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Dual-channel sensor based on Tamm plasmon polariton and defect mode hybridization in topological insulator covered photonic crystals

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Abstract

In this paper, a novel multi-channel refractive index sensor is proposed. The strong coupling between Tamm plasmon polariton (TPP) and defect modes of one-dimensional photonic crystals (1D-PCs) is used to design a high sensitivity sensor. The TPP is formed by topological insulators ${\rm{B}}{{\rm{i}}_{1.5}}{\rm{S}}{{\rm{b}}_{0.5}}{\rm{T}}{{\rm{e}}_{1.8}}{\rm{S}}{{\rm{e}}_{1.2}}$ (BSTS) and 1D-PC. Within the 1D-PC, localized phase shifts are induced to form defect modes that can be hybridized with the TPP mode. More resonances can be formed by introducing additional defects in the 1D-PC. The proposed sensor provides great potential in the fields of multi-channel and multi-parameter sensing.

© 2021 Optical Society of America

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Data Availability

Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the authors upon reasonable request.

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