Abstract

The ellipsometric parameters for light reflection from a dielectric film with Kerr optical nonlinearity on a bigyrotropic magneto-electric film are theoretically investigated. The combined contributions of cubic optical nonlinearity and magneto-electric coupling allow us to control the ellipsometric parameters and thus, for example, the Kerr rotation with the incoming light intensity, in particular at incidence angles close to the pseudo-Brewster angle.

© 2014 Optical Society of America

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  1. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, 1977).
  2. J. B. Theeten and D. E. Aspnes, “Ellipsometry in thin film analysis,” Annu. Rev. Mater. Sci. 11, 97–122 (1981).
    [CrossRef]
  3. D. Schmidt, E. Schubert, and M. Schubert, “Generalized ellipsometry characterization of sculptured thin films made by glancing angle deposition,” in Ellipsometry at the Nanoscale, M. Losurdo and K. Hingerl, eds. (Springer-Verlag, 2013), pp. 341–410.
  4. S. Vishnovsky, “Magneto-optical ellipsometry,” Czech. J. Phys. B 36, 625–650 (1986).
    [CrossRef]
  5. A. Berger and M. R. Pufall, “Generalized magneto-optical ellipsometry,” Appl. Phys. Lett. 71, 965–967 (1997).
    [CrossRef]
  6. M. Schubert, T. E. Tiwald, and J. A. Woollam, “Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry,” Appl. Opt. 38, 177–187 (1999).
    [CrossRef]
  7. P. Vavassori, “Polarization modulation technique for magneto-optical quantitative vector magnetometry,” Appl. Phys. Lett. 77, 1605–1607 (2000).
    [CrossRef]
  8. S. Vishnovsky, R. Lopushnik, M. Bauer, J. Bok, J. Fassbender, and B. Hillebrands, “Magneto-optic ellipsometry in multilayers at arbitrary magnetization,” Opt. Express 9, 121–135 (2001).
    [CrossRef]
  9. S. Vishnovsky, K. Postava, T. Yamaguchi, and R. Lopushnik, “Magneto-optic ellipsometry in exchange-coupled films,” Appl. Opt. 41, 3950–3960 (2002).
    [CrossRef]
  10. M. Schubert, T. Hofmann, and C. M. Herzinger, “Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in n-type GaAs,” J. Opt. Soc. Am. A 20, 347–356 (2003).
    [CrossRef]
  11. A. Dejneka, V. Zablotskii, M. Tyunina, L. Jastrabik, J. I. Perez-Landazabal, V. Recarte, V. Sanchez-Alarcos, and V. A. Chernenko, “Ellipsometry applied to phase transitions and relaxation phenomena in Ni2MnGa ferromagnetic shape memory alloy,” Appl. Phys. Lett. 101, 141908 (2012).
    [CrossRef]
  12. J. A. Arregi, J. B. Gonzalez-Diaz, E. Bergaretxe, O. Idigoras, T. Unsal, and A. Berger, “Study of generalized magneto-optical ellipsometry measurement reliability,” J. Appl. Phys. 111, 103912 (2012).
    [CrossRef]
  13. D. Schmidt, C. Briley, E. Schubert, and M. Schubert, “Vector magneto-optical generalized ellipsometry for sculptured thin films,” Appl. Phys. Lett. 102, 123109 (2013).
    [CrossRef]
  14. Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Electric field controlled Faraday rotation in an electro-optic/magneto-optic bilayer,” Appl. Phys. Lett. 97, 011901 (2010).
    [CrossRef]
  15. V. Leutheuser, F. Lederer, and U. Trutschel, “Nonlinear ellipsometry: a first approach,” J. Opt. Soc. Am. A 10, 707–712 (1993).
    [CrossRef]
  16. Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Reflection of light from a nonlinear optical film on a bigyrotropic magneto-electric substrate under angles near the Brewster angles,” Low Temp. Phys. 36, 538–543 (2010).
    [CrossRef]
  17. Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Investigation of light reflection at Brewster angles from a nonlinear optical film on a magneto-electric substrate,” Eur. Phys. J. B 71, 401–406 (2009).
    [CrossRef]
  18. Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Magneto-optical Kerr effect in a dielectric film with cubic optical nonlinearity on magneto-electric slab,” in CAOL 2010: Proceedings of the 5th International Conference on Advanced Optoelectronics & Lasers, Sevastopol, Ukraine, September 10–14, I. A. Sukhoivanov and O. V. Shulika, eds. (Kharkov National University, 2010), pp. 109–111.
  19. A. K. Zvezdin and V. A. Kotov, Modern Magneto-Optics and Magneto-Optical Materials (IOP, 1997).
  20. M. Fiebig, “Revival of the magnetoelectric effect,” J. Phys. D 38, R123–R152 (2005).
    [CrossRef]
  21. R. W. Boyd, Nonlinear Optics (Academic, 1992).
  22. T. H. O’Dell, The Electrodynamics of Magnetoelectric Media (North-Holland, 1970).
  23. R. R. Birss, Symmetry and Magnetism (North-Holland, 1966).
  24. B. B. Krichevtsov, V. V. Pavlov, R. V. Pisarev, and A. G. Selitsky, “Linear magnetoelectric effect in magnetic garnet thin films,” Ferroelectrics 161, 65–71 (1994).
    [CrossRef]
  25. M. Mansuripur, The Physical Principles of Magneto-Optical Recording (Cambridge University, 1998).

