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Resonant optical transmission through thin metallic films with and without holes

Nicolas Bonod, Stefan Enoch, Lifeng Li, Evgeny Popov, and Michel Nevière

Open Access Open Access

Abstract

Using a rigorous electromagnetic analysis of two-dimensional (or crossed) gratings, we account, in a first step, for the enhanced transmission of a sub-wavelength hole array pierced inside a metallic film, when plasmons are simultaneously excited at both interfaces of the film. Replacing the hole array by a continuous metallic film, we then show that resonant extraordinary transmission can still occur, provided the film is modulated. The modulation may be produced in both a one-dimensional and a two dimensional geometry either by periodic surface deformation or by adding an array of high index pillars. Transmittivity higher than 80% is found when surface plasmons are excited at both interfaces, in a symmetric configuration.

©2003 Optical Society of America

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Figures (7)
Fig. 1.
Fig. 1. Transmittance as a function of wavelength in micrometers

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Fig. 2.
Fig. 2. Transmittivity as a function of wavelength for a continuous modulated silver film

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Fig. 3.
Fig. 3. Same as Fig. 2, but with 0.07 µm thickness. The red curve represents the sum of reflected and transmitted efficiency

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Fig. 4.
Fig. 4. Maximum of transmission for a silver layer as a function of the layer thickness for four different structures: plane layer (green curve), sinusoidal grating (groove depth h=18 nm is constant for thicknesses greater than 150 nm) with an identical substrate and superstrate material (black curve), grating hole array (violet curve),11 and a symmetrical prism coupler with 2 µm air gap (blue curve)

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Fig. 5.
Fig. 5. Light transmission of a two-dimensionally corrugated sinusoidal film as a function of the wavelength and the modulation depth.

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Fig. 6.
Fig. 6. Schematical representation of a plane metallic layer with a periodical array of dielectric pillars

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Fig.7.
Fig.7. Light transmission of a two-dimensional dielectric pillar grating on a plane silver film as a function of the wavelength and the pillar height.

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Equations (1)

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y = h 4 [ sin ⁡ ( Kx ) + sin ⁡ ( Kz ) ]
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