Abstract

A formalized description of the process of forming and processing spectral patterns in multispectral optoelectronic observation systems is given. The spectral radiance factors are given for various objects, along with the results of calculations of the recognition criterion for various observation conditions. A preliminary analysis has been carried out of the possibilities of correlation-extremal recognition of terrestrial industrial installations on the basis of the multispectral data that have been obtained. © 2004 Optical Society of America

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