2013 (1)

D. Schmidt, C. Briley, E. Schubert, and M. Schubert, “Vector magneto-optical generalized ellipsometry for sculptured thin films,” Appl. Phys. Lett. 102, 123109 (2013).
[CrossRef]

2012 (2)

A. Dejneka, V. Zablotskii, M. Tyunina, L. Jastrabik, J. I. Perez-Landazabal, V. Recarte, V. Sanchez-Alarcos, and V. A. Chernenko, “Ellipsometry applied to phase transitions and relaxation phenomena in Ni2MnGa ferromagnetic shape memory alloy,” Appl. Phys. Lett. 101, 141908 (2012).
[CrossRef]

J. A. Arregi, J. B. Gonzalez-Diaz, E. Bergaretxe, O. Idigoras, T. Unsal, and A. Berger, “Study of generalized magneto-optical ellipsometry measurement reliability,” J. Appl. Phys. 111, 103912 (2012).
[CrossRef]

2010 (2)

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Electric field controlled Faraday rotation in an electro-optic/magneto-optic bilayer,” Appl. Phys. Lett. 97, 011901 (2010).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Reflection of light from a nonlinear optical film on a bigyrotropic magneto-electric substrate under angles near the Brewster angles,” Low Temp. Phys. 36, 538–543 (2010).
[CrossRef]

2009 (1)

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Investigation of light reflection at Brewster angles from a nonlinear optical film on a magneto-electric substrate,” Eur. Phys. J. B 71, 401–406 (2009).
[CrossRef]

2005 (1)

M. Fiebig, “Revival of the magnetoelectric effect,” J. Phys. D 38, R123–R152 (2005).
[CrossRef]

2003 (1)

2002 (1)

2001 (1)

2000 (1)

P. Vavassori, “Polarization modulation technique for magneto-optical quantitative vector magnetometry,” Appl. Phys. Lett. 77, 1605–1607 (2000).
[CrossRef]

1999 (1)

1997 (1)

A. Berger and M. R. Pufall, “Generalized magneto-optical ellipsometry,” Appl. Phys. Lett. 71, 965–967 (1997).
[CrossRef]

1994 (1)

B. B. Krichevtsov, V. V. Pavlov, R. V. Pisarev, and A. G. Selitsky, “Linear magnetoelectric effect in magnetic garnet thin films,” Ferroelectrics 161, 65–71 (1994).
[CrossRef]

1993 (1)

1986 (1)

S. Vishnovsky, “Magneto-optical ellipsometry,” Czech. J. Phys. B 36, 625–650 (1986).
[CrossRef]

1981 (1)

J. B. Theeten and D. E. Aspnes, “Ellipsometry in thin film analysis,” Annu. Rev. Mater. Sci. 11, 97–122 (1981).
[CrossRef]

Arregi, J. A.

