Single-shot autocorrelator for extreme-ultraviolet radiation

G. Kolliopoulos; P. Tzallas; B. Bergues; P. A. Carpeggiani; P. Heissler; H. Schröder; L. Veisz; D. Charalambidis; G. D. Tsakiris

doi:10.1364/JOSAB.31.000926

Single-shot autocorrelator for extreme-ultraviolet radiation

G. Kolliopoulos, P. Tzallas, B. Bergues, P. A. Carpeggiani, P. Heissler, H. Schröder, L. Veisz, D. Charalambidis, and G. D. Tsakiris

Journal of the Optical Society of America B
Vol. 31,
Issue 5,
pp. 926-938
(2014)
•https://doi.org/10.1364/JOSAB.31.000926

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G. Kolliopoulos, P. Tzallas, B. Bergues, P. A. Carpeggiani, P. Heissler, H. Schröder, L. Veisz, D. Charalambidis, and G. D. Tsakiris, "Single-shot autocorrelator for extreme-ultraviolet radiation," J. Opt. Soc. Am. B 31, 926-938 (2014)

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Table of Contents Category
- X-ray Optics
Optics & Photonics Topics
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The topics in this list come from the OSA Optics and Photonics Topics applied to this article.
Previously assigned OCIS codes
- Detection (040.1880)
- Diffraction theory (050.1960)
- Harmonic generation and mixing (190.2620)
- Multiphoton processes (190.4180)
- Ultrafast phenomena (260.7120)
- Ultrafast measurements (320.7100)

About this Article
History
- Original Manuscript: September 27, 2013
- Revised Manuscript: January 14, 2014
- Manuscript Accepted: February 27, 2014
- Published: April 2, 2014

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Abstract

A novel single-shot second-order autocorrelation scheme for extreme-ultraviolet radiation (XUV) is proposed. It is based on an ion-imaging technique, which provides spatial information of ionization products in the focal volume of the XUV beam. Using simple analytical and detailed numerical modeling, an evaluation toward selecting an optimum configuration has been performed. The implementation of the concept to characterize attosecond pulses is discussed, and the proposed setups are assessed.

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$I_{peak}$ $[W / {cm}^{2}]$	$ρ_{He} [\times 10^{18} {cm}^{- 3}]$	$N_{ions}$
$10^{11}$	1.2	1
$10^{11}$	6.2	7
$10^{12}$	1.2	130
$10^{12}$	6.2	650
$10^{13}$	1.2	$1.3 \times 10^{4}$
$10^{13}$	6.2	$6.5 \times 10^{4}$

Setup	Characteristic Dimensions	$f$ [cm]	$F$	Interaction Volume Dimensions (Second Order) [μm]	Mean Intensity at Focus [ $W / {cm}^{2}$ ]	Number of Ions
Case (a)Two-aperture mask	$D = 100 μm$ $d = 3 mm$	5	$\sim 10^{- 7}$	$L_{x} \sim 28$ $L_{y} \sim 35$ $L_{z} \sim 1350$	$\sim 10^{8}$	$\sim 0$
Case (b)Two-slit mask	$l_{x} = 100 μm$ $l_{y} = 5 mm$ $d = 3 mm$	5	$\sim 10^{- 4}$	$L_{x} \sim 1$ $L_{y} \sim 30$ $L_{z} \sim 35$	$\sim 10^{11}$	$\sim 6$
Case (c)Beam splitter	$θ = 2^{°}$	100	$\sim 10^{- 3}$	$L_{x} \sim 10$ $L_{y} \sim 20$ $L_{z} \sim 400$	$\sim 10^{12}$	$\sim 650$

$I_{peak}$ $[W / {cm}^{2}]$	$ρ_{He} [\times 10^{18} {cm}^{- 3}]$	$N_{ions}$
$10^{11}$	1.2	1
$10^{11}$	6.2	7
$10^{12}$	1.2	130
$10^{12}$	6.2	650
$10^{13}$	1.2	$1.3 \times 10^{4}$
$10^{13}$	6.2	$6.5 \times 10^{4}$

Setup	Characteristic Dimensions	$f$ [cm]	$F$	Interaction Volume Dimensions (Second Order) [μm]	Mean Intensity at Focus [ $W / {cm}^{2}$ ]	Number of Ions
Case (a)Two-aperture mask	$D = 100 μm$ $d = 3 mm$	5	$\sim 10^{- 7}$	$L_{x} \sim 28$ $L_{y} \sim 35$ $L_{z} \sim 1350$	$\sim 10^{8}$	$\sim 0$
Case (b)Two-slit mask	$l_{x} = 100 μm$ $l_{y} = 5 mm$ $d = 3 mm$	5	$\sim 10^{- 4}$	$L_{x} \sim 1$ $L_{y} \sim 30$ $L_{z} \sim 35$	$\sim 10^{11}$	$\sim 6$
Case (c)Beam splitter	$θ = 2^{°}$	100	$\sim 10^{- 3}$	$L_{x} \sim 10$ $L_{y} \sim 20$ $L_{z} \sim 400$	$\sim 10^{12}$	$\sim 650$

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