Abstract

It is established by ellipsometric measurements that the interaction process of a sheared surface of single-crystal cadmium telluride with atmospheric air has two stages. In the first 7–10 days, the character of the change of the measured ellipsometric parameters corresponds to the formation of an absorbing layer with a thickness of one or two monatomic layers. Beginning at 20 days, a transparent film appears, possibly an oxide, whose refractive index is close to 2.2, while the thickness increases to 5–6 nm in an oxidation time of up to 1 year. Starting from literature data, it is assumed that the inner film is a layer of free tellurium, while the outer film is formed by cadmium or tellurium oxides or a mixture of them.

© 2013 Optical Society of America

PDF Article

References

  • View by:
  • |
  • |
  • |

  1. M.  Hage-Ali, R.  Stuck, A. N.  Saxena, P.  Siffert, “Investigation of CdTe surface by mass-spectroscopic, ellipsometric method,” Appl. Phys. 19, 25 (1979).
    [CrossRef]
  2. J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
    [CrossRef]
  3. J.  Kowalski, B. A.  Orlowski, J.  Ghijsen, “Oxide formation on the CdTe(111)A (1×1) surface,” Appl. Surf. Sci. 166, 237 (2000).
    [CrossRef]
  4. M.  Suita, T.  Taguchi, “Thermal oxidation of CdTe surfaces and properties of MOS diodes,” Nucl. Instrum. Methods Phys. Res. A 283, 268 (1989).
    [CrossRef]
  5. G. A.  Il’chuk, V. I.  Ivanov-Omskiĭ, V. Yu.  Rud’, Yu. V.  Rud’, R. N.  Bekimbetov, N. A.  Ukrainets, “Fabrication and photoelectric properties of oxide/CdTe structures,” Fiz. Tekh. Poluprovodn. 34, 1099 (2000) [Semiconductors 34, 1058 (2000)].
  6. T.  Aoki, V. A.  Gnatyuk, V. A.  Odarych, L. V.  Poperenko, O. O.  Fedosenko, “CdTe samples properties by ellipsometric analysis,” in Proceedings of the Seventh International Conference on Global Research and Education in New Methods in Education, Pech, Hungary, 2008, pp. 468–474.
  7. L. V.  Poperenko, V. A.  Gnatyuk, V. A.  Odarych, T.  Aoki, “Ellipsometric study of the surface of CdTe (111) crystals,” in Proceedings of International Workshop on Field Emitter and Semiconductor Materials and Devices, Research Institute of Electronics, Shzuooka University, 2010, pp. 15–19.
  8. A. Z.  Evmenova, V. A.  Odarich, “Elipsometrichni doslidzhennya prirodnoi okisnoi plivki na poverkhni skolu monokristalichnogo teluridu kadmiyu,” in Materiali elektronnoi tekhniki ta suchasni Informatsiĭni tekhnologii. Tretya mizhnarodna naukovo-praktichna konferentsiya, Kremenchuk, Ukraine, 2008, pp. 121–122.
  9. A. Z.  Evmenova, V. A.  Odarich, “Osoblivosti formuvannya prirodnoi okisnoi plivki na teluridi kadmiyu,” in 12th International Conference on Physics and Technology of Thin Films and Nanosystems, Ivanofrankivsk, Ukraine, 2009, vol. 2, pp. 174–175.
  10. V. A.  Makara, V. A.  Odarich, T. Yu.  Kepich, T. D.  Preobrazhenskaya, O. V.  Rudenko, “Device and methods for measuring the parameters and the degree of homogeneity of thin-film structures,” Tekhnol. Konstruir. Élektron. Appl. No. 3(81), 40 (2009).
  11. A.  Sadao, K.  Toshifumi, S.  Norihiro, “Optical properties of CdTe: experiment and modeling,” J. Appl. Phys. 74, 3435 (1993).
    [CrossRef]
  12. A. Z.  Evmenova, V. A.  Odarych, F. F.  Sizov, M. V.  Vuichyk, “Absorptive CdTe-films optical parameters and film thickness determination by ellipsometric method,” Opt. Appl. 38, 585 (2008).
  13. D. N.  Bose, S.  Basu, K. C.  Mandal, “Characterization of chemically modified CdTe surfaces,” Thin Solid Films 164, 13 (1988).
    [CrossRef]
  14. E. D.  Palik, ed., Handbook of Optical Constants of Solids (Academic, New York, 1991).
  15. R.  Miotto, F. D.  Kiss, A. C.  Ferraz, “Oxygen adsorption on CdTe (111),” Surf. Sci. 525, 24 (2003).
    [CrossRef]
  16. F. D.  Kiss, A. C.  Ferraz, “The oxidation mechanism of CdTe (111) surface,” Braz. J. Phys. 36, 291 (2006).
    [CrossRef]
  17. Physical and Chemical Properties of Oxides. A Handbook (Metallurgiya, Moscow, 1978).
  18. A. E.  Vol, I. K.  Kagan, Structure and Properties of Binary Metallic Systems (Nauka, Moscow, 1979), vol. 4.
  19. K.  Arshak, O.  Korostynska, “Gamma radiation dosimetry using tellurium dioxide thin films structures,” Sensors 2, 347 (2002).
    [CrossRef]
  20. C.  Dantus, G. G.  Rusu, M.  Dobromir, M.  Rusu, “Preparation and characterization of CdO thin films obtained by thermal oxidation of evaporated Cd thin films,” Appl. Surf. Sci. 255, 2665 (2008).
    [CrossRef]
  21. S. G.  Choi, J.  Zuñiga-Pérez, V.  Muñoz-Sanjosé, A. G.  Norman, C. L.  Perkins, D. H.  Levi, “Complex dielectric function and refractive-index spectra of epitaxial CdO thin film grown on r-plane sapphire from 0.74 to 6.45 eV,” J. Vac. Sci. Technol. B 28, 1120 (2010).
    [CrossRef]