J. A. Arregi, J. B. Gonzalez-Diaz, E. Bergaretxe, O. Idigoras, T. Unsal, and A. Berger, “Study of generalized magneto-optical ellipsometry measurement reliability,” J. Appl. Phys. 111, 103912 (2012).
[CrossRef]

Aspnes, D. E.

J. B. Theeten and D. E. Aspnes, “Ellipsometry in thin film analysis,” Annu. Rev. Mater. Sci. 11, 97–122 (1981).
[CrossRef]

Azzam, R. M. A.

R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, 1977).

Bashara, N. M.

R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, 1977).

Bauer, M.

Bergaretxe, E.

J. A. Arregi, J. B. Gonzalez-Diaz, E. Bergaretxe, O. Idigoras, T. Unsal, and A. Berger, “Study of generalized magneto-optical ellipsometry measurement reliability,” J. Appl. Phys. 111, 103912 (2012).
[CrossRef]

Berger, A.

J. A. Arregi, J. B. Gonzalez-Diaz, E. Bergaretxe, O. Idigoras, T. Unsal, and A. Berger, “Study of generalized magneto-optical ellipsometry measurement reliability,” J. Appl. Phys. 111, 103912 (2012).
[CrossRef]

A. Berger and M. R. Pufall, “Generalized magneto-optical ellipsometry,” Appl. Phys. Lett. 71, 965–967 (1997).
[CrossRef]

Birss, R. R.

R. R. Birss, Symmetry and Magnetism (North-Holland, 1966).

Bok, J.

Boyd, R. W.

R. W. Boyd, Nonlinear Optics (Academic, 1992).

Briley, C.

D. Schmidt, C. Briley, E. Schubert, and M. Schubert, “Vector magneto-optical generalized ellipsometry for sculptured thin films,” Appl. Phys. Lett. 102, 123109 (2013).
[CrossRef]

Chernenko, V. A.

A. Dejneka, V. Zablotskii, M. Tyunina, L. Jastrabik, J. I. Perez-Landazabal, V. Recarte, V. Sanchez-Alarcos, and V. A. Chernenko, “Ellipsometry applied to phase transitions and relaxation phenomena in Ni2MnGa ferromagnetic shape memory alloy,” Appl. Phys. Lett. 101, 141908 (2012).
[CrossRef]

Dadoenkova, Y. S.

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Reflection of light from a nonlinear optical film on a bigyrotropic magneto-electric substrate under angles near the Brewster angles,” Low Temp. Phys. 36, 538–543 (2010).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Electric field controlled Faraday rotation in an electro-optic/magneto-optic bilayer,” Appl. Phys. Lett. 97, 011901 (2010).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Investigation of light reflection at Brewster angles from a nonlinear optical film on a magneto-electric substrate,” Eur. Phys. J. B 71, 401–406 (2009).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Magneto-optical Kerr effect in a dielectric film with cubic optical nonlinearity on magneto-electric slab,” in CAOL 2010: Proceedings of the 5th International Conference on Advanced Optoelectronics & Lasers, Sevastopol, Ukraine, September 10–14, I. A. Sukhoivanov and O. V. Shulika, eds. (Kharkov National University, 2010), pp. 109–111.

Dejneka, A.

A. Dejneka, V. Zablotskii, M. Tyunina, L. Jastrabik, J. I. Perez-Landazabal, V. Recarte, V. Sanchez-Alarcos, and V. A. Chernenko, “Ellipsometry applied to phase transitions and relaxation phenomena in Ni2MnGa ferromagnetic shape memory alloy,” Appl. Phys. Lett. 101, 141908 (2012).
[CrossRef]

Fassbender, J.

Fiebig, M.

M. Fiebig, “Revival of the magnetoelectric effect,” J. Phys. D 38, R123–R152 (2005).
[CrossRef]

Gonzalez-Diaz, J. B.

