Abstract

A numerical approach for the analysis of quantum wire structures has been presented using a finite-element method which includes the strain analysis and the band analysis of the Luttinger-Kohn Hamiltonian with the deformation potential. A systematic implementation of the multiband Hamiltonian in the finite-element scheme is outlined and the corresponding variational functional is derived for arbitrarily shaped strained quantum wire arrays. This method is then applied to calculate the band structures of strained quantum wire arrays.

© 2003 Optical Society of Korea

PDF Article

References

  • View by:
  • |
  • |

  1. K. Y. Cheng, E. M. Stellini, P. J. Pearah, A. C. Chen, A. M. Moy, and K. C. Hsieh, International Electron Device Meeting "92(IEEE), 875 (1992).
    [CrossRef]
  2. P. J. Pearah, E. M. Stellini, A. C. Chen, A. M. Moy, K. C. Hsieh, and K. Y. Cheng, Appl. Phys. Lett. 62, 729 (1993).
    [CrossRef]
  3. M. Walther, E. Kapon, C. Caneau, D. M. Hwang, and L. M. Schiavone, Appl. Phys. Lett. 62, 2170 (1993).
    [CrossRef]
  4. T. Yamauchi, T. Takahashi, and Y. Arakawa, Surface Science 267, 291 (1992).
    [CrossRef]
  5. J. C. Yi, N. Dagli, and L. A. Coldren, Appl. Phys. Lett. 59, 3015 (1991).
    [CrossRef]
  6. M. S. Miller, H. Weman, C. E. Pryor, M. Krishnamurthy, P. M. Petroff, H. Kroemer, and J. L. Merz, Phys. Rev. Lett. 68, 3464 (1992).
    [CrossRef]
  7. R. C. Miller, D. A. Kleinman, and A. C. Gossard, Phys. Rev. B 29, 7085 (1984).
    [CrossRef]
  8. G. E. Pikus and G. L. Bir, Sov. Phys.-Solid State 1, 1502 (1960).
  9. G. E. Pikus and G. L. Bir, Symmetry and straininduced effects in semiconductors, (Wiley, New York ,1974) Chapter 3.
  10. J. M. Luttinger and W. Kohn, Phys. Rev. 97, 869 (1955).
    [CrossRef]
  11. J. C. Yi and N. Dagli, IEEE J. Quantum Electron. 31, 208 (1995).
    [CrossRef]
  12. I. Suemune and L. A. Colderen, IEEE J. Quantum Electron. 24, 1778 (1988).
    [CrossRef]
  13. S. L. Chuang, Physics of Optoelectronic Devices, (Wiley Inter Science, New York, USA, 1995) Chapter 4.
  14. D. Ahn and S. L. Chuang, IEEE J. Quantum Electron. 24, 2400 (1988).
    [CrossRef]
  15. T. P. Bahder, Phys. Rev. B 41, 11992 (1990).
    [CrossRef]
  16. Landolt-Bornstein, Numerical Data and Functional Relationships in Science and Technology, (Springer, Berlin, 1982), vols. 17 and 22a.
  17. I-H. Tan, M. Y. He, J. C. Yi, E. Hu, N. Dagli, and A. Evans, J. Appl. Phys. 72, 546 (1992).
    [CrossRef]
  18. C. Y. P. Chao and S. L. Chuang, Phys. Rev. B 46, 4110 (1992).
    [CrossRef]
  19. S. W. Corzine, private communications
  20. E. O. Kane, Phys. Rev. 178, 1368 (1965).
    [CrossRef]
  21. G. Ji, D. Huang, U. K. Reddy, T. S. Henderson, R. Houdre, and H. Morkoc, J. Appl. Phys. 62, 3366 (1987).
    [CrossRef]
  22. S. L. Chuang and C. Y. P. Chao, Phys. Rev. B 43, 9649 (1991).
    [CrossRef]
  23. O. C. Zienkiewicz, Developments in stress analysis, (Applied Science Pub. Ltd., London, 1979) Chapter 1.
  24. Z. Xu and P. M. Petroff, J. Appl. Phys. 69, 6564 (1991).
    [CrossRef]
  25. S. F. Borg, Fundamentals of engineering elasticity, (D. Van Nostrand Co. Ltd., New York, 1962) Chapters 3-4.
  26. K.-J. Bathe and E. L. Wilson, Numerical Methods in Finite Element Analysis, (Prentice-Hall, Inc., Englewood Cliffs, New Jersey 1976) Chapter 6.
  27. P. P. Silvester and R. L. Ferrari, Finite Elements For Electrical Engineers, (Cambridge University Press, London 1983) Chapter 1.