2010

S. G.  Choi, J.  Zuñiga-Pérez, V.  Muñoz-Sanjosé, A. G.  Norman, C. L.  Perkins, D. H.  Levi, “Complex dielectric function and refractive-index spectra of epitaxial CdO thin film grown on r-plane sapphire from 0.74 to 6.45 eV,” J. Vac. Sci. Technol. B 28, 1120 (2010).
[CrossRef]

2009

V. A.  Makara, V. A.  Odarich, T. Yu.  Kepich, T. D.  Preobrazhenskaya, O. V.  Rudenko, “Device and methods for measuring the parameters and the degree of homogeneity of thin-film structures,” Tekhnol. Konstruir. Élektron. Appl. No. 3(81), 40 (2009).

2008

A. Z.  Evmenova, V. A.  Odarych, F. F.  Sizov, M. V.  Vuichyk, “Absorptive CdTe-films optical parameters and film thickness determination by ellipsometric method,” Opt. Appl. 38, 585 (2008).

C.  Dantus, G. G.  Rusu, M.  Dobromir, M.  Rusu, “Preparation and characterization of CdO thin films obtained by thermal oxidation of evaporated Cd thin films,” Appl. Surf. Sci. 255, 2665 (2008).
[CrossRef]

2006

F. D.  Kiss, A. C.  Ferraz, “The oxidation mechanism of CdTe (111) surface,” Braz. J. Phys. 36, 291 (2006).
[CrossRef]

2003

R.  Miotto, F. D.  Kiss, A. C.  Ferraz, “Oxygen adsorption on CdTe (111),” Surf. Sci. 525, 24 (2003).
[CrossRef]

2002

K.  Arshak, O.  Korostynska, “Gamma radiation dosimetry using tellurium dioxide thin films structures,” Sensors 2, 347 (2002).
[CrossRef]

2001

J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
[CrossRef]

2000

J.  Kowalski, B. A.  Orlowski, J.  Ghijsen, “Oxide formation on the CdTe(111)A (1×1) surface,” Appl. Surf. Sci. 166, 237 (2000).
[CrossRef]

G. A.  Il’chuk, V. I.  Ivanov-Omskiĭ, V. Yu.  Rud’, Yu. V.  Rud’, R. N.  Bekimbetov, N. A.  Ukrainets, “Fabrication and photoelectric properties of oxide/CdTe structures,” Fiz. Tekh. Poluprovodn. 34, 1099 (2000) [Semiconductors 34, 1058 (2000)].

