Analyzing interference-fringe patterns by discriminating the features of wavelet maps of symmetric wavelets

A. V. Belyakov

doi:10.1364/JOT.73.000183

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OSA Publishing > Journal of Optical Technology > Volume 73 > Issue 3 > Page 183

Journal of Optical Technology

N. N. Rozanov, Editor-in-Chief
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Analyzing interference-fringe patterns by discriminating the features of wavelet maps of symmetric wavelets

A. V. Belyakov

Author Affiliations

A. V. Belyakov St. Petersburg State University of Information Technologies, Mechanics, and Optics, St. Petersburg

A Belyakov

Journal of Optical Technology
Vol. 73,
Issue 3,
pp. 183-187
(2006)
•https://doi.org/10.1364/JOT.73.000183

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A. V. Belyakov, "Analyzing interference-fringe patterns by discriminating the features of wavelet maps of symmetric wavelets," J. Opt. Technol. 73, 183-187 (2006)

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Abstract

This paper shows a connection between the lines of extrema of a three-dimensional wavelet map obtained by means of symmetric wavelets and the position of the fringes of an interference pattern. An algorithm is proposed that makes it possible to discriminate the lines of extrema of interference-fringe patterns

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