A formalized description of the process of forming and processing spectral patterns in multispectral optoelectronic observation systems is given. The spectral radiance factors are given for various objects, along with the results of calculations of the recognition criterion for various observation conditions. A preliminary analysis has been carried out of the possibilities of correlation-extremal recognition of terrestrial industrial installations on the basis of the multispectral data that have been obtained. © 2004 Optical Society of America

PDF Article

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription