Abstract

The present work aims at the characterization of antireflection coating (ARC) films in the visible spectrum. Up to five layers of antireflection coating film were designed and simulated, and optical reflection values were deduced with a transfer matrix method (TMM) formulation. Six materials including nanoporous material have been selected to investigate the optimum values of the ARC film for solar cells. The present work has been carried out to investigate the optimum values of reflectance as a function of wavelength in the visible region. The reflectance has been reduced from 32% of the silicon surface to less than 1% using multilayer ARC film. It has been observed that by increasing the number of layers the average reflectance decreases over a broad range of the visible spectrum.

© 2016 Optical Society of America

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