Abstract

This paper discusses features of the various parameters of photodetector arrays (PDAs) that characterize their noise properties. It is pointed out that the overall sensitivity, expressed as the number of electrons per second per lumen, and the intensity of the internal noise electrons, expressed as the number of electrons per second from unit area and normalized to unit accumulation time and unit readout time, are objective indicators of the PDAs when operating with low illuminances, regardless of the pixel size, accumulation time, and readout time. When apparatus with a PDA is being designed, in order to correctly choose the accumulation time and readout time, it is necessary also to know the main components of the normalized intensity of the internal noise of the PDA (or the normalized threshold exposure)—shot noise and thermal noise—since these components vary differently when there is variation of the temporal parameters indicated above.

© 2012 OSA

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