Abstract

In this paper, a method is proposed for simultaneously measuring the front and back surface profiles of transparent micro-optical components. The proposed method combines a dual-wavelength digital holographic microscope with liquids to record holograms at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back sides of the sample. A theoretical model is proposed to determine the surface information, and imaging of an achromatic lens is demonstrated experimentally. Unlike conventional interferometry, our proposed method supports nondestructive measurement and direct observation of both front and back profiles of micro-optical elements.

© 2014 Optical Society of Korea

Dual-wavelength common-path digital holographic microscopy for quantitative phase imaging based on lateral shearing interferometry

Jianglei Di, Ying Li, Min Xie, Jiwei Zhang, Chaojie Ma, Teli Xi, Enpu Li, and Jianlin Zhao
Appl. Opt. 55(26) 7287-7293 (2016)

High-speed measurement of mechanical micro-deformations with an extended phase range using dual-wavelength digital holographic interferometry

Natalia Munera, Carlos Trujillo, and Jorge Garcia-Sucerquia
Appl. Opt. 61(5) B279-B286 (2022)

Digital holographic microscopy with dual-wavelength phase unwrapping

Daniel Parshall and Myung K. Kim
Appl. Opt. 45(3) 451-459 (2006)

Real-time dual-wavelength digital holographic microscopy with a single hologram acquisition

Jonas Kühn, Tristan Colomb, Frédéric Montfort, Florian Charrière, Yves Emery, Etienne Cuche, Pierre Marquet, and Christian Depeursinge
Opt. Express 15(12) 7231-7242 (2007)

Single-shot common-path off-axis dual-wavelength digital holographic microscopy

Manoj Kumar, Xiangyu Quan, Yasuhiro Awatsuji, Yosuke Tamada, and Osamu Matoba
Appl. Opt. 59(24) 7144-7152 (2020)