Abstract

This paper gives the results of experimental studies of the spread function and practical resolving power of a digital spectrograph based on an MFS-8 spectral device and an MAES linear photodiode array. It is established that, as the width of the spectrograph’s exit slit increases from 3 to 100 μm, the spread function remains bell-shaped, with the maximum in the middle. The recorded spectral lines become narrower than the entrance slit as it increases above 15–30 μm. The experimental values of the practical resolving power monotonically increase as the slit width decreases from 90 to 10 μm, and then remain constant for 6 and 3 μm.

© 2014 Optical Society of America

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  1. I. R.  Shelpakova, V. G.  Garanin, V. A.  Labusov, “Multielement solid-state detectors and their use in atomic-emission analysis (Review),” Zavod. Lab. Diag. Mat. 65, No. 10, 3 (1999).
  2. V. A.  Labusov, A. N.  Put’makov, I. A.  Zarubin, V. G.  Garanin, “New multichannel optical spectrometers based on MAES analyzers,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 7 (2012).
  3. V. G.  Garanin, O. A.  Neklyudov, D. V.  Petrochenko, Z. V.  Semenov, I. G.  Shatalov, S. V.  Pankratov, “Software for atomic-emission spectral analysis,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 69 (2012).
  4. S. B.  Zayakina, A. N.  Put’makov, G. N.  Anoshin, “Modernization of the DFS-458 diffraction spectrograph: extending the possibilities of atomic-emission spectral analysis,” Analit. Kont. 9, 212 (2005).
  5. O. D.  Vernidub, G. E.  Lomakina, “Analysis of the materials of ferrous metallurgy by atomic emission with the inductively-coupled plasma method using MAES,” Zavod. Lab. Diag. Mat. 73, 54 (2007), special issue.
  6. N. L.  Chumakova, E. V.  Smirnova, “Determination of lanthanum, cerium, neodymium, ytterbium, and yttrium in geological samples, using a multichannel analyzer of atomic-emission spectra,” Zavod. Lab. Diag. Mat. 76, No. 3, 3 (2010).
  7. A. É.  Kokhanovskiĭ, “Using an MAES analyzer to identify kinds of resin mixtures,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 98 (2012).
  8. I. V.  Peĭsakhson, The Optics of Spectral Devices (Mashinostroenie, Leningrad, 1975).
  9. A. N.  Zaĭdel’, G. V.  Ostrovskaya, Yu. I.  Ostrovskiĭ, Technique and Practice of Spectroscopy (Nauka, Moscow, 1976).
  10. V. A.  Labusov, V. G.  Garanin, I. R.  Shelpakova, “Multichannel analyzers of atomic-emission spectra. Modern status and analytical possibilities,” Z. Anal. Khim. 67, 697 (2012).
  11. D. S.  Rozhdestvenskiĭ, “Coherent and incoherent rays when an image is formed in a microscope,” Zh. Eksp. Teor. Fiz. 10, 305 (1940).
  12. I. M.  Nagibina, V. K.  Prokof’ev, Spectral Devices and the Technique of Spectroscopy (GNTIML, Moscow, 1963).
  13. K. D.  Mielenz, “Spectroscope slit images in partially coherent light,” J. Opt. Soc. Am. A 57, 66 (1967).
    [CrossRef]
  14. A.  Roseler, “Die Apparatefunktion von Einfachmonochromatoren bei teilkoherenter Beleuchtung des Eintrittspaltes,” Optik 27, 179 (1968).
  15. Yu. A.  Tolmachev, New Spectral Devices. Principles of Operation, S. É.  Frish, ed. (Izd. Leningr. Univ., Leningrad, 1976).
  16. I. V.  Peĭsakhson, “Calculating the instrumental functions of real spectral devices for partially coherent illumination of the slit,” Opt. Zh. 64, No. 6, 87 (1997) [J. Opt. Technol. 64, 580 (1997)].

2012 (4)

V. A.  Labusov, A. N.  Put’makov, I. A.  Zarubin, V. G.  Garanin, “New multichannel optical spectrometers based on MAES analyzers,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 7 (2012).

V. G.  Garanin, O. A.  Neklyudov, D. V.  Petrochenko, Z. V.  Semenov, I. G.  Shatalov, S. V.  Pankratov, “Software for atomic-emission spectral analysis,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 69 (2012).

A. É.  Kokhanovskiĭ, “Using an MAES analyzer to identify kinds of resin mixtures,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 98 (2012).

V. A.  Labusov, V. G.  Garanin, I. R.  Shelpakova, “Multichannel analyzers of atomic-emission spectra. Modern status and analytical possibilities,” Z. Anal. Khim. 67, 697 (2012).

