Abstract
This paper discusses methods of accelerated preparation of samples on a transparent substrate
suitable for the diffraction method of measuring the geometrical structure parameters of
opaque fabrics. Two methods of obtaining copies from the material of interest are experimentally
considered: by xerography, and by computer scanning. It is shown that the former method
reduces the time for sample preparation by a factor of tens while maintaining the accuracy of the
calculation of data corresponding to the experimental formulas proposed earlier. The
applicability of these formulas is theoretically justified in terms of the Fresnel?Kirchhoff integral.
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription