Abstract

Via THz Time domain spectroscopy, the characterization of high conductive n-type, 1.31Ω cm silicon can be measured by directly analyzing the multiple reflections using Fabry-Perot theory. The magnitude and phase difference of total transmission show good agreement between theoretical and experimental values over a 2.5 THz frequency range with complex index of refraction and power absorption. The measured absorption and dispersion are strongly frequency-dependent, and all of the results are well fit by a Cole-Davidson type distribution

© 1999 Optical Society of Korea

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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  9. T. Ohba and S. Ikawa, J. Appl. Phys. 64, 4141 (1988)
    [CrossRef]
  10. D. Grischkowsky, S. Keiding, M van Exter, and Ch. Fattinger, J. Opt. Soc. Am. B 7, 2006 (1990)
    [CrossRef]
  11. D.W. Davidson and RH. Cole, J. Chem. Phys. 19, 1484 (1951)
    [CrossRef]
  12. S. Havriliak, Jr. and D.G. Watts, Polymer 27, 1509 (1986)
    [CrossRef]
  13. K. Pathmanathan and J.R Stevens, J. Appl. Phys. 68, 5128 (1990)
    [CrossRef]
  14. G.A. Niklasson, K. Brantervik, and L. Borjesson, J. Non-Cryst. Solids 131, 1096 (1991)
    [CrossRef]
  15. M. van Exter and D. Grischkowsky, Phys. Rev. B 41, 12140 (1990)
    [CrossRef]

1998 (1)

T.-I. Jeon and D. Grischkowsky, Appl. Phys. Lett. 72, 2259 (1998); 72, 3032 (1998)
[CrossRef]

1997 (1)

T.-I. Jeon and D. Grischkowsky, Phys. Rev. Lett. 78, 1106 (1997)
[CrossRef]

1991 (2)

G.A. Niklasson, K. Brantervik, and L. Borjesson, J. Non-Cryst. Solids 131, 1096 (1991)
[CrossRef]

N. Katzenellenbogen and D. Grischkowsky, Appl. Phys. Lett. 58, 222 (1991)
[CrossRef]

1990 (4)

T. Kihara and K. Yokomori, Appl. Opt. 29, 5069 (1990)
[CrossRef]

M. van Exter and D. Grischkowsky, Phys. Rev. B 41, 12140 (1990)
[CrossRef]

K. Pathmanathan and J.R Stevens, J. Appl. Phys. 68, 5128 (1990)
[CrossRef]

D. Grischkowsky, S. Keiding, M van Exter, and Ch. Fattinger, J. Opt. Soc. Am. B 7, 2006 (1990)
[CrossRef]

1989 (1)

M van Exter, Ch. Fattinger, and D. Grischkowsky, Opt. Lett. 14, 1128, (1989)
[CrossRef]

1988 (1)

T. Ohba and S. Ikawa, J. Appl. Phys. 64, 4141 (1988)
[CrossRef]

1987 (1)

M. Born and E. Wolf, Principle of Optics, (Pergamon Press, Oxford, 1987)

1986 (1)

S. Havriliak, Jr. and D.G. Watts, Polymer 27, 1509 (1986)
[CrossRef]

1983 (1)

R.T. Kinsaewitz and B. Sentizky, J. Appl. Phys. 54, 3394 (1983)
[CrossRef]

1968 (1)

J.D. Holm and K.S. Champlin, J. Appl. Phys. 39, 275 (1968)
[CrossRef]

1951 (1)

D.W. Davidson and RH. Cole, J. Chem. Phys. 19, 1484 (1951)
[CrossRef]

Appl. Phys. Lett. (2)

T.-I. Jeon and D. Grischkowsky, Appl. Phys. Lett. 72, 2259 (1998); 72, 3032 (1998)
[CrossRef]

N. Katzenellenbogen and D. Grischkowsky, Appl. Phys. Lett. 58, 222 (1991)
[CrossRef]

Applied Optics (1)

T. Kihara and K. Yokomori, Appl. Opt. 29, 5069 (1990)
[CrossRef]

J. Appl. Phys. (4)

T. Ohba and S. Ikawa, J. Appl. Phys. 64, 4141 (1988)
[CrossRef]

R.T. Kinsaewitz and B. Sentizky, J. Appl. Phys. 54, 3394 (1983)
[CrossRef]

J.D. Holm and K.S. Champlin, J. Appl. Phys. 39, 275 (1968)
[CrossRef]

K. Pathmanathan and J.R Stevens, J. Appl. Phys. 68, 5128 (1990)
[CrossRef]

J. Chem. Phys (1)

D.W. Davidson and RH. Cole, J. Chem. Phys. 19, 1484 (1951)
[CrossRef]

Journal of Non-Crystalline Solids (1)

G.A. Niklasson, K. Brantervik, and L. Borjesson, J. Non-Cryst. Solids 131, 1096 (1991)
[CrossRef]

Journal of the Optical Society of America B (1)

D. Grischkowsky, S. Keiding, M van Exter, and Ch. Fattinger, J. Opt. Soc. Am. B 7, 2006 (1990)
[CrossRef]

Optics Letters (1)

M van Exter, Ch. Fattinger, and D. Grischkowsky, Opt. Lett. 14, 1128, (1989)
[CrossRef]

Phys. Rev. B (1)

M. van Exter and D. Grischkowsky, Phys. Rev. B 41, 12140 (1990)
[CrossRef]

Phys. Rev. Lett. (1)

T.-I. Jeon and D. Grischkowsky, Phys. Rev. Lett. 78, 1106 (1997)
[CrossRef]

Polymer (1)

S. Havriliak, Jr. and D.G. Watts, Polymer 27, 1509 (1986)
[CrossRef]

Other (1)

M. Born and E. Wolf, Principle of Optics, (Pergamon Press, Oxford, 1987)

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