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Ways to improve the industry-wide system for metrological assurance of infrared optoelectronic devices

V. A. Baloev, V. I. Kurt, and A. N. Shchipunov

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Abstract

This paper discusses problems of the metrological assurance of the production, testing, and operation of IR optoelectronic devices and proposes ways to improve systems for the metrological assurance of IR optoelectronic devices.

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