J. A. Arregi, J. B. Gonzalez-Diaz, E. Bergaretxe, O. Idigoras, T. Unsal, and A. Berger, “Study of generalized magneto-optical ellipsometry measurement reliability,” J. Appl. Phys. 111, 103912 (2012).
[CrossRef]

Herzinger, C. M.

Hillebrands, B.

Hofmann, T.

Idigoras, O.

J. A. Arregi, J. B. Gonzalez-Diaz, E. Bergaretxe, O. Idigoras, T. Unsal, and A. Berger, “Study of generalized magneto-optical ellipsometry measurement reliability,” J. Appl. Phys. 111, 103912 (2012).
[CrossRef]

Jastrabik, L.

A. Dejneka, V. Zablotskii, M. Tyunina, L. Jastrabik, J. I. Perez-Landazabal, V. Recarte, V. Sanchez-Alarcos, and V. A. Chernenko, “Ellipsometry applied to phase transitions and relaxation phenomena in Ni2MnGa ferromagnetic shape memory alloy,” Appl. Phys. Lett. 101, 141908 (2012).
[CrossRef]

Kotov, V. A.

A. K. Zvezdin and V. A. Kotov, Modern Magneto-Optics and Magneto-Optical Materials (IOP, 1997).

Krichevtsov, B. B.

B. B. Krichevtsov, V. V. Pavlov, R. V. Pisarev, and A. G. Selitsky, “Linear magnetoelectric effect in magnetic garnet thin films,” Ferroelectrics 161, 65–71 (1994).
[CrossRef]

Lederer, F.

Lee, Y. P.

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Electric field controlled Faraday rotation in an electro-optic/magneto-optic bilayer,” Appl. Phys. Lett. 97, 011901 (2010).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Reflection of light from a nonlinear optical film on a bigyrotropic magneto-electric substrate under angles near the Brewster angles,” Low Temp. Phys. 36, 538–543 (2010).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Investigation of light reflection at Brewster angles from a nonlinear optical film on a magneto-electric substrate,” Eur. Phys. J. B 71, 401–406 (2009).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Magneto-optical Kerr effect in a dielectric film with cubic optical nonlinearity on magneto-electric slab,” in CAOL 2010: Proceedings of the 5th International Conference on Advanced Optoelectronics & Lasers, Sevastopol, Ukraine, September 10–14, I. A. Sukhoivanov and O. V. Shulika, eds. (Kharkov National University, 2010), pp. 109–111.

Leutheuser, V.

Lopushnik, R.

Lyubchanskii, I. L.

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Reflection of light from a nonlinear optical film on a bigyrotropic magneto-electric substrate under angles near the Brewster angles,” Low Temp. Phys. 36, 538–543 (2010).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Electric field controlled Faraday rotation in an electro-optic/magneto-optic bilayer,” Appl. Phys. Lett. 97, 011901 (2010).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Investigation of light reflection at Brewster angles from a nonlinear optical film on a magneto-electric substrate,” Eur. Phys. J. B 71, 401–406 (2009).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Magneto-optical Kerr effect in a dielectric film with cubic optical nonlinearity on magneto-electric slab,” in CAOL 2010: Proceedings of the 5th International Conference on Advanced Optoelectronics & Lasers, Sevastopol, Ukraine, September 10–14, I. A. Sukhoivanov and O. V. Shulika, eds. (Kharkov National University, 2010), pp. 109–111.

Mansuripur, M.

M. Mansuripur, The Physical Principles of Magneto-Optical Recording (Cambridge University, 1998).

O’Dell, T. H.

T. H. O’Dell, The Electrodynamics of Magnetoelectric Media (North-Holland, 1970).

Pavlov, V. V.

B. B. Krichevtsov, V. V. Pavlov, R. V. Pisarev, and A. G. Selitsky, “Linear magnetoelectric effect in magnetic garnet thin films,” Ferroelectrics 161, 65–71 (1994).
[CrossRef]

Perez-Landazabal, J. I.