1993

A.  Sadao, K.  Toshifumi, S.  Norihiro, “Optical properties of CdTe: experiment and modeling,” J. Appl. Phys. 74, 3435 (1993).
[CrossRef]

1989

M.  Suita, T.  Taguchi, “Thermal oxidation of CdTe surfaces and properties of MOS diodes,” Nucl. Instrum. Methods Phys. Res. A 283, 268 (1989).
[CrossRef]

1988

D. N.  Bose, S.  Basu, K. C.  Mandal, “Characterization of chemically modified CdTe surfaces,” Thin Solid Films 164, 13 (1988).
[CrossRef]

1979

M.  Hage-Ali, R.  Stuck, A. N.  Saxena, P.  Siffert, “Investigation of CdTe surface by mass-spectroscopic, ellipsometric method,” Appl. Phys. 19, 25 (1979).
[CrossRef]

Aoki, T.

T.  Aoki, V. A.  Gnatyuk, V. A.  Odarych, L. V.  Poperenko, O. O.  Fedosenko, “CdTe samples properties by ellipsometric analysis,” in Proceedings of the Seventh International Conference on Global Research and Education in New Methods in Education, Pech, Hungary, 2008, pp. 468–474.

L. V.  Poperenko, V. A.  Gnatyuk, V. A.  Odarych, T.  Aoki, “Ellipsometric study of the surface of CdTe (111) crystals,” in Proceedings of International Workshop on Field Emitter and Semiconductor Materials and Devices, Research Institute of Electronics, Shzuooka University, 2010, pp. 15–19.

Arshak, K.

K.  Arshak, O.  Korostynska, “Gamma radiation dosimetry using tellurium dioxide thin films structures,” Sensors 2, 347 (2002).
[CrossRef]

Basu, S.

D. N.  Bose, S.  Basu, K. C.  Mandal, “Characterization of chemically modified CdTe surfaces,” Thin Solid Films 164, 13 (1988).
[CrossRef]

Bekimbetov, R. N.

G. A.  Il’chuk, V. I.  Ivanov-Omskiĭ, V. Yu.  Rud’, Yu. V.  Rud’, R. N.  Bekimbetov, N. A.  Ukrainets, “Fabrication and photoelectric properties of oxide/CdTe structures,” Fiz. Tekh. Poluprovodn. 34, 1099 (2000) [Semiconductors 34, 1058 (2000)].

Bonnet, D.

J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
[CrossRef]

Bose, D. N.

D. N.  Bose, S.  Basu, K. C.  Mandal, “Characterization of chemically modified CdTe surfaces,” Thin Solid Films 164, 13 (1988).
[CrossRef]

Choi, S. G.

S. G.  Choi, J.  Zuñiga-Pérez, V.  Muñoz-Sanjosé, A. G.  Norman, C. L.  Perkins, D. H.  Levi, “Complex dielectric function and refractive-index spectra of epitaxial CdO thin film grown on r-plane sapphire from 0.74 to 6.45 eV,” J. Vac. Sci. Technol. B 28, 1120 (2010).
[CrossRef]

Dantus, C.

C.  Dantus, G. G.  Rusu, M.  Dobromir, M.  Rusu, “Preparation and characterization of CdO thin films obtained by thermal oxidation of evaporated Cd thin films,” Appl. Surf. Sci. 255, 2665 (2008).
[CrossRef]

Dobromir, M.

C.  Dantus, G. G.  Rusu, M.  Dobromir, M.  Rusu, “Preparation and characterization of CdO thin films obtained by thermal oxidation of evaporated Cd thin films,” Appl. Surf. Sci. 255, 2665 (2008).
[CrossRef]

Evmenova, A. Z.

A. Z.  Evmenova, V. A.  Odarych, F. F.  Sizov, M. V.  Vuichyk, “Absorptive CdTe-films optical parameters and film thickness determination by ellipsometric method,” Opt. Appl. 38, 585 (2008).

A. Z.  Evmenova, V. A.  Odarich, “Elipsometrichni doslidzhennya prirodnoi okisnoi plivki na poverkhni skolu monokristalichnogo teluridu kadmiyu,” in Materiali elektronnoi tekhniki ta suchasni Informatsiĭni tekhnologii. Tretya mizhnarodna naukovo-praktichna konferentsiya, Kremenchuk, Ukraine, 2008, pp. 121–122.

A. Z.  Evmenova, V. A.  Odarich, “Osoblivosti formuvannya prirodnoi okisnoi plivki na teluridi kadmiyu,” in 12th International Conference on Physics and Technology of Thin Films and Nanosystems, Ivanofrankivsk, Ukraine, 2009, vol. 2, pp. 174–175.

