Abstract

A novel single-shot second-order autocorrelation scheme for extreme-ultraviolet radiation (XUV) is proposed. It is based on an ion-imaging technique, which provides spatial information of ionization products in the focal volume of the XUV beam. Using simple analytical and detailed numerical modeling, an evaluation toward selecting an optimum configuration has been performed. The implementation of the concept to characterize attosecond pulses is discussed, and the proposed setups are assessed.

© 2014 Optical Society of America

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