Abstract

This paper discusses apparatus for measuring the characteristics of the residual birefringence of large optical crystals of fluorite by the method of crossed polarizing sheets. A mathematical model of the proposed method is presented. The point-spread function, which describes the influence of birefringence on the image quality, is analyzed.

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  1. M. Born and E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference, and Diffraction of Light (Pergamon Press, Oxford, 1965; Nauka, Moscow, 1973).
  2. A. V. Shubnikov, Optical Crystallography (Izd. Akad. Nauk SSSR, Moscow, 1950).
  3. W. A. Shurcliff, Polarized Light: Production and Use (Harvard Univ. Press, Cambridge, Mass., 1962; Mir, Moscow, 1965).
  4. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (Elsevier, New York, 1977; Mir, Moscow, 1981).
  5. M. A. Gan and S. I. Ustinov, “Computer modelling of two-dimensional images of test objects taking the actual aberrations of the optical systems into account,” Trudy Gos. Opt. Inst. 51, No. 185 (1982).

1982 (1)

M. A. Gan and S. I. Ustinov, “Computer modelling of two-dimensional images of test objects taking the actual aberrations of the optical systems into account,” Trudy Gos. Opt. Inst. 51, No. 185 (1982).

Azzam, R. M. A.

R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (Elsevier, New York, 1977; Mir, Moscow, 1981).

Bashara, N. M.

R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (Elsevier, New York, 1977; Mir, Moscow, 1981).

Born, M.

M. Born and E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference, and Diffraction of Light (Pergamon Press, Oxford, 1965; Nauka, Moscow, 1973).

Gan, M. A.

M. A. Gan and S. I. Ustinov, “Computer modelling of two-dimensional images of test objects taking the actual aberrations of the optical systems into account,” Trudy Gos. Opt. Inst. 51, No. 185 (1982).

Shubnikov, A. V.

A. V. Shubnikov, Optical Crystallography (Izd. Akad. Nauk SSSR, Moscow, 1950).

Shurcliff, W. A.

W. A. Shurcliff, Polarized Light: Production and Use (Harvard Univ. Press, Cambridge, Mass., 1962; Mir, Moscow, 1965).

Ustinov, S. I.

M. A. Gan and S. I. Ustinov, “Computer modelling of two-dimensional images of test objects taking the actual aberrations of the optical systems into account,” Trudy Gos. Opt. Inst. 51, No. 185 (1982).

Wolf, E.

M. Born and E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference, and Diffraction of Light (Pergamon Press, Oxford, 1965; Nauka, Moscow, 1973).

Trudy Gos. Opt. Inst. (1)

M. A. Gan and S. I. Ustinov, “Computer modelling of two-dimensional images of test objects taking the actual aberrations of the optical systems into account,” Trudy Gos. Opt. Inst. 51, No. 185 (1982).

Other (4)

M. Born and E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference, and Diffraction of Light (Pergamon Press, Oxford, 1965; Nauka, Moscow, 1973).

A. V. Shubnikov, Optical Crystallography (Izd. Akad. Nauk SSSR, Moscow, 1950).

W. A. Shurcliff, Polarized Light: Production and Use (Harvard Univ. Press, Cambridge, Mass., 1962; Mir, Moscow, 1965).

R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (Elsevier, New York, 1977; Mir, Moscow, 1981).

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