N. N. Rozanov, Editor-in-Chief
Amplifying the rotation of the plane of polarization with a layer of cholesteric liquid crystal
A. A. Gevorgyan, A. M. Sedrakyan, and A. Zh. Khachatryan
J. Opt. Technol. 75(2), 69-74 (2008) View: PDF
Laser thermal cleavage of brittle nonmetallic materials along closed curvilinear contours
S. V. Shalupaev, Yu. V. Nikityuk, and A. A. Sereda
J. Opt. Technol. 75(2), 75-78 (2008) View: PDF
Matrix method for calculating polarization aberrations
A. L. Sokolov
J. Opt. Technol. 75(2), 79-84 (2008) View: PDF
Interconnection of the optical and informational responses of photoinformation systems
B. S. Gurevich, S. B. Gurevich, and K. M. Zhumaliev
J. Opt. Technol. 75(2), 85-89 (2008) View: PDF
Polarization method for recognizing the shape of a surface from the shading
S. A. Alekseev and A. V. Pasyada
J. Opt. Technol. 75(2), 90-93 (2008) View: PDF
The optical properties and use of multidomain liquid-crystal structures
A. V. Morozov and G. E. Nevskaya
J. Opt. Technol. 75(2), 94-97 (2008) View: PDF
Using multidomain liquid-crystal structures to improve the optical characteristics of microlenses
J. Opt. Technol. 75(2), 98-100 (2008) View: PDF
Shipborne lidar for hydrological research
A. I. Stepanov, S. N. Karpov, V. A. Kondrashov, S. I. Sachava, M. S. Samartsev, L. A. Spivak, V. A. Tershukov, S. A. Rogov, and S. A. Mal’kov
J. Opt. Technol. 75(2), 101-106 (2008) View: PDF
Microscopes with raster illuminator devices
S. N. Natarovskiĭ and O. D. Kalinina
J. Opt. Technol. 75(2), 107-110 (2008) View: PDF
Measuring the modulation transfer functions of objectives by means of CCD array photodetectors
V. S. Nuzhin, S. V. Solk, and A. V. Nuzhin
J. Opt. Technol. 75(2), 111-113 (2008) View: PDF
Using bias pulses to equalize the signals in microbolometer detector arrays
M. A. Dem’yanenko and V. N. Ovsyuk
J. Opt. Technol. 75(2), 114-119 (2008) View: PDF
Nanophotoreactors based on organized liquid media
V. V. Danilov
J. Opt. Technol. 75(2), 120-123 (2008) View: PDF
Textured optical synthetic sapphire
V. N. Vetrov and B. A. Ignatenkov
J. Opt. Technol. 75(2), 124-127 (2008) View: PDF
How a crack and the defect material in its neighborhood affect the radiation strength of transparent materials
I. V. Ushakov
J. Opt. Technol. 75(2), 128-131 (2008) View: PDF
Ellipsometric studies of the surface layer of polished optical glass
V. A. Odarich
J. Opt. Technol. 75(2), 132-137 (2008) View: PDF