Fedosenko, O. O.

T.  Aoki, V. A.  Gnatyuk, V. A.  Odarych, L. V.  Poperenko, O. O.  Fedosenko, “CdTe samples properties by ellipsometric analysis,” in Proceedings of the Seventh International Conference on Global Research and Education in New Methods in Education, Pech, Hungary, 2008, pp. 468–474.

Ferraz, A. C.

F. D.  Kiss, A. C.  Ferraz, “The oxidation mechanism of CdTe (111) surface,” Braz. J. Phys. 36, 291 (2006).
[CrossRef]

R.  Miotto, F. D.  Kiss, A. C.  Ferraz, “Oxygen adsorption on CdTe (111),” Surf. Sci. 525, 24 (2003).
[CrossRef]

Fritsche, J.

J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
[CrossRef]

Gegenwart, R.

J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
[CrossRef]

Ghijsen, J.

J.  Kowalski, B. A.  Orlowski, J.  Ghijsen, “Oxide formation on the CdTe(111)A (1×1) surface,” Appl. Surf. Sci. 166, 237 (2000).
[CrossRef]

Gnatyuk, V. A.

L. V.  Poperenko, V. A.  Gnatyuk, V. A.  Odarych, T.  Aoki, “Ellipsometric study of the surface of CdTe (111) crystals,” in Proceedings of International Workshop on Field Emitter and Semiconductor Materials and Devices, Research Institute of Electronics, Shzuooka University, 2010, pp. 15–19.

T.  Aoki, V. A.  Gnatyuk, V. A.  Odarych, L. V.  Poperenko, O. O.  Fedosenko, “CdTe samples properties by ellipsometric analysis,” in Proceedings of the Seventh International Conference on Global Research and Education in New Methods in Education, Pech, Hungary, 2008, pp. 468–474.

Golusda, E.

J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
[CrossRef]

Gunst, S.

J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
[CrossRef]

Hage-Ali, M.

M.  Hage-Ali, R.  Stuck, A. N.  Saxena, P.  Siffert, “Investigation of CdTe surface by mass-spectroscopic, ellipsometric method,” Appl. Phys. 19, 25 (1979).
[CrossRef]

Il’chuk, G. A.

G. A.  Il’chuk, V. I.  Ivanov-Omskiĭ, V. Yu.  Rud’, Yu. V.  Rud’, R. N.  Bekimbetov, N. A.  Ukrainets, “Fabrication and photoelectric properties of oxide/CdTe structures,” Fiz. Tekh. Poluprovodn. 34, 1099 (2000) [Semiconductors 34, 1058 (2000)].

Ivanov-Omskii, V. I.

G. A.  Il’chuk, V. I.  Ivanov-Omskiĭ, V. Yu.  Rud’, Yu. V.  Rud’, R. N.  Bekimbetov, N. A.  Ukrainets, “Fabrication and photoelectric properties of oxide/CdTe structures,” Fiz. Tekh. Poluprovodn. 34, 1099 (2000) [Semiconductors 34, 1058 (2000)].

Jaegermann, W.

J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
[CrossRef]

Kagan, I. K.

A. E.  Vol, I. K.  Kagan, Structure and Properties of Binary Metallic Systems (Nauka, Moscow, 1979), vol. 4.

Kepich, T. Yu.

V. A.  Makara, V. A.  Odarich, T. Yu.  Kepich, T. D.  Preobrazhenskaya, O. V.  Rudenko, “Device and methods for measuring the parameters and the degree of homogeneity of thin-film structures,” Tekhnol. Konstruir. Élektron. Appl. No. 3(81), 40 (2009).

Kiss, F. D.

F. D.  Kiss, A. C.  Ferraz, “The oxidation mechanism of CdTe (111) surface,” Braz. J. Phys. 36, 291 (2006).
[CrossRef]

R.  Miotto, F. D.  Kiss, A. C.  Ferraz, “Oxygen adsorption on CdTe (111),” Surf. Sci. 525, 24 (2003).
[CrossRef]

Klein, A.

J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
[CrossRef]

Korostynska, O.

K.  Arshak, O.  Korostynska, “Gamma radiation dosimetry using tellurium dioxide thin films structures,” Sensors 2, 347 (2002).
[CrossRef]

Kowalski, J.

