Abstract

Aperiodic, irregular structures offer a large number of degrees of freedom relative to periodic or quasi-periodic systems and hence the opportunity for more control over electromagnetic fields. The challenge is to understand the relation between structure and material and the possible response, as measured by achievable scattered field as a function of position and frequency. With this information, basic guidelines could become available to facilitate a computational design process. Having this goal in mind, near-field through far-field control is appraised through a multivariate statistical analysis of example binary two-dimensional nanostructured aperiodic material arrangements. The total variance and significant rank of the transmission matrix, equivalent to the field correlation at the detector plane in the situations treated, yields quantitative measures of the degree of control related to size, material properties, and material spatial decomposition. This analysis provides sensitivity information relevant for the realization of aperiodic structures that can control light as a function of position and frequency in new ways.

© 2017 Optical Society of America

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