OSA Publishing

1 February 2002, Volume 69, Issue 2, pp. 67-136   17 articles

Identifying the by-products on the surface of porous GaAs and GaSb semiconductors by Raman scattering

J. Opt. Technol. 69(2), 67- (2002)  View: PDF

Experimental study of the reflectance of two-dimensional metal surfaces with a random roughness distribution

J. Opt. Technol. 69(2), 71- (2002)  View: PDF

Low-threshold limitation of IR radiation in impurity semiconductors

J. Opt. Technol. 69(2), 77- (2002)  View: PDF

Apochromat-objectives without crystals

J. Opt. Technol. 69(2), 82- (2002)  View: PDF

Multispectral antireflection coatings for the IR region

J. Opt. Technol. 69(2), 86- (2002)  View: PDF

Calculating the ray path in an axially symmetric graded-index medium

J. Opt. Technol. 69(2), 88- (2002)  View: PDF

Instantaneous holography with spraying of the developer

J. Opt. Technol. 69(2), 92- (2002)  View: PDF

Experience in producing holograms

J. Opt. Technol. 69(2), 95- (2002)  View: PDF

Using optical nondestructive-test methods to determine the shape and stress of a three-dimensional object

J. Opt. Technol. 69(2), 98- (2002)  View: PDF

A cryo-objective for IR astronomy

J. Opt. Technol. 69(2), 102- (2002)  View: PDF

Thermal-vision method for the remote monitoring of payloads

J. Opt. Technol. 69(2), 107- (2002)  View: PDF

Interferogram-processing software for technological purposes

J. Opt. Technol. 69(2), 111- (2002)  View: PDF

Contact-remote method for monitoring the temperature of a melt

J. Opt. Technol. 69(2), 116- (2002)  View: PDF

Measuring the roughness of high-precision quartz substrates and laser mirrors by angle-resolved scattering

J. Opt. Technol. 69(2), 125- (2002)  View: PDF

Diffraction methods for monitoring the geometrical parameters and spatial position of objects

J. Opt. Technol. 69(2), 129- (2002)  View: PDF

Aleksei Vladimirovich Sechkarev (on his seventy-fifth birthday)

J. Opt. Technol. 69(2), 135- (2002)  View: PDF

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