2010 (1)

N. L.  Chumakova, E. V.  Smirnova, “Determination of lanthanum, cerium, neodymium, ytterbium, and yttrium in geological samples, using a multichannel analyzer of atomic-emission spectra,” Zavod. Lab. Diag. Mat. 76, No. 3, 3 (2010).

2007 (1)

O. D.  Vernidub, G. E.  Lomakina, “Analysis of the materials of ferrous metallurgy by atomic emission with the inductively-coupled plasma method using MAES,” Zavod. Lab. Diag. Mat. 73, 54 (2007), special issue.

2005 (1)

S. B.  Zayakina, A. N.  Put’makov, G. N.  Anoshin, “Modernization of the DFS-458 diffraction spectrograph: extending the possibilities of atomic-emission spectral analysis,” Analit. Kont. 9, 212 (2005).

1999 (1)

I. R.  Shelpakova, V. G.  Garanin, V. A.  Labusov, “Multielement solid-state detectors and their use in atomic-emission analysis (Review),” Zavod. Lab. Diag. Mat. 65, No. 10, 3 (1999).

1997 (1)

I. V.  Peĭsakhson, “Calculating the instrumental functions of real spectral devices for partially coherent illumination of the slit,” Opt. Zh. 64, No. 6, 87 (1997) [J. Opt. Technol. 64, 580 (1997)].

1968 (1)

A.  Roseler, “Die Apparatefunktion von Einfachmonochromatoren bei teilkoherenter Beleuchtung des Eintrittspaltes,” Optik 27, 179 (1968).

1967 (1)

K. D.  Mielenz, “Spectroscope slit images in partially coherent light,” J. Opt. Soc. Am. A 57, 66 (1967).
[CrossRef]

1940 (1)

D. S.  Rozhdestvenskiĭ, “Coherent and incoherent rays when an image is formed in a microscope,” Zh. Eksp. Teor. Fiz. 10, 305 (1940).

Anoshin, G. N.

S. B.  Zayakina, A. N.  Put’makov, G. N.  Anoshin, “Modernization of the DFS-458 diffraction spectrograph: extending the possibilities of atomic-emission spectral analysis,” Analit. Kont. 9, 212 (2005).

Chumakova, N. L.

N. L.  Chumakova, E. V.  Smirnova, “Determination of lanthanum, cerium, neodymium, ytterbium, and yttrium in geological samples, using a multichannel analyzer of atomic-emission spectra,” Zavod. Lab. Diag. Mat. 76, No. 3, 3 (2010).

Garanin, V. G.

V. A.  Labusov, V. G.  Garanin, I. R.  Shelpakova, “Multichannel analyzers of atomic-emission spectra. Modern status and analytical possibilities,” Z. Anal. Khim. 67, 697 (2012).

V. A.  Labusov, A. N.  Put’makov, I. A.  Zarubin, V. G.  Garanin, “New multichannel optical spectrometers based on MAES analyzers,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 7 (2012).

V. G.  Garanin, O. A.  Neklyudov, D. V.  Petrochenko, Z. V.  Semenov, I. G.  Shatalov, S. V.  Pankratov, “Software for atomic-emission spectral analysis,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 69 (2012).

I. R.  Shelpakova, V. G.  Garanin, V. A.  Labusov, “Multielement solid-state detectors and their use in atomic-emission analysis (Review),” Zavod. Lab. Diag. Mat. 65, No. 10, 3 (1999).

Kokhanovskii, A. É.

A. É.  Kokhanovskiĭ, “Using an MAES analyzer to identify kinds of resin mixtures,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 98 (2012).

Labusov, V. A.

V. A.  Labusov, A. N.  Put’makov, I. A.  Zarubin, V. G.  Garanin, “New multichannel optical spectrometers based on MAES analyzers,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 7 (2012).

V. A.  Labusov, V. G.  Garanin, I. R.  Shelpakova, “Multichannel analyzers of atomic-emission spectra. Modern status and analytical possibilities,” Z. Anal. Khim. 67, 697 (2012).

I. R.  Shelpakova, V. G.  Garanin, V. A.  Labusov, “Multielement solid-state detectors and their use in atomic-emission analysis (Review),” Zavod. Lab. Diag. Mat. 65, No. 10, 3 (1999).

Lomakina, G. E.

O. D.  Vernidub, G. E.  Lomakina, “Analysis of the materials of ferrous metallurgy by atomic emission with the inductively-coupled plasma method using MAES,” Zavod. Lab. Diag. Mat. 73, 54 (2007), special issue.