A. Dejneka, V. Zablotskii, M. Tyunina, L. Jastrabik, J. I. Perez-Landazabal, V. Recarte, V. Sanchez-Alarcos, and V. A. Chernenko, “Ellipsometry applied to phase transitions and relaxation phenomena in Ni2MnGa ferromagnetic shape memory alloy,” Appl. Phys. Lett. 101, 141908 (2012).
[CrossRef]

Pisarev, R. V.

B. B. Krichevtsov, V. V. Pavlov, R. V. Pisarev, and A. G. Selitsky, “Linear magnetoelectric effect in magnetic garnet thin films,” Ferroelectrics 161, 65–71 (1994).
[CrossRef]

Postava, K.

Pufall, M. R.

A. Berger and M. R. Pufall, “Generalized magneto-optical ellipsometry,” Appl. Phys. Lett. 71, 965–967 (1997).
[CrossRef]

Rasing, T.

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Reflection of light from a nonlinear optical film on a bigyrotropic magneto-electric substrate under angles near the Brewster angles,” Low Temp. Phys. 36, 538–543 (2010).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Electric field controlled Faraday rotation in an electro-optic/magneto-optic bilayer,” Appl. Phys. Lett. 97, 011901 (2010).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Investigation of light reflection at Brewster angles from a nonlinear optical film on a magneto-electric substrate,” Eur. Phys. J. B 71, 401–406 (2009).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Magneto-optical Kerr effect in a dielectric film with cubic optical nonlinearity on magneto-electric slab,” in CAOL 2010: Proceedings of the 5th International Conference on Advanced Optoelectronics & Lasers, Sevastopol, Ukraine, September 10–14, I. A. Sukhoivanov and O. V. Shulika, eds. (Kharkov National University, 2010), pp. 109–111.

Recarte, V.

A. Dejneka, V. Zablotskii, M. Tyunina, L. Jastrabik, J. I. Perez-Landazabal, V. Recarte, V. Sanchez-Alarcos, and V. A. Chernenko, “Ellipsometry applied to phase transitions and relaxation phenomena in Ni2MnGa ferromagnetic shape memory alloy,” Appl. Phys. Lett. 101, 141908 (2012).
[CrossRef]

Sanchez-Alarcos, V.

A. Dejneka, V. Zablotskii, M. Tyunina, L. Jastrabik, J. I. Perez-Landazabal, V. Recarte, V. Sanchez-Alarcos, and V. A. Chernenko, “Ellipsometry applied to phase transitions and relaxation phenomena in Ni2MnGa ferromagnetic shape memory alloy,” Appl. Phys. Lett. 101, 141908 (2012).
[CrossRef]

Schmidt, D.

D. Schmidt, C. Briley, E. Schubert, and M. Schubert, “Vector magneto-optical generalized ellipsometry for sculptured thin films,” Appl. Phys. Lett. 102, 123109 (2013).
[CrossRef]

D. Schmidt, E. Schubert, and M. Schubert, “Generalized ellipsometry characterization of sculptured thin films made by glancing angle deposition,” in Ellipsometry at the Nanoscale, M. Losurdo and K. Hingerl, eds. (Springer-Verlag, 2013), pp. 341–410.

Schubert, E.

D. Schmidt, C. Briley, E. Schubert, and M. Schubert, “Vector magneto-optical generalized ellipsometry for sculptured thin films,” Appl. Phys. Lett. 102, 123109 (2013).
[CrossRef]

D. Schmidt, E. Schubert, and M. Schubert, “Generalized ellipsometry characterization of sculptured thin films made by glancing angle deposition,” in Ellipsometry at the Nanoscale, M. Losurdo and K. Hingerl, eds. (Springer-Verlag, 2013), pp. 341–410.

Schubert, M.

