Abstract

This paper proposes a procedure for determining the refractive index and thickness of thin transparent films, based on an approximation of the experimental spectral dependence of the reflectance by the cubic spline function and a computation of the first two derivatives. The errors that arise when the parameters of films of various thicknesses are computed are analyzed. It is shown that the technique can be reliably used when processing the results of spectrophotometric measurements of optical films more than 150-200 Å thick. © 2004 Optical Society of America

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