OSA Publishing

1 February 2005, Volume 72, Issue 2, pp. 163-226   15 articles

Using ellipsometric methods to study adsorbed layers of molecules

J. Opt. Technol. 72(2), 163-166 (2005)  View: PDF

How the photoluminescence of submicron epitaxial n^+-n-i structures of III-V compounds depends on their electrophysical characteristics

J. Opt. Technol. 72(2), 167-171 (2005)  View: PDF

Aberrational properties of optical systems consisting of confocal surfaces

J. Opt. Technol. 72(2), 177-181 (2005)  View: PDF

The optical system of a very large telescope

J. Opt. Technol. 72(2), 182-185 (2005)  View: PDF

Prospects of using LEDs in the illuminating systems of microscopes

J. Opt. Technol. 72(2), 186-190 (2005)  View: PDF

Irradiance distribution formed by a light beam reflected from a flat retroreflective coating

J. Opt. Technol. 72(2), 191-195 (2005)  View: PDF

Producing holographic filters in the UV region 320-430 nm

J. Opt. Technol. 72(2), 196-198 (2005)  View: PDF

Implementing a linear predictor model by Fourier holography

J. Opt. Technol. 72(2), 199-202 (2005)  View: PDF

Holographic methods of three-dimensional visualization of microscopic phase objects

J. Opt. Technol. 72(2), 203-209 (2005)  View: PDF

The nature of photostimulated processes in As2Se3 layers used in fabricating the elements of diffraction optics

J. Opt. Technol. 72(2), 210-213 (2005)  View: PDF

Optical transparency of crystalline germanium

J. Opt. Technol. 72(2), 214-220 (2005)  View: PDF

Spirallike structure in the conoscopic figures of optically active crystals

J. Opt. Technol. 72(2), 221-222 (2005)  View: PDF

Features of the reflection of optical rays from a plane-parallel crystalline plate

J. Opt. Technol. 72(2), 223-224 (2005)  View: PDF

An ellipsometric method for measuring the parameters of thin magnetic films

J. Opt. Technol. 72(2), 225-226 (2005)  View: PDF

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