D. Schmidt, C. Briley, E. Schubert, and M. Schubert, “Vector magneto-optical generalized ellipsometry for sculptured thin films,” Appl. Phys. Lett. 102, 123109 (2013).
[CrossRef]

M. Schubert, T. Hofmann, and C. M. Herzinger, “Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in n-type GaAs,” J. Opt. Soc. Am. A 20, 347–356 (2003).
[CrossRef]

M. Schubert, T. E. Tiwald, and J. A. Woollam, “Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry,” Appl. Opt. 38, 177–187 (1999).
[CrossRef]

D. Schmidt, E. Schubert, and M. Schubert, “Generalized ellipsometry characterization of sculptured thin films made by glancing angle deposition,” in Ellipsometry at the Nanoscale, M. Losurdo and K. Hingerl, eds. (Springer-Verlag, 2013), pp. 341–410.

Selitsky, A. G.

B. B. Krichevtsov, V. V. Pavlov, R. V. Pisarev, and A. G. Selitsky, “Linear magnetoelectric effect in magnetic garnet thin films,” Ferroelectrics 161, 65–71 (1994).
[CrossRef]

Theeten, J. B.

J. B. Theeten and D. E. Aspnes, “Ellipsometry in thin film analysis,” Annu. Rev. Mater. Sci. 11, 97–122 (1981).
[CrossRef]

Tiwald, T. E.

Trutschel, U.

Tyunina, M.

A. Dejneka, V. Zablotskii, M. Tyunina, L. Jastrabik, J. I. Perez-Landazabal, V. Recarte, V. Sanchez-Alarcos, and V. A. Chernenko, “Ellipsometry applied to phase transitions and relaxation phenomena in Ni2MnGa ferromagnetic shape memory alloy,” Appl. Phys. Lett. 101, 141908 (2012).
[CrossRef]

Unsal, T.

J. A. Arregi, J. B. Gonzalez-Diaz, E. Bergaretxe, O. Idigoras, T. Unsal, and A. Berger, “Study of generalized magneto-optical ellipsometry measurement reliability,” J. Appl. Phys. 111, 103912 (2012).
[CrossRef]

Vavassori, P.

P. Vavassori, “Polarization modulation technique for magneto-optical quantitative vector magnetometry,” Appl. Phys. Lett. 77, 1605–1607 (2000).
[CrossRef]

Vishnovsky, S.

Woollam, J. A.

Yamaguchi, T.

Zablotskii, V.

A. Dejneka, V. Zablotskii, M. Tyunina, L. Jastrabik, J. I. Perez-Landazabal, V. Recarte, V. Sanchez-Alarcos, and V. A. Chernenko, “Ellipsometry applied to phase transitions and relaxation phenomena in Ni2MnGa ferromagnetic shape memory alloy,” Appl. Phys. Lett. 101, 141908 (2012).
[CrossRef]

Zvezdin, A. K.

A. K. Zvezdin and V. A. Kotov, Modern Magneto-Optics and Magneto-Optical Materials (IOP, 1997).

Annu. Rev. Mater. Sci. (1)

J. B. Theeten and D. E. Aspnes, “Ellipsometry in thin film analysis,” Annu. Rev. Mater. Sci. 11, 97–122 (1981).
[CrossRef]

Appl. Opt. (2)

Appl. Phys. Lett. (5)

P. Vavassori, “Polarization modulation technique for magneto-optical quantitative vector magnetometry,” Appl. Phys. Lett. 77, 1605–1607 (2000).
[CrossRef]

D. Schmidt, C. Briley, E. Schubert, and M. Schubert, “Vector magneto-optical generalized ellipsometry for sculptured thin films,” Appl. Phys. Lett. 102, 123109 (2013).
[CrossRef]

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Electric field controlled Faraday rotation in an electro-optic/magneto-optic bilayer,” Appl. Phys. Lett. 97, 011901 (2010).
[CrossRef]

A. Dejneka, V. Zablotskii, M. Tyunina, L. Jastrabik, J. I. Perez-Landazabal, V. Recarte, V. Sanchez-Alarcos, and V. A. Chernenko, “Ellipsometry applied to phase transitions and relaxation phenomena in Ni2MnGa ferromagnetic shape memory alloy,” Appl. Phys. Lett. 101, 141908 (2012).
[CrossRef]

