Abstract

This paper discusses the operating principles of optoelectronic positional angle sensors that use pseudo-random binary code sequences. The features of an optoelectronic two-channel positional angle sensor for next-generation geodesic devices produced by OAO PO É. S. Yalamov Ural Optomechanical Factory are described. The 5Ta5 tachymeter, with the optical positional angle sensor thus developed, measures relative angular positions with an rms error no greater than 5 arc s.

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  2. V. N. Tutevich, Telemechanics, Vysshaya Shkola, Moscow, 1985.
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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  7. http://www.renishaw.com
  8. D. Yu. Kruchinin, "Photolithography in the production of circular optical scales at the Ural Optomechanical Factory," Opt. Zh. 75, (4), 92 (2008) [J. Opt. Technol. 75, 282 (2008)].

2008 (1)

D. Yu. Kruchinin, "Photolithography in the production of circular optical scales at the Ural Optomechanical Factory," Opt. Zh. 75, (4), 92 (2008) [J. Opt. Technol. 75, 282 (2008)].

1998 (1)

E. M. Petriu, "Absolute position measurement using pseudo-random binary encoding," IEEE Instrum. Meas. Mag. 1, (3), 19 (1998).
[CrossRef]

1997 (1)

1996 (1)

Anikst, D. A.

D. A. Anikst, K. M. Konstantinovich, and I. V. Mes’kin, et al., Yu. G. Yakushenkov, ed., High-Accuracy Measurements, Mashinostroenie, Moscow, 1987.

Engelhardt, K.

Ito, T.

T. Ito, "Optical encoder and output adjustment for the same," US Patent 2004/0155178 A1; 12 Aug. 2004.

Konstantinovich, K. M.

D. A. Anikst, K. M. Konstantinovich, and I. V. Mes’kin, et al., Yu. G. Yakushenkov, ed., High-Accuracy Measurements, Mashinostroenie, Moscow, 1987.

Kruchinin, D. Yu.

D. Yu. Kruchinin, "Photolithography in the production of circular optical scales at the Ural Optomechanical Factory," Opt. Zh. 75, (4), 92 (2008) [J. Opt. Technol. 75, 282 (2008)].

Mes’kin, I. V.

D. A. Anikst, K. M. Konstantinovich, and I. V. Mes’kin, et al., Yu. G. Yakushenkov, ed., High-Accuracy Measurements, Mashinostroenie, Moscow, 1987.

Petriu, E. M.

E. M. Petriu, "Absolute position measurement using pseudo-random binary encoding," IEEE Instrum. Meas. Mag. 1, (3), 19 (1998).
[CrossRef]

Seitz, P.

Tutevich, V. N.

V. N. Tutevich, Telemechanics, Vysshaya Shkola, Moscow, 1985.

Appl. Opt. (2)

IEEE Instrum. Meas. Mag. (1)

E. M. Petriu, "Absolute position measurement using pseudo-random binary encoding," IEEE Instrum. Meas. Mag. 1, (3), 19 (1998).
[CrossRef]

Opt. Zh. (1)

D. Yu. Kruchinin, "Photolithography in the production of circular optical scales at the Ural Optomechanical Factory," Opt. Zh. 75, (4), 92 (2008) [J. Opt. Technol. 75, 282 (2008)].

Other (4)

T. Ito, "Optical encoder and output adjustment for the same," US Patent 2004/0155178 A1; 12 Aug. 2004.

http://www.renishaw.com

D. A. Anikst, K. M. Konstantinovich, and I. V. Mes’kin, et al., Yu. G. Yakushenkov, ed., High-Accuracy Measurements, Mashinostroenie, Moscow, 1987.

V. N. Tutevich, Telemechanics, Vysshaya Shkola, Moscow, 1985.

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