Abstract

Incoherent laser pulses are used to measure the dephasing time of photogenerated excitons in semiconductor-doped glasses. The coherent polarization dephasing time T2 is determined for several commercial glasses as well as for a semiconductor thin film. It is found that T2 varies systematically from less than 5 fs to longer than 70 fs, depending on the degree of excess excitation beyond the band edge. The temperature dependence of T2 is also measured. A systematic behavior of smaller T2 at higher temperature is observed in all samples. These T2 values are believed to result from the loss of orientational coherence of the excitons generated by laser excitation.

© 1992 Optical Society of America

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