Abstract

This paper proposes a technique for determining the stability of the spectral responses of multilayer dielectric systems against possible variations of the optical thickness of the separate layers. The technique is based on a stability criterion introduced for synthesized interference coatings. Using well-known quarter-wave systems as an example, illustrations are given of the possibilities of a technique for determining the most sensitive layers in the structure of a coating, for choosing the structure of the coating, and for making a comparative analysis of the stability of the structures.

© 2009 Optical Society of America

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