Spectroscopic Mueller matrix ellipsometry of a gap surface plasmon array at conical incidences

Per Magnus Walmsness; Nathan Hale; Morten Kildemo

doi:10.1364/JOSAB.432466

Journal of the Optical Society of America B
Vol. 38,
Issue 9,
pp. 2551-2561
(2021)
•https://doi.org/10.1364/JOSAB.432466

Spectroscopic Mueller matrix ellipsometry of a gap surface plasmon array at conical incidences

Per Magnus Walmsness, Nathan Hale, and Morten Kildemo

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
Per Magnus Walmsness, Nathan Hale, and Morten Kildemo, "Spectroscopic Mueller matrix ellipsometry of a gap surface plasmon array at conical incidences," J. Opt. Soc. Am. B 38, 2551-2561 (2021)

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article
Editors' Pick

Check for updates

Abstract

Spectroscopic Mueller matrix ellipsometry is used to study an array of rectangular Au patches on a ${{\rm SiO}_2}$ film backed by optically thick Au. The array supports resonances related to gap surface plasmons and Rayleigh anomalies, and these are mapped out by full rotation of the azimuthal angle of incidence. The finite element method is used to model the system, and it is found that the Ti adhesion layers at ${{\rm SiO}_2}/{\rm Au}$ interfaces used in the manufacture process must be included in the model for accurate results. We show how oxidation of the Ti layer beneath the Au patch causes the optical response to drift in time, and we demonstrate an extreme sensitivity of the Mueller matrix to the dimensions of the patch.

Full Article | PDF Article

More Like This

Optical response of rectangular array of elliptical plasmonic particles on glass revealed by Mueller matrix ellipsometry and finite element modeling

Per Magnus Walmsness, Thomas Brakstad, Brage B. Svendsen, Jean-Philippe Banon, John C. Walmsley, and Morten Kildemo
J. Opt. Soc. Am. B 36(7) E78-E87 (2019)

Anisotropic plasmonic Cu nanoparticles in sol-gel oxide nanopillars studied by spectroscopic Mueller matrix ellipsometry

Z. Ghadyani, M. Kildemo, L. M. S. Aas, Y. Cohin, and E. Søndergård
Opt. Express 21(25) 30796-30811 (2013)

Dispersion of polarization coupling, localized and collective plasmon modes in a metallic photonic crystal mapped by Mueller Matrix Ellipsometry

Thomas Brakstad, Morten Kildemo, Zahra Ghadyani, and Ingve Simonsen
Opt. Express 23(17) 22800-22815 (2015)

Previous Article Next Article

Data Availability

Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the authors upon reasonable request.

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (10)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Tables (3)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (9)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

	$L_{x}$ (nm)	$L_{y}$ (nm)	$Λ_{x}$ (nm)	$Λ_{y}$ (nm)	$d$ (nm)
SEM	$228 \pm 8$	$101 \pm 4$	$468 \pm 1$	$315 \pm 1$
AFM	$213 \pm 12$	$99 \pm 8$	$459 \pm 1$	$315 \pm 1$	$65 \pm 2$

$d_{A u}$	54.2 nm	$L_{x}$	205.0 nm
$d_{T i O_{x} - b o t t o m}$	5.5 nm	$L_{y}$	89.0 nm
$d_{{S i O}_{2}}$	23.5 nm	$Λ_{x}$	473.0 nm
$d_{{T i O}_{x}}$	6.8 nm	$Λ_{y}$	322.0 nm

Resonance Sensitivity	Estimates	FEM
$Δ λ^{L} (p = 1) / Δ L_{x}$	5.0	4.1
$Δ λ^{L} (p = 2) / Δ L_{x}$	2.9	1.6
$Δ λ^{T} (q = 1) / Δ L_{y}$	5.6	4.8
$Δ λ^{L} (p = 1) / Δ h$	13.0	5.8
$Δ λ^{T} (q = 1) / Δ h$	7.0	3.4

	$L_{x}$ (nm)	$L_{y}$ (nm)	$Λ_{x}$ (nm)	$Λ_{y}$ (nm)	$d$ (nm)
SEM	$228 \pm 8$	$101 \pm 4$	$468 \pm 1$	$315 \pm 1$
AFM	$213 \pm 12$	$99 \pm 8$	$459 \pm 1$	$315 \pm 1$	$65 \pm 2$

$d_{A u}$	54.2 nm	$L_{x}$	205.0 nm
$d_{T i O_{x} - b o t t o m}$	5.5 nm	$L_{y}$	89.0 nm
$d_{{S i O}_{2}}$	23.5 nm	$Λ_{x}$	473.0 nm
$d_{{T i O}_{x}}$	6.8 nm	$Λ_{y}$	322.0 nm

Abstract

Data Availability

Cited By

Figures (10)

Tables (3)

Equations (9)

Journal of the Optical Society of America B