This paper discusses a method of microscanning for compensating the inhomogeneity of the parameters of the elements of thermal-vision detectors. It is shown that the compensation quality depends on the number of elements of the detector array, the presence of nonworking elements, and the SNR. It is independent of the nonuniformity of the scene and of the degree of inhomogeneity of the detector. The dependences of the quality of the inhomogeneity compensation are obtained for arrays with 288×384 and 128×128 elements. © 2005 Optical Society of America

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