Mielenz, K. D.

K. D.  Mielenz, “Spectroscope slit images in partially coherent light,” J. Opt. Soc. Am. A 57, 66 (1967).
[CrossRef]

Nagibina, I. M.

I. M.  Nagibina, V. K.  Prokof’ev, Spectral Devices and the Technique of Spectroscopy (GNTIML, Moscow, 1963).

Neklyudov, O. A.

V. G.  Garanin, O. A.  Neklyudov, D. V.  Petrochenko, Z. V.  Semenov, I. G.  Shatalov, S. V.  Pankratov, “Software for atomic-emission spectral analysis,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 69 (2012).

Ostrovskaya, G. V.

A. N.  Zaĭdel’, G. V.  Ostrovskaya, Yu. I.  Ostrovskiĭ, Technique and Practice of Spectroscopy (Nauka, Moscow, 1976).

Ostrovskii, Yu. I.

A. N.  Zaĭdel’, G. V.  Ostrovskaya, Yu. I.  Ostrovskiĭ, Technique and Practice of Spectroscopy (Nauka, Moscow, 1976).

Pankratov, S. V.

V. G.  Garanin, O. A.  Neklyudov, D. V.  Petrochenko, Z. V.  Semenov, I. G.  Shatalov, S. V.  Pankratov, “Software for atomic-emission spectral analysis,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 69 (2012).

Peisakhson, I. V.

I. V.  Peĭsakhson, “Calculating the instrumental functions of real spectral devices for partially coherent illumination of the slit,” Opt. Zh. 64, No. 6, 87 (1997) [J. Opt. Technol. 64, 580 (1997)].

I. V.  Peĭsakhson, The Optics of Spectral Devices (Mashinostroenie, Leningrad, 1975).

Petrochenko, D. V.

V. G.  Garanin, O. A.  Neklyudov, D. V.  Petrochenko, Z. V.  Semenov, I. G.  Shatalov, S. V.  Pankratov, “Software for atomic-emission spectral analysis,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 69 (2012).

Prokof’ev, V. K.

I. M.  Nagibina, V. K.  Prokof’ev, Spectral Devices and the Technique of Spectroscopy (GNTIML, Moscow, 1963).

Put’makov, A. N.

V. A.  Labusov, A. N.  Put’makov, I. A.  Zarubin, V. G.  Garanin, “New multichannel optical spectrometers based on MAES analyzers,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 7 (2012).

S. B.  Zayakina, A. N.  Put’makov, G. N.  Anoshin, “Modernization of the DFS-458 diffraction spectrograph: extending the possibilities of atomic-emission spectral analysis,” Analit. Kont. 9, 212 (2005).

Roseler, A.

A.  Roseler, “Die Apparatefunktion von Einfachmonochromatoren bei teilkoherenter Beleuchtung des Eintrittspaltes,” Optik 27, 179 (1968).

Rozhdestvenskii, D. S.

D. S.  Rozhdestvenskiĭ, “Coherent and incoherent rays when an image is formed in a microscope,” Zh. Eksp. Teor. Fiz. 10, 305 (1940).

Semenov, Z. V.

V. G.  Garanin, O. A.  Neklyudov, D. V.  Petrochenko, Z. V.  Semenov, I. G.  Shatalov, S. V.  Pankratov, “Software for atomic-emission spectral analysis,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 69 (2012).

Shatalov, I. G.

V. G.  Garanin, O. A.  Neklyudov, D. V.  Petrochenko, Z. V.  Semenov, I. G.  Shatalov, S. V.  Pankratov, “Software for atomic-emission spectral analysis,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 69 (2012).

Shelpakova, I. R.

V. A.  Labusov, V. G.  Garanin, I. R.  Shelpakova, “Multichannel analyzers of atomic-emission spectra. Modern status and analytical possibilities,” Z. Anal. Khim. 67, 697 (2012).

I. R.  Shelpakova, V. G.  Garanin, V. A.  Labusov, “Multielement solid-state detectors and their use in atomic-emission analysis (Review),” Zavod. Lab. Diag. Mat. 65, No. 10, 3 (1999).

Smirnova, E. V.

N. L.  Chumakova, E. V.  Smirnova, “Determination of lanthanum, cerium, neodymium, ytterbium, and yttrium in geological samples, using a multichannel analyzer of atomic-emission spectra,” Zavod. Lab. Diag. Mat. 76, No. 3, 3 (2010).

Tolmachev, Yu. A.

Yu. A.  Tolmachev, New Spectral Devices. Principles of Operation, S. É.  Frish, ed. (Izd. Leningr. Univ., Leningrad, 1976).

