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High sensitive SiO2/TiO2 hybrid sol-gel material for fabrication of 3 dimensional continuous surface relief diffractive optical elements by electron-beam lithography

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Abstract

A negative-tone sensitive SiO2/TiO2 organic-inorganic hybrid sol-gel material was synthesized and characterized for fabrication of multilevel micro-optical elements by direct electron-beam lithography. The exposure was carried out by an in-house modified electron-beam writing system using LEO SEM-982 with Elphy Quantum exposure beam-blanking control system at 25keV. The hybrid Sol-Gel material demonstrated a superb sensitivity for doses between 0.22μC/cm2 and 0.33μC/cm2.

©2002 Optical Society of America

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Figures (3)

Fig. 1.
Fig. 1. Sol-Gel film thickness after development in IPA or acetone and post-baking vs. exposure.
Fig. 2.
Fig. 2. Sol-Gel film thickness after development in IPA vs. exposure for the different photo-inhibitor percentage.
Fig. 3.
Fig. 3. 4μm pitch blazed grating built in the hybrid sol-gel exposed @ 25keV
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