1995 (2)

J. C. Yi and N. Dagli, IEEE J. Quantum Electron. 31, 208 (1995).
[CrossRef]

S. L. Chuang, Physics of Optoelectronic Devices, (Wiley Inter Science, New York, USA, 1995) Chapter 4.

1993 (2)

P. J. Pearah, E. M. Stellini, A. C. Chen, A. M. Moy, K. C. Hsieh, and K. Y. Cheng, Appl. Phys. Lett. 62, 729 (1993).
[CrossRef]

M. Walther, E. Kapon, C. Caneau, D. M. Hwang, and L. M. Schiavone, Appl. Phys. Lett. 62, 2170 (1993).
[CrossRef]

1992 (5)

T. Yamauchi, T. Takahashi, and Y. Arakawa, Surface Science 267, 291 (1992).
[CrossRef]

M. S. Miller, H. Weman, C. E. Pryor, M. Krishnamurthy, P. M. Petroff, H. Kroemer, and J. L. Merz, Phys. Rev. Lett. 68, 3464 (1992).
[CrossRef]

I-H. Tan, M. Y. He, J. C. Yi, E. Hu, N. Dagli, and A. Evans, J. Appl. Phys. 72, 546 (1992).
[CrossRef]

C. Y. P. Chao and S. L. Chuang, Phys. Rev. B 46, 4110 (1992).
[CrossRef]

K. Y. Cheng, E. M. Stellini, P. J. Pearah, A. C. Chen, A. M. Moy, and K. C. Hsieh, International Electron Device Meeting "92(IEEE), 875 (1992).
[CrossRef]

1991 (3)

S. L. Chuang and C. Y. P. Chao, Phys. Rev. B 43, 9649 (1991).
[CrossRef]

Z. Xu and P. M. Petroff, J. Appl. Phys. 69, 6564 (1991).
[CrossRef]

J. C. Yi, N. Dagli, and L. A. Coldren, Appl. Phys. Lett. 59, 3015 (1991).
[CrossRef]

1990 (1)

T. P. Bahder, Phys. Rev. B 41, 11992 (1990).
[CrossRef]

1988 (2)

D. Ahn and S. L. Chuang, IEEE J. Quantum Electron. 24, 2400 (1988).
[CrossRef]

I. Suemune and L. A. Colderen, IEEE J. Quantum Electron. 24, 1778 (1988).
[CrossRef]

1987 (1)

G. Ji, D. Huang, U. K. Reddy, T. S. Henderson, R. Houdre, and H. Morkoc, J. Appl. Phys. 62, 3366 (1987).
[CrossRef]

1984 (1)

R. C. Miller, D. A. Kleinman, and A. C. Gossard, Phys. Rev. B 29, 7085 (1984).
[CrossRef]

1983 (1)

P. P. Silvester and R. L. Ferrari, Finite Elements For Electrical Engineers, (Cambridge University Press, London 1983) Chapter 1.

1982 (1)

Landolt-Bornstein, Numerical Data and Functional Relationships in Science and Technology, (Springer, Berlin, 1982), vols. 17 and 22a.

1979 (1)

O. C. Zienkiewicz, Developments in stress analysis, (Applied Science Pub. Ltd., London, 1979) Chapter 1.

1976 (1)

K.-J. Bathe and E. L. Wilson, Numerical Methods in Finite Element Analysis, (Prentice-Hall, Inc., Englewood Cliffs, New Jersey 1976) Chapter 6.