J.  Kowalski, B. A.  Orlowski, J.  Ghijsen, “Oxide formation on the CdTe(111)A (1×1) surface,” Appl. Surf. Sci. 166, 237 (2000).
[CrossRef]

Lejard, M. C.

J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
[CrossRef]

Levi, D. H.

S. G.  Choi, J.  Zuñiga-Pérez, V.  Muñoz-Sanjosé, A. G.  Norman, C. L.  Perkins, D. H.  Levi, “Complex dielectric function and refractive-index spectra of epitaxial CdO thin film grown on r-plane sapphire from 0.74 to 6.45 eV,” J. Vac. Sci. Technol. B 28, 1120 (2010).
[CrossRef]

Makara, V. A.

V. A.  Makara, V. A.  Odarich, T. Yu.  Kepich, T. D.  Preobrazhenskaya, O. V.  Rudenko, “Device and methods for measuring the parameters and the degree of homogeneity of thin-film structures,” Tekhnol. Konstruir. Élektron. Appl. No. 3(81), 40 (2009).

Mandal, K. C.

D. N.  Bose, S.  Basu, K. C.  Mandal, “Characterization of chemically modified CdTe surfaces,” Thin Solid Films 164, 13 (1988).
[CrossRef]

Mayer, T.

J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
[CrossRef]

Miotto, R.

R.  Miotto, F. D.  Kiss, A. C.  Ferraz, “Oxygen adsorption on CdTe (111),” Surf. Sci. 525, 24 (2003).
[CrossRef]

Muñoz-Sanjosé, V.

S. G.  Choi, J.  Zuñiga-Pérez, V.  Muñoz-Sanjosé, A. G.  Norman, C. L.  Perkins, D. H.  Levi, “Complex dielectric function and refractive-index spectra of epitaxial CdO thin film grown on r-plane sapphire from 0.74 to 6.45 eV,” J. Vac. Sci. Technol. B 28, 1120 (2010).
[CrossRef]

Norihiro, S.

A.  Sadao, K.  Toshifumi, S.  Norihiro, “Optical properties of CdTe: experiment and modeling,” J. Appl. Phys. 74, 3435 (1993).
[CrossRef]

Norman, A. G.

S. G.  Choi, J.  Zuñiga-Pérez, V.  Muñoz-Sanjosé, A. G.  Norman, C. L.  Perkins, D. H.  Levi, “Complex dielectric function and refractive-index spectra of epitaxial CdO thin film grown on r-plane sapphire from 0.74 to 6.45 eV,” J. Vac. Sci. Technol. B 28, 1120 (2010).
[CrossRef]

Odarich, V. A.

V. A.  Makara, V. A.  Odarich, T. Yu.  Kepich, T. D.  Preobrazhenskaya, O. V.  Rudenko, “Device and methods for measuring the parameters and the degree of homogeneity of thin-film structures,” Tekhnol. Konstruir. Élektron. Appl. No. 3(81), 40 (2009).

A. Z.  Evmenova, V. A.  Odarich, “Osoblivosti formuvannya prirodnoi okisnoi plivki na teluridi kadmiyu,” in 12th International Conference on Physics and Technology of Thin Films and Nanosystems, Ivanofrankivsk, Ukraine, 2009, vol. 2, pp. 174–175.

A. Z.  Evmenova, V. A.  Odarich, “Elipsometrichni doslidzhennya prirodnoi okisnoi plivki na poverkhni skolu monokristalichnogo teluridu kadmiyu,” in Materiali elektronnoi tekhniki ta suchasni Informatsiĭni tekhnologii. Tretya mizhnarodna naukovo-praktichna konferentsiya, Kremenchuk, Ukraine, 2008, pp. 121–122.

Odarych, V. A.

A. Z.  Evmenova, V. A.  Odarych, F. F.  Sizov, M. V.  Vuichyk, “Absorptive CdTe-films optical parameters and film thickness determination by ellipsometric method,” Opt. Appl. 38, 585 (2008).

T.  Aoki, V. A.  Gnatyuk, V. A.  Odarych, L. V.  Poperenko, O. O.  Fedosenko, “CdTe samples properties by ellipsometric analysis,” in Proceedings of the Seventh International Conference on Global Research and Education in New Methods in Education, Pech, Hungary, 2008, pp. 468–474.

