Abstract

We propose a technique for interpretation of atomic-force microscope images in the structural analysis of nanocrystals formed by precipitation from solution. This technique includes comparison with a simple model describing the random distribution of nanocrystals on a surface. The results obtained are compared to experimental data for purposes of determining the surface density of nanocrystals, both in the case where the nanocrystals are distributed in multiple layers to determine how the surface structure is organized and in the case where isolated nanocrystals are randomly distributed over the surface.

© 2016 Optical Society of America

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