1974 (1)

G. E. Pikus and G. L. Bir, Symmetry and straininduced effects in semiconductors, (Wiley, New York ,1974) Chapter 3.

1965 (1)

E. O. Kane, Phys. Rev. 178, 1368 (1965).
[CrossRef]

1962 (1)

S. F. Borg, Fundamentals of engineering elasticity, (D. Van Nostrand Co. Ltd., New York, 1962) Chapters 3-4.

1960 (1)

G. E. Pikus and G. L. Bir, Sov. Phys.-Solid State 1, 1502 (1960).

1955 (1)

J. M. Luttinger and W. Kohn, Phys. Rev. 97, 869 (1955).
[CrossRef]

Appl. Phys. Lett (1)

J. C. Yi, N. Dagli, and L. A. Coldren, Appl. Phys. Lett. 59, 3015 (1991).
[CrossRef]

Appl. Phys. Lett. (2)

P. J. Pearah, E. M. Stellini, A. C. Chen, A. M. Moy, K. C. Hsieh, and K. Y. Cheng, Appl. Phys. Lett. 62, 729 (1993).
[CrossRef]

M. Walther, E. Kapon, C. Caneau, D. M. Hwang, and L. M. Schiavone, Appl. Phys. Lett. 62, 2170 (1993).
[CrossRef]

Electron Devices Meeting, 1992. Technical Digest., International (1)

K. Y. Cheng, E. M. Stellini, P. J. Pearah, A. C. Chen, A. M. Moy, and K. C. Hsieh, International Electron Device Meeting "92(IEEE), 875 (1992).
[CrossRef]

IEEE J. Quantum Electron. (2)

I. Suemune and L. A. Colderen, IEEE J. Quantum Electron. 24, 1778 (1988).
[CrossRef]

D. Ahn and S. L. Chuang, IEEE J. Quantum Electron. 24, 2400 (1988).
[CrossRef]

J. Appl. Phys. (3)

I-H. Tan, M. Y. He, J. C. Yi, E. Hu, N. Dagli, and A. Evans, J. Appl. Phys. 72, 546 (1992).
[CrossRef]

Z. Xu and P. M. Petroff, J. Appl. Phys. 69, 6564 (1991).
[CrossRef]

G. Ji, D. Huang, U. K. Reddy, T. S. Henderson, R. Houdre, and H. Morkoc, J. Appl. Phys. 62, 3366 (1987).
[CrossRef]

Phys. Rev. (2)

E. O. Kane, Phys. Rev. 178, 1368 (1965).
[CrossRef]

J. M. Luttinger and W. Kohn, Phys. Rev. 97, 869 (1955).
[CrossRef]

Phys. Rev. B (4)

R. C. Miller, D. A. Kleinman, and A. C. Gossard, Phys. Rev. B 29, 7085 (1984).
[CrossRef]

C. Y. P. Chao and S. L. Chuang, Phys. Rev. B 46, 4110 (1992).
[CrossRef]

T. P. Bahder, Phys. Rev. B 41, 11992 (1990).
[CrossRef]

S. L. Chuang and C. Y. P. Chao, Phys. Rev. B 43, 9649 (1991).
[CrossRef]

Phys. Rev. Lett. (1)

M. S. Miller, H. Weman, C. E. Pryor, M. Krishnamurthy, P. M. Petroff, H. Kroemer, and J. L. Merz, Phys. Rev. Lett. 68, 3464 (1992).
[CrossRef]

Quantum Electronics, IEEE Journal of (1)

J. C. Yi and N. Dagli, IEEE J. Quantum Electron. 31, 208 (1995).
[CrossRef]

Sov. Phys.-Solid State (1)

G. E. Pikus and G. L. Bir, Sov. Phys.-Solid State 1, 1502 (1960).

Surface Science (1)

T. Yamauchi, T. Takahashi, and Y. Arakawa, Surface Science 267, 291 (1992).
[CrossRef]

Other (8)

G. E. Pikus and G. L. Bir, Symmetry and straininduced effects in semiconductors, (Wiley, New York ,1974) Chapter 3.

Landolt-Bornstein, Numerical Data and Functional Relationships in Science and Technology, (Springer, Berlin, 1982), vols. 17 and 22a.

S. L. Chuang, Physics of Optoelectronic Devices, (Wiley Inter Science, New York, USA, 1995) Chapter 4.

S. W. Corzine, private communications

O. C. Zienkiewicz, Developments in stress analysis, (Applied Science Pub. Ltd., London, 1979) Chapter 1.

S. F. Borg, Fundamentals of engineering elasticity, (D. Van Nostrand Co. Ltd., New York, 1962) Chapters 3-4.

K.-J. Bathe and E. L. Wilson, Numerical Methods in Finite Element Analysis, (Prentice-Hall, Inc., Englewood Cliffs, New Jersey 1976) Chapter 6.

P. P. Silvester and R. L. Ferrari, Finite Elements For Electrical Engineers, (Cambridge University Press, London 1983) Chapter 1.

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.