L. V.  Poperenko, V. A.  Gnatyuk, V. A.  Odarych, T.  Aoki, “Ellipsometric study of the surface of CdTe (111) crystals,” in Proceedings of International Workshop on Field Emitter and Semiconductor Materials and Devices, Research Institute of Electronics, Shzuooka University, 2010, pp. 15–19.

Orlowski, B. A.

J.  Kowalski, B. A.  Orlowski, J.  Ghijsen, “Oxide formation on the CdTe(111)A (1×1) surface,” Appl. Surf. Sci. 166, 237 (2000).
[CrossRef]

Perkins, C. L.

S. G.  Choi, J.  Zuñiga-Pérez, V.  Muñoz-Sanjosé, A. G.  Norman, C. L.  Perkins, D. H.  Levi, “Complex dielectric function and refractive-index spectra of epitaxial CdO thin film grown on r-plane sapphire from 0.74 to 6.45 eV,” J. Vac. Sci. Technol. B 28, 1120 (2010).
[CrossRef]

Poperenko, L. V.

L. V.  Poperenko, V. A.  Gnatyuk, V. A.  Odarych, T.  Aoki, “Ellipsometric study of the surface of CdTe (111) crystals,” in Proceedings of International Workshop on Field Emitter and Semiconductor Materials and Devices, Research Institute of Electronics, Shzuooka University, 2010, pp. 15–19.

T.  Aoki, V. A.  Gnatyuk, V. A.  Odarych, L. V.  Poperenko, O. O.  Fedosenko, “CdTe samples properties by ellipsometric analysis,” in Proceedings of the Seventh International Conference on Global Research and Education in New Methods in Education, Pech, Hungary, 2008, pp. 468–474.

Preobrazhenskaya, T. D.

V. A.  Makara, V. A.  Odarich, T. Yu.  Kepich, T. D.  Preobrazhenskaya, O. V.  Rudenko, “Device and methods for measuring the parameters and the degree of homogeneity of thin-film structures,” Tekhnol. Konstruir. Élektron. Appl. No. 3(81), 40 (2009).

Rud’, V. Yu.

G. A.  Il’chuk, V. I.  Ivanov-Omskiĭ, V. Yu.  Rud’, Yu. V.  Rud’, R. N.  Bekimbetov, N. A.  Ukrainets, “Fabrication and photoelectric properties of oxide/CdTe structures,” Fiz. Tekh. Poluprovodn. 34, 1099 (2000) [Semiconductors 34, 1058 (2000)].

Rud’, Yu. V.

G. A.  Il’chuk, V. I.  Ivanov-Omskiĭ, V. Yu.  Rud’, Yu. V.  Rud’, R. N.  Bekimbetov, N. A.  Ukrainets, “Fabrication and photoelectric properties of oxide/CdTe structures,” Fiz. Tekh. Poluprovodn. 34, 1099 (2000) [Semiconductors 34, 1058 (2000)].

Rudenko, O. V.

V. A.  Makara, V. A.  Odarich, T. Yu.  Kepich, T. D.  Preobrazhenskaya, O. V.  Rudenko, “Device and methods for measuring the parameters and the degree of homogeneity of thin-film structures,” Tekhnol. Konstruir. Élektron. Appl. No. 3(81), 40 (2009).

Rusu, G. G.

C.  Dantus, G. G.  Rusu, M.  Dobromir, M.  Rusu, “Preparation and characterization of CdO thin films obtained by thermal oxidation of evaporated Cd thin films,” Appl. Surf. Sci. 255, 2665 (2008).
[CrossRef]

Rusu, M.

C.  Dantus, G. G.  Rusu, M.  Dobromir, M.  Rusu, “Preparation and characterization of CdO thin films obtained by thermal oxidation of evaporated Cd thin films,” Appl. Surf. Sci. 255, 2665 (2008).
[CrossRef]

Sadao, A.

A.  Sadao, K.  Toshifumi, S.  Norihiro, “Optical properties of CdTe: experiment and modeling,” J. Appl. Phys. 74, 3435 (1993).
[CrossRef]

Saxena, A. N.

M.  Hage-Ali, R.  Stuck, A. N.  Saxena, P.  Siffert, “Investigation of CdTe surface by mass-spectroscopic, ellipsometric method,” Appl. Phys. 19, 25 (1979).
[CrossRef]

Siffert, P.

