Abstract
This paper presents the results of an experimental study of how the relief height of
reflective relief-phase holograms obtained on layers of glassy chalcogenide
semiconductor (GCS) affects the parasitic-nanostructuring parameters of their
surface. The work is carried out by means of the Solver P-47 scanning probe
microscope. The short-wavelength limit within which reflective relief-phase
holograms obtained on thick GCS layers can be used, established with no a posteriori processing, equals 80nm. Starting from that value, holograms whose relief height is optimized to
maximize the diffraction efficiency satisfy the Maréchal criteria σ⩽λ/27 in terms of their rms surface-roughness parameter σ and possess allowable light scattering σ⩽λ/100 and thereby provide the light-scattering level and aberrations allowable
for precision optical systems in the image reconstructed by these holograms.
© 2009 Optical Society of America
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Add to BibSonomy