Abstract

This paper discusses the possibility of using nanolayers to create quarter-wave plates with a specified refractive index. Such systems make it possible to broaden the class of usable film-forming materials. The possibility is considered of creating antireflective coatings one or several layers of which are formed by a set of symmetrical systems of nanolayers. The symmetrical systems of nanolayers consist of two dielectrics with different refractive indices. An advantage of such coatings is that they can be used as a basis for fabricating quarter-wave antireflection coatings that have a wide region of minimum reflection; these were not implemented earlier because of the lack of film-forming materials with the necessary refractive indices.

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  1. I. S. Gaĭnutdinov and E. A. Nesmelov, Properties and Methods of Obtaining Interference Coatings for Optical Instrumentation (FÉN, Kazan, 2003).
  2. A. Thelen, “Design of multilayer interference filters,” in The Physics of Thin Films: Advances in Research and Development, vol. 5, eds., G. Hass and R. E. Thun(Academic Press, New York, 1969; Mir, Moscow, 1972), pp. 46–83.
  3. P. H. Berning, “Theory and calculations of the optical properties of thin films,” in The Physics of Thin Films: Advances in Research and Development, vol. 1, ed., G. Hass(Academic Press, New York, 1963; Mir, Moscow, 1967), pp. 91–151.
  4. J. T. Cox and G. Hass, “Antireflection coatings for the visible and IR,” in The Physics of Thin Films: Advances in Research and Development, vol. 2, eds., G. Hass and R. E. Thun(Academic Press, New York, 1964; Mir, Moscow, 1967), pp. 186–253.

Berning, P. H.

P. H. Berning, “Theory and calculations of the optical properties of thin films,” in The Physics of Thin Films: Advances in Research and Development, vol. 1, ed., G. Hass(Academic Press, New York, 1963; Mir, Moscow, 1967), pp. 91–151.

Cox, J. T.

J. T. Cox and G. Hass, “Antireflection coatings for the visible and IR,” in The Physics of Thin Films: Advances in Research and Development, vol. 2, eds., G. Hass and R. E. Thun(Academic Press, New York, 1964; Mir, Moscow, 1967), pp. 186–253.

Gainutdinov, I. S.

I. S. Gaĭnutdinov and E. A. Nesmelov, Properties and Methods of Obtaining Interference Coatings for Optical Instrumentation (FÉN, Kazan, 2003).

Hass, G.

J. T. Cox and G. Hass, “Antireflection coatings for the visible and IR,” in The Physics of Thin Films: Advances in Research and Development, vol. 2, eds., G. Hass and R. E. Thun(Academic Press, New York, 1964; Mir, Moscow, 1967), pp. 186–253.

Nesmelov, E. A.

I. S. Gaĭnutdinov and E. A. Nesmelov, Properties and Methods of Obtaining Interference Coatings for Optical Instrumentation (FÉN, Kazan, 2003).

Thelen, A.

A. Thelen, “Design of multilayer interference filters,” in The Physics of Thin Films: Advances in Research and Development, vol. 5, eds., G. Hass and R. E. Thun(Academic Press, New York, 1969; Mir, Moscow, 1972), pp. 46–83.

Other (4)

I. S. Gaĭnutdinov and E. A. Nesmelov, Properties and Methods of Obtaining Interference Coatings for Optical Instrumentation (FÉN, Kazan, 2003).

A. Thelen, “Design of multilayer interference filters,” in The Physics of Thin Films: Advances in Research and Development, vol. 5, eds., G. Hass and R. E. Thun(Academic Press, New York, 1969; Mir, Moscow, 1972), pp. 46–83.

P. H. Berning, “Theory and calculations of the optical properties of thin films,” in The Physics of Thin Films: Advances in Research and Development, vol. 1, ed., G. Hass(Academic Press, New York, 1963; Mir, Moscow, 1967), pp. 91–151.

J. T. Cox and G. Hass, “Antireflection coatings for the visible and IR,” in The Physics of Thin Films: Advances in Research and Development, vol. 2, eds., G. Hass and R. E. Thun(Academic Press, New York, 1964; Mir, Moscow, 1967), pp. 186–253.

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