M.  Hage-Ali, R.  Stuck, A. N.  Saxena, P.  Siffert, “Investigation of CdTe surface by mass-spectroscopic, ellipsometric method,” Appl. Phys. 19, 25 (1979).
[CrossRef]

Sizov, F. F.

A. Z.  Evmenova, V. A.  Odarych, F. F.  Sizov, M. V.  Vuichyk, “Absorptive CdTe-films optical parameters and film thickness determination by ellipsometric method,” Opt. Appl. 38, 585 (2008).

Stuck, R.

M.  Hage-Ali, R.  Stuck, A. N.  Saxena, P.  Siffert, “Investigation of CdTe surface by mass-spectroscopic, ellipsometric method,” Appl. Phys. 19, 25 (1979).
[CrossRef]

Suita, M.

M.  Suita, T.  Taguchi, “Thermal oxidation of CdTe surfaces and properties of MOS diodes,” Nucl. Instrum. Methods Phys. Res. A 283, 268 (1989).
[CrossRef]

Taguchi, T.

M.  Suita, T.  Taguchi, “Thermal oxidation of CdTe surfaces and properties of MOS diodes,” Nucl. Instrum. Methods Phys. Res. A 283, 268 (1989).
[CrossRef]

Thiben, A.

J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
[CrossRef]

Toshifumi, K.

A.  Sadao, K.  Toshifumi, S.  Norihiro, “Optical properties of CdTe: experiment and modeling,” J. Appl. Phys. 74, 3435 (1993).
[CrossRef]

Ukrainets, N. A.

G. A.  Il’chuk, V. I.  Ivanov-Omskiĭ, V. Yu.  Rud’, Yu. V.  Rud’, R. N.  Bekimbetov, N. A.  Ukrainets, “Fabrication and photoelectric properties of oxide/CdTe structures,” Fiz. Tekh. Poluprovodn. 34, 1099 (2000) [Semiconductors 34, 1058 (2000)].

Vol, A. E.

A. E.  Vol, I. K.  Kagan, Structure and Properties of Binary Metallic Systems (Nauka, Moscow, 1979), vol. 4.

Vuichyk, M. V.

A. Z.  Evmenova, V. A.  Odarych, F. F.  Sizov, M. V.  Vuichyk, “Absorptive CdTe-films optical parameters and film thickness determination by ellipsometric method,” Opt. Appl. 38, 585 (2008).

Wendt, R.

J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
[CrossRef]

Zuñiga-Pérez, J.

S. G.  Choi, J.  Zuñiga-Pérez, V.  Muñoz-Sanjosé, A. G.  Norman, C. L.  Perkins, D. H.  Levi, “Complex dielectric function and refractive-index spectra of epitaxial CdO thin film grown on r-plane sapphire from 0.74 to 6.45 eV,” J. Vac. Sci. Technol. B 28, 1120 (2010).
[CrossRef]

Appl. Phys.

M.  Hage-Ali, R.  Stuck, A. N.  Saxena, P.  Siffert, “Investigation of CdTe surface by mass-spectroscopic, ellipsometric method,” Appl. Phys. 19, 25 (1979).
[CrossRef]

Appl. Surf. Sci.

J.  Kowalski, B. A.  Orlowski, J.  Ghijsen, “Oxide formation on the CdTe(111)A (1×1) surface,” Appl. Surf. Sci. 166, 237 (2000).
[CrossRef]

C.  Dantus, G. G.  Rusu, M.  Dobromir, M.  Rusu, “Preparation and characterization of CdO thin films obtained by thermal oxidation of evaporated Cd thin films,” Appl. Surf. Sci. 255, 2665 (2008).
[CrossRef]

Braz. J. Phys.

F. D.  Kiss, A. C.  Ferraz, “The oxidation mechanism of CdTe (111) surface,” Braz. J. Phys. 36, 291 (2006).
[CrossRef]

Fiz. Tekh. Poluprovodn.

G. A.  Il’chuk, V. I.  Ivanov-Omskiĭ, V. Yu.  Rud’, Yu. V.  Rud’, R. N.  Bekimbetov, N. A.  Ukrainets, “Fabrication and photoelectric properties of oxide/CdTe structures,” Fiz. Tekh. Poluprovodn. 34, 1099 (2000) [Semiconductors 34, 1058 (2000)].

