Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Journal Home About Current Issue All Issues

Physical modeling of a two-wave measurement method in an autoreflection optoelectronic displacement-monitoring system

K. G. Arakantsev and A. N. Timofeev

Not Accessible

Your library or personal account may give you access

Abstract

This paper discusses a two-wave measurement method that makes it possible to reduce the influence of a temperature gradient of the air channel on the result of measuring an object's displacement by means of an autoreflection optoelectronic system.

© 2009 Optical Society of America

PDF Article
More Like This
Three-dimensional displacement measurement by a holospeckle interferometry method

W. Z. L. Zhuang, J. P. Baird, H. M. Williamson, and R. K. Clark
Appl. Opt. 32(25) 4728-4737 (1993)

Nomarski imaging interferometry to measure the displacement field of micro-electro-mechanical systems

Fabien Amiot and Jean Paul Roger
Appl. Opt. 45(30) 7800-7810 (2006)

Fast, sub-pixel accurate, displacement measurement method: optical and terahertz systems

Min Wan, John J. Healy, and John T. Sheridan
Opt. Lett. 45(24) 6611-6614 (2020)

View More...

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use