Abstract

This paper presents the results of studies of a photoelectric autocollimator with a detector based on a linear CCD array and a computer as a spectrum analyzer. The threshold sensitivity of the device to the image displacement depends on the SNR. When the SNR equals 250, the threshold sensitivity is 0.134μm, which corresponds to a threshold sensitivity to rotation of the test mirror by no more than 0.007<sup>″</sup>. The device makes it possible to determine the power spectrum of the rotational-velocity fluctuations of rotating mirrors, as well as the spectrum of the radiation fluctuations of distant sources.

© 2008 Optical Society of America

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  1. M. M. Miroshnikov, Theoretical Principles of Optoelectronic Devices (Mashinostroenie, Leningrad, 1977).
  2. G. Ya. Mirskiĭ, Apparatus for Determining the Characteristics of Random Processes (Énergiya, Moscow, 1972).
  3. J. S. Bendat and A. G. Piersol, Engineering Applications of Correlation and Spectral Analysis (Wiley, New York, 1980; Mir, Moscow, 1989).
  4. R. K. Otnes and L. Enochson, Applied Time Series Analysis (Wiley, New York, 1978; Mir, Moscow, 1982).
  5. F. J. Harris, “On the use of windows for harmonic analysis with the discrete Fourier transform,” Proc. IEEE 66, 51 (1978).
    [Crossref]

1978 (1)

F. J. Harris, “On the use of windows for harmonic analysis with the discrete Fourier transform,” Proc. IEEE 66, 51 (1978).
[Crossref]

Bendat, J. S.

J. S. Bendat and A. G. Piersol, Engineering Applications of Correlation and Spectral Analysis (Wiley, New York, 1980; Mir, Moscow, 1989).

Enochson, L.

R. K. Otnes and L. Enochson, Applied Time Series Analysis (Wiley, New York, 1978; Mir, Moscow, 1982).

Harris, F. J.

F. J. Harris, “On the use of windows for harmonic analysis with the discrete Fourier transform,” Proc. IEEE 66, 51 (1978).
[Crossref]

Miroshnikov, M. M.

M. M. Miroshnikov, Theoretical Principles of Optoelectronic Devices (Mashinostroenie, Leningrad, 1977).

Mirskii, G. Ya.

G. Ya. Mirskiĭ, Apparatus for Determining the Characteristics of Random Processes (Énergiya, Moscow, 1972).

Otnes, R. K.

R. K. Otnes and L. Enochson, Applied Time Series Analysis (Wiley, New York, 1978; Mir, Moscow, 1982).

Piersol, A. G.

J. S. Bendat and A. G. Piersol, Engineering Applications of Correlation and Spectral Analysis (Wiley, New York, 1980; Mir, Moscow, 1989).

Proc. IEEE (1)

F. J. Harris, “On the use of windows for harmonic analysis with the discrete Fourier transform,” Proc. IEEE 66, 51 (1978).
[Crossref]

Other (4)

M. M. Miroshnikov, Theoretical Principles of Optoelectronic Devices (Mashinostroenie, Leningrad, 1977).

G. Ya. Mirskiĭ, Apparatus for Determining the Characteristics of Random Processes (Énergiya, Moscow, 1972).

J. S. Bendat and A. G. Piersol, Engineering Applications of Correlation and Spectral Analysis (Wiley, New York, 1980; Mir, Moscow, 1989).

R. K. Otnes and L. Enochson, Applied Time Series Analysis (Wiley, New York, 1978; Mir, Moscow, 1982).

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