J. Appl. Phys.

A.  Sadao, K.  Toshifumi, S.  Norihiro, “Optical properties of CdTe: experiment and modeling,” J. Appl. Phys. 74, 3435 (1993).
[CrossRef]

J. Vac. Sci. Technol. B

S. G.  Choi, J.  Zuñiga-Pérez, V.  Muñoz-Sanjosé, A. G.  Norman, C. L.  Perkins, D. H.  Levi, “Complex dielectric function and refractive-index spectra of epitaxial CdO thin film grown on r-plane sapphire from 0.74 to 6.45 eV,” J. Vac. Sci. Technol. B 28, 1120 (2010).
[CrossRef]

Nucl. Instrum. Methods Phys. Res. A

M.  Suita, T.  Taguchi, “Thermal oxidation of CdTe surfaces and properties of MOS diodes,” Nucl. Instrum. Methods Phys. Res. A 283, 268 (1989).
[CrossRef]

Opt. Appl.

A. Z.  Evmenova, V. A.  Odarych, F. F.  Sizov, M. V.  Vuichyk, “Absorptive CdTe-films optical parameters and film thickness determination by ellipsometric method,” Opt. Appl. 38, 585 (2008).

Sensors

K.  Arshak, O.  Korostynska, “Gamma radiation dosimetry using tellurium dioxide thin films structures,” Sensors 2, 347 (2002).
[CrossRef]

Surf. Sci.

R.  Miotto, F. D.  Kiss, A. C.  Ferraz, “Oxygen adsorption on CdTe (111),” Surf. Sci. 525, 24 (2003).
[CrossRef]

Tekhnol. Konstruir. Élektron. Appl.

V. A.  Makara, V. A.  Odarich, T. Yu.  Kepich, T. D.  Preobrazhenskaya, O. V.  Rudenko, “Device and methods for measuring the parameters and the degree of homogeneity of thin-film structures,” Tekhnol. Konstruir. Élektron. Appl. No. 3(81), 40 (2009).

Thin Solid Films

D. N.  Bose, S.  Basu, K. C.  Mandal, “Characterization of chemically modified CdTe surfaces,” Thin Solid Films 164, 13 (1988).
[CrossRef]

J.  Fritsche, S.  Gunst, E.  Golusda, M. C.  Lejard, A.  Thiben, T.  Mayer, A.  Klein, R.  Wendt, R.  Gegenwart, D.  Bonnet, W.  Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).
[CrossRef]

Other

T.  Aoki, V. A.  Gnatyuk, V. A.  Odarych, L. V.  Poperenko, O. O.  Fedosenko, “CdTe samples properties by ellipsometric analysis,” in Proceedings of the Seventh International Conference on Global Research and Education in New Methods in Education, Pech, Hungary, 2008, pp. 468–474.

L. V.  Poperenko, V. A.  Gnatyuk, V. A.  Odarych, T.  Aoki, “Ellipsometric study of the surface of CdTe (111) crystals,” in Proceedings of International Workshop on Field Emitter and Semiconductor Materials and Devices, Research Institute of Electronics, Shzuooka University, 2010, pp. 15–19.

A. Z.  Evmenova, V. A.  Odarich, “Elipsometrichni doslidzhennya prirodnoi okisnoi plivki na poverkhni skolu monokristalichnogo teluridu kadmiyu,” in Materiali elektronnoi tekhniki ta suchasni Informatsiĭni tekhnologii. Tretya mizhnarodna naukovo-praktichna konferentsiya, Kremenchuk, Ukraine, 2008, pp. 121–122.

A. Z.  Evmenova, V. A.  Odarich, “Osoblivosti formuvannya prirodnoi okisnoi plivki na teluridi kadmiyu,” in 12th International Conference on Physics and Technology of Thin Films and Nanosystems, Ivanofrankivsk, Ukraine, 2009, vol. 2, pp. 174–175.

E. D.  Palik, ed., Handbook of Optical Constants of Solids (Academic, New York, 1991).

Physical and Chemical Properties of Oxides. A Handbook (Metallurgiya, Moscow, 1978).

A. E.  Vol, I. K.  Kagan, Structure and Properties of Binary Metallic Systems (Nauka, Moscow, 1979), vol. 4.

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.