for a 25% reflecting etalon inserted in the cavity of a VECSEL. The ratio signal S defined by Eq. 6 is derived from the measured outputs of the polarization analyzer and shown as function of etalon tuning. The discontinuities correspond to longitudinal laser mode jumps.

Equations (7)

Equations on this page are rendered with MathJax. Learn more.

A r ( δ , R ) = R 1 exp ( i δ ) 1 R exp ( i δ )
E ( t ) = ( α E 0 exp ( i ω t ) , β E 0 exp ( i ω t ) )
E r ( t , δ 1 , δ 2 , R ) = ( α E 0 A r ( δ 1 , R ) exp ( i ω t ) , β E 0 A r ( δ 2 , R ) exp ( i ω t ) )
E 1 ( t , δ 1 , δ 2 , R ) = E 0 2 [ α A r ( δ 1 , R ) + i β A r ( δ 2 , R ) ] exp ( i ω t )
E 2 ( t , δ 1 , δ 2 , R ) = E 0 2 [ α A r ( δ 1 , R ) i β A r ( δ 2 , R ) ] exp ( i ω t )
S ( δ 1 , δ 2 , R ) = I 2 ( δ 1 , δ 2 , R ) I 1 ( δ 1 , δ 2 , R ) I 2 ( δ 1 , δ 2 , R ) + I 1 ( δ 1 , δ 2 , R ) = 2 α β Im [ A r ( δ 1 , R ) A r * ( δ 2 , R ) ] α 2 A r ( δ 1 , R ) 2 + β 2 A r ( δ 2 , R ) 2
S = I 1 I 2 I 1 + I 2
Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.