A. Berger and M. R. Pufall, “Generalized magneto-optical ellipsometry,” Appl. Phys. Lett. 71, 965–967 (1997).
[CrossRef]

Czech. J. Phys. B (1)

S. Vishnovsky, “Magneto-optical ellipsometry,” Czech. J. Phys. B 36, 625–650 (1986).
[CrossRef]

Eur. Phys. J. B (1)

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Investigation of light reflection at Brewster angles from a nonlinear optical film on a magneto-electric substrate,” Eur. Phys. J. B 71, 401–406 (2009).
[CrossRef]

Ferroelectrics (1)

B. B. Krichevtsov, V. V. Pavlov, R. V. Pisarev, and A. G. Selitsky, “Linear magnetoelectric effect in magnetic garnet thin films,” Ferroelectrics 161, 65–71 (1994).
[CrossRef]

J. Appl. Phys. (1)

J. A. Arregi, J. B. Gonzalez-Diaz, E. Bergaretxe, O. Idigoras, T. Unsal, and A. Berger, “Study of generalized magneto-optical ellipsometry measurement reliability,” J. Appl. Phys. 111, 103912 (2012).
[CrossRef]

J. Opt. Soc. Am. A (2)

J. Phys. D (1)

M. Fiebig, “Revival of the magnetoelectric effect,” J. Phys. D 38, R123–R152 (2005).
[CrossRef]

Low Temp. Phys. (1)

Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing, “Reflection of light from a nonlinear optical film on a bigyrotropic magneto-electric substrate under angles near the Brewster angles,” Low Temp. Phys. 36, 538–543 (2010).
[CrossRef]

Opt. Express (1)

Other (8)

R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, 1977).

D. Schmidt, E. Schubert, and M. Schubert, “Generalized ellipsometry characterization of sculptured thin films made by glancing angle deposition,” in Ellipsometry at the Nanoscale, M. Losurdo and K. Hingerl, eds. (Springer-Verlag, 2013), pp. 341–410.

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Figures (6)

Fig. 1.
Fig. 1.

Schematic of light reflection from the dielectric film with Kerr optical nonlinearity on the MO film in the case of the polar MO configuration. Here ki, kr, and kt are wave vectors of incident, reflected, and transmitted waves in vacuum, respectively. Es,pi,r denote s- and p-polarized components of the incident and reflected EMWs, and θ is the incidence angle.

Fig. 2.
Fig. 2.

Surfaces of the ellipsometric angles (a) ψpp, (b) ψps, and (c) ψsp as functions of the incidence angle θ and the incident light intensity I for α=30ps/m.

Fig. 3.
Fig. 3.

Ellipsometric angles ψpp for (a) α=30ps/m and (b) the difference δψpp=ψpp|α0ψpp|α=0 as functions of the incidence angle θ with (dashed lines) and without (solid lines) taking into account the nonlinear interaction in the system.

Fig. 4.
Fig. 4.

Ellipsometric angles (a) ψps and (b) ψsp as functions of the incidence angle θ for α=30ps/m (and α=0 in the insets) with (dashed lines) and without (solid lines) taking into account the nonlinear interaction in the system.

Fig. 5.
Fig. 5.

Phase difference Δps as a function of the incidence angle θ for (a) α=30ps/m and (b) α=0 with (dashed lines) and without (solid lines) taking into account the nonlinear interaction in the system.

Fig. 6.
Fig. 6.

Surfaces of the Kerr rotation angles (a) ϕsK for s- and (b) ϕsK for p-polarized light as functions of the incidence angle θ and the incident light intensity I for α=30ps/m.

Equations (5)

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Di=ε0(εij(1;0)+εij(1;NL))Ej,Bi=Hi,
Di=ε0εij(2)Ej+αijHj,Bi=μ0μij(2)Hj+αijEj,
(EprEsr)=R^(EpiEsi),R^=(RppRpsRspRss).
RppRss=tanψppexp(iΔpp),RpsRss=tanψpsexp(iΔps),RspRpp=tanψspexp(iΔsp).
ϕs,pK=12arctg2Re(κs,p)1|κs,p|2.

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