Vernidub, O. D.

O. D.  Vernidub, G. E.  Lomakina, “Analysis of the materials of ferrous metallurgy by atomic emission with the inductively-coupled plasma method using MAES,” Zavod. Lab. Diag. Mat. 73, 54 (2007), special issue.

Zaidel’, A. N.

A. N.  Zaĭdel’, G. V.  Ostrovskaya, Yu. I.  Ostrovskiĭ, Technique and Practice of Spectroscopy (Nauka, Moscow, 1976).

Zarubin, I. A.

V. A.  Labusov, A. N.  Put’makov, I. A.  Zarubin, V. G.  Garanin, “New multichannel optical spectrometers based on MAES analyzers,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 7 (2012).

Zayakina, S. B.

S. B.  Zayakina, A. N.  Put’makov, G. N.  Anoshin, “Modernization of the DFS-458 diffraction spectrograph: extending the possibilities of atomic-emission spectral analysis,” Analit. Kont. 9, 212 (2005).

Analit. Kont. (1)

S. B.  Zayakina, A. N.  Put’makov, G. N.  Anoshin, “Modernization of the DFS-458 diffraction spectrograph: extending the possibilities of atomic-emission spectral analysis,” Analit. Kont. 9, 212 (2005).

J. Opt. Soc. Am. A (1)

K. D.  Mielenz, “Spectroscope slit images in partially coherent light,” J. Opt. Soc. Am. A 57, 66 (1967).
[CrossRef]

Opt. Zh. (1)

I. V.  Peĭsakhson, “Calculating the instrumental functions of real spectral devices for partially coherent illumination of the slit,” Opt. Zh. 64, No. 6, 87 (1997) [J. Opt. Technol. 64, 580 (1997)].

Optik (1)

A.  Roseler, “Die Apparatefunktion von Einfachmonochromatoren bei teilkoherenter Beleuchtung des Eintrittspaltes,” Optik 27, 179 (1968).

Z. Anal. Khim. (1)

V. A.  Labusov, V. G.  Garanin, I. R.  Shelpakova, “Multichannel analyzers of atomic-emission spectra. Modern status and analytical possibilities,” Z. Anal. Khim. 67, 697 (2012).

Zavod. Lab. Diag. Mat. (6)

I. R.  Shelpakova, V. G.  Garanin, V. A.  Labusov, “Multielement solid-state detectors and their use in atomic-emission analysis (Review),” Zavod. Lab. Diag. Mat. 65, No. 10, 3 (1999).

V. A.  Labusov, A. N.  Put’makov, I. A.  Zarubin, V. G.  Garanin, “New multichannel optical spectrometers based on MAES analyzers,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 7 (2012).

V. G.  Garanin, O. A.  Neklyudov, D. V.  Petrochenko, Z. V.  Semenov, I. G.  Shatalov, S. V.  Pankratov, “Software for atomic-emission spectral analysis,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 69 (2012).

O. D.  Vernidub, G. E.  Lomakina, “Analysis of the materials of ferrous metallurgy by atomic emission with the inductively-coupled plasma method using MAES,” Zavod. Lab. Diag. Mat. 73, 54 (2007), special issue.

N. L.  Chumakova, E. V.  Smirnova, “Determination of lanthanum, cerium, neodymium, ytterbium, and yttrium in geological samples, using a multichannel analyzer of atomic-emission spectra,” Zavod. Lab. Diag. Mat. 76, No. 3, 3 (2010).

A. É.  Kokhanovskiĭ, “Using an MAES analyzer to identify kinds of resin mixtures,” Zavod. Lab. Diag. Mat. 78, No. 1, Part II, 98 (2012).

Zh. Eksp. Teor. Fiz. (1)

D. S.  Rozhdestvenskiĭ, “Coherent and incoherent rays when an image is formed in a microscope,” Zh. Eksp. Teor. Fiz. 10, 305 (1940).

Other (4)

I. M.  Nagibina, V. K.  Prokof’ev, Spectral Devices and the Technique of Spectroscopy (GNTIML, Moscow, 1963).

I. V.  Peĭsakhson, The Optics of Spectral Devices (Mashinostroenie, Leningrad, 1975).

A. N.  Zaĭdel’, G. V.  Ostrovskaya, Yu. I.  Ostrovskiĭ, Technique and Practice of Spectroscopy (Nauka, Moscow, 1976).

Yu. A.  Tolmachev, New Spectral Devices. Principles of Operation, S. É.  Frish, ed. (Izd. Leningr. Univ., Leningrad, 1976).

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