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OSA Publishing

1 September 2017, Volume 34, Issue 9, pp. 1771-2040   35 articles


Instrumentation, Measurement, and Metrology

Improved determination of the optical constants of anisotropic thin films by ellipsometry using ant colony fitting algorithms

J. Opt. Soc. Am. B 34(9), 1957-1964 (2017)